Andreas Schiessl
Continental Automotive Systems
Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by Andreas Schiessl.
international conference on thermal mechanical and multi physics simulation and experiments in microelectronics and microsystems | 2011
Karsten Meier; Mike Roellig; Andreas Schiessl; Klaus-Juergen Wolter
In this work the life time of solder joints of SMD components is studied under vibration loading. This kind of purely mechanical load is one of the main failure causes in automotive electronics. A test vehicle has been designed to enable vibration testing on SMD capacitors (size 0805). The test vehicle is distinguished with a line clamping and stripe shape which both leads to a concerted loading of the component solder joints. The test vehicles were analysed for their resonant frequency prior test and loaded with a sinusoidal vibration close to the resonant frequency for certain numbers of cycles. The loading of the individual components was measured using a vibrometer. Components were stressed with wave amplitudes from 0.3 mm up to 0.8 mm and normalised cycle counts from 1 up to 12. All tests were accomplished at room temperature. Cross sectioning was performed to evaluate damage location within and cracking of the solder joints. The observed damage location clearly differs to results from temperature cycling tests. Cracking of the intermetallic interface was not observed. Cracks propagated in the solder bulk. This enables a solder fatigue model since no interface effect is involved in the damage process.
electronics system integration technology conference | 2010
Andreas Bernhardt; Andreas Schiessl; Angelika Schingale; Daniela Wolf
“Unser Ziel ist dabei Hardware- und Software-Funktionalitäten anzubieten, die ab 2012 die notwendige Leistungsfähigkeit für Euro-6-Applikationen und CO2 Reduktionen bieten. Da die Steuerung der mechanischen Komponenten immer komplexer wird … und die Anforderungen an die Hardware durch intelligentere Funktionen weiter wachsen, wird der Anteil der Elektronik weiter steigen.” [1]
international conference on thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems | 2014
Karsten Meier; Mike Roellig; Andreas Schiessl; Klaus-Juergen Wolter
international conference on thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems | 2013
Karsten Meier; Mike Roellig; Georg Lautenschlaeger; Andreas Schiessl; Klaus-Juergen Wolter
Microelectronics Reliability | 2016
J. Thambi; Ulrich A. W. Tetzlaff; Andreas Schiessl; Klaus-Dieter Lang; M. Waltz
international conference on thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems | 2013
Mike Roellig; R. Metasch; A. Schingale; Andreas Schiessl; Karsten Meier; Norbert Meyendorf
international conference on thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems | 2013
R. Schwerz; Karsten Meier; Mike Roellig; Andreas Schiessl; A. Schingale; K.-J. Wolter; Norbert Meyendorf
Archive | 2008
Frank Baur; Roland Brey; Andreas Schiessl
Journal of Electronic Packaging | 2017
Joel Thambi; Andreas Schiessl; Manuela Waltz; Klaus-Dieter Lang; Ulrich A. W. Tetzlaff
2012 7th International Conference on Integrated Power Electronics Systems (CIPS) | 2012
Angelika Schingale; Daniela Wolf; Andreas Schiessl; Marius Tarnovetchi