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Dive into the research topics where Alex Sergey Ionkin is active.

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Featured researches published by Alex Sergey Ionkin.


photovoltaic specialists conference | 2012

A simple solution-based route to high-efficiency CZTSSe thin-film solar cells

Qijie Guo; Yanyan Cao; Jonathan V. Caspar; William E. Farneth; Alex Sergey Ionkin; Lynda Kaye Johnson; Meijun Lu; Irina Malajovich; Daniela Rodica Radu; Kaushik Roy Choudhury; H. David Rosenfeld; Wei Wu

Solution-based Cu2ZnSn(S,Se)4 (CZTSSe) thin film deposition routes focusing on chemistries with attractive scalability and handling characteristics, while delivering high efficiency devices are promising technologies for low-cost solar cells. In this paper we describe a new approach for the fabrication of CZTSSe thin films using inks comprised of mixtures of binary and ternary metal-chalcogenide nanocrystals dispersed in simple organic solvents. The resulting blended inks can be coated under ambient conditions to give precursor films which are in turn converted to device-quality CZTSSe absorbers via thermal annealing in a selenium atmosphere. Using this approach we have demonstrated CZTSSe solar cells with total area efficiencies in excess of 8.5% (or 9.6% per active area) under 1 Sun AM1.5 illumination.


photovoltaic specialists conference | 2012

Characterization and understanding of performance losses in a highly efficient solution-processed CZTSSe thin-film solar cell

Kaushik Roy Choudhury; Yanyan Cao; Jonathan V. Caspar; William E. Farneth; Qijie Guo; Alex Sergey Ionkin; Lynda Kaye Johnson; Meijun Lu; Irina Malajovich; Daniela Rodica Radu; H. David Rosenfeld; Wei Wu

We present results on the characterization of a highly efficient CZTSSe solar cell fabricated using a solution-based process, aiming to gain a better understanding of its efficiency-limiting causes. Under red light illumination, we observed a red-kink in the current-density versus voltage (J-V) curve, likely due to a persistent photoconductivity in the buffer layer. Temperature-dependent J-V analysis suggests that interface recombination is the dominant loss mechanism. Defect analysis using admittance spectroscopy (AS) shows a single bulk defect level at ~63 meV and may be attributed to copper vacancy (VCu). The carrier concentration of the device determined using drive-level capacitance profiling (DLCP) is ~2.5×1016 cm-3.


Archive | 2004

Electroluminescent silylated pyrenes, and devices made with such compounds

Alex Sergey Ionkin; Ying Wang


Archive | 2005

Catalysts for olefin polymerization or oligomerization

Alex Sergey Ionkin; Lynda Kaye Johnson


Archive | 2006

Electroluminescent iridium compounds with silylated, germanylated, and stannylated ligands, and devices made with such compounds

Alex Sergey Ionkin; Ying Wang


Archive | 2010

Thick-film conductive compositions with nano-sized zinc additive

Alex Sergey Ionkin; Brian M. Fish


Archive | 2010

SYNTHESES OF QUATERNARY CHALCOGENIDES IN CESIUM, RUBIDIUM, BARIUM AND LANTHANUM CONTAINING FLUXES

Alex Sergey Ionkin; Brian M. Fish


Archive | 2010

PREPARATION OF COPPER ZINC TIN SULFIDE

Alex Sergey Ionkin


Archive | 2011

THICK-FILM CONDUCTIVE PASTE COMPOSITION

Alex Sergey Ionkin


Archive | 2010

SCREEN-PRINTABLE QUATERNARY CHALCOGENIDE COMPOSITIONS

Alex Sergey Ionkin; Brian M. Fish; Ross Getty

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