Akishige Murakami
Ricoh
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Featured researches published by Akishige Murakami.
SID Symposium Digest of Technical Papers | 2011
Tohru Yashiro; Shigenobu Hirano; Yoshihisa Naijoh; Yoshinori Okada; Kazuaki Tsuji; Mikiko Abe; Akishige Murakami; Hiroyuki Takahashi; Koh Fujimura; Hitoshi Kondoh
developed a technology for a new full-color reflective electrochromic display (ECD) based on the subtractive color mixing model. This improves display brightness and color reproducibility. Additional advantage is simple production process. An active matrix driving of the full-color reflective ECD has been demonstrated successfully.
Japanese Journal of Applied Physics | 1991
Koichi Haga; Akishige Murakami; Kenji Yamamoto; Masafumi Kumano; Hideo Watanabe
Measurement of electrical properties, etch rates in HF(49%) and HF-HNO 3 (49% HF:63% HNO 3 =1:20) solutions and X-ray photoemission spectra are reported for amorphous silicon-oxygen alloy films (a-SiO x :H) prepared by r. f. glow discharge decomposition of a SiH 4 -CO 2 gas mixture. Activated band conduction is observed in the temperature range of 324-424 K. Though the addition of oxygen causes a decrease in the conductivity, the activation energy for conduction remains at a constant value of around 1.0 eV in the films with oxygen content x from 0.17 to 0.5. The broadening toward the high binding of the Si-2p core level in X-ray photoemission spectra with oxygen content is explained by the effects of oxygen atoms incorporated into the films
Japanese Journal of Applied Physics | 1992
Koichi Haga; Akishige Murakami; Kazuhiko Adachi; Masafumi Kumano; Hideo Watanabe
A new amorphous silicon photosensor with glass/Cr/a-Si:H/a-SiOx:H/ITO structure was prepared. Initially, the photoresponse of this structure to a light pulse is about 750 times slower than that of the photosensor with the inverse (glass/ITO/a-SiOx:H/a-Si:H/Cr) structure. The X-ray photoemission spectra show that the a-SiOx:H surface is additionally oxidized during deposition of the ITO electrode. A fast response with a rise time of less than 1 ms can be obtained by treating the a-SiOx:H surface with boron plasma or depositing the boron-doped a-SiOx:H layer onto the undoped a-SiOx:H layer before the ITO deposition.
Japanese Journal of Applied Physics | 1991
Yasuyuki Shindoh; Koichi Haga; Kenji Yamamoto; Akishige Murakami; Masafumi Kumano; Hideo Watanabe
Using boron-doped and nondoped a-SiOx:H layers as photoreception windows, an ITO/a-SiOx(B):H/a-SiOx:H/a-Si:H/Cr heterojunction photodiode is constructed. The collection efficiency for photocarriers is improved over the wavelength range of visible light by this structure. The photo/dark current ratio of 5×103 is obtained at an applied voltage of -5 V. The photocurrent retains over 80% of its initial value over 2×104 seconds under the irradiation of AM1. With this photodiode, a lensless contact-type image sensor is realized with 8 bits/mm, A4 size and 2.5 ms/line.
Archive | 2007
Mayuka Araumi; Akishige Murakami
Archive | 2006
Akishige Murakami; Ikue Kawashima; Yoshikazu Akiyama
Archive | 1988
Koichi Haga; Akishige Murakami; Hiroshi Miura
Archive | 2011
Yoshihisa Naijo; Tohru Yashiro; Shigenobu Hirano; Masahiro Yanagisawa; Masahiro Masuzawa; Akishige Murakami; Hiroyuki Takahashi; Koh Fujimura; Yoshinori Okada
Archive | 1989
Koichi Haga; Kenji Yamamoto; Masafumi Kumano; Akishige Murakami
Archive | 2006
Yoshikazu Akiyama; Takumi Yamaga; Takanori Tano; Hidenori Tomono; Akishige Murakami; Hitoshi Arita; Mayuka Araumi