Alexey V. Sakharov

Correlation between p-GaN growth environment with electrical and optical properties of blue LEDs

Two blue (450 nm) light–emitting diodes (LED), which only differ in top p-GaN layer growth conditions, were comparatively investigated. I-V, C-V, TLM, Electroluminescence (EL) and Photoluminescence (PL) techniques were applied to clarify a correlation between MOCVD carrier gas and internal properties. The A-structure grown in the pure N2 environment demonstrated better parameters than the B-structure grown in the N2/H2 (1:1) gas mixture. The mixed growth atmosphere leaded to an increase of sheet resistances of p-GaN layer. EL and PL measurements confirmed the advantage of the pure N2 utilization, and C(VR) measurement pointed the increase of static charge concentration near the p-GaN interface in the B structure.

A device based on the Shack-Hartmann wave front sensor for testing wide aperture optics

In this paper we consider two approaches widely used in testing of wide aperture optics: Fizeau interferometer and Shack-Hartmann wavefront sensor. Fizeau interferometer that is common instrument in optical testing can be transformed to a device using Shack-Hartmann wavefront sensor, the alternative technique to check wide aperture optical components. We call this device Hartmannometer, and compare its features to those of Fizeau interferometer.

Comparative analysis of methods and optical-electronic equipment to control the form parameters of spherical mirrors

In this paper we consider two approaches widely used in testing of spherical optical surfaces: Fizeau interferometer and Shack-Hartmann wavefront sensor. Fizeau interferometer that is widely used in optical testing can be transformed to a device using Shack-Hartmann wavefront sensor, the alternative technique to check spherical optical components. We call this device Hartmannometer, and compare its features to those of Fizeau interferometer.

Hartmannometer versus Fizeau Interferometer: advantages and drawbacks

In this paper we consider two approaches widely used in optical testing: Shack-Hartmann wavefront sensor and Fizeau interferometer technique. Fizeau interferometer that is widely used in optical testing can be easily transformed to a device using Shack-Hartmann wavefront sensor, the alternative technique to check optical components. We call this device Hartmannometer, and compare its features to those of Fizeau interferometer.

Internal quantum efficiency and tunable colour temperature in monolithic white InGaN/GaN LED

Internal Quantum Efficiency (IQE) of two-colour monolithic white light emitting diode (LED) was measured by temperature dependant electro-luminescence (TDEL) and analysed with modified rate equation based on ABC model. External, internal and injection efficiencies of blue and green quantum wells were analysed separately. Monolithic white LED contained one green InGaN QW and two blue QWs being separated by GaN barrier. This paper reports also the tunable behaviour of correlated colour temperature (CCT) in pulsed operation mode and effect of self-heating on device performance.