Andrew W. Stevenson

X-ray phase-contrast microscopy and microtomography

In-line phase contrast enables weakly absorbing specimens to be imaged successfully with x-rays, and greatly enhances the visibility of fine scale structure in more strongly absorbing specimens. This type of phase contrast requires a spatially coherent beam, a condition that can be met by a microfocus x-ray source. We have developed an x-ray microscope, based on such a source, which is capable of high resolution phase-contrast imaging and tomography. Phase retrieval enables quantitative information to be recovered from phase-contrast microscope images of homogeneous samples of known composition and density, and improves the quality of tomographic reconstructions.

Quantitative X‐ray projection microscopy: phase‐contrast and multi‐spectral imaging

We outline a new approach to X‐ray projection microscopy in a scanning electron microscope (SEM), which exploits phase contrast to boost the quality and information content of images. These developments have been made possible by the combination of a high‐brightness field‐emission gun (FEG)‐based SEM, direct detection CCD technology and new phase retrieval algorithms. Using this approach we have been able to obtain spatial resolution of < 0.2 µm and have demonstrated novel features such as: (i) phase‐contrast enhanced visibility of high spatial frequency image features (e.g. edges and boundaries) over a wide energy range; (ii) energy‐resolved imaging to simultaneously produce multiple quasi‐monochromatic images using broad‐band polychromatic illumination; (iii) easy implementation of microtomography; (iv) rapid and robust phase/amplitude‐retrieval algorithms to enable new real‐time and quantitative modes of microscopic imaging. These algorithms can also be applied successfully to recover object–plane information from intermediate‐field images, unlocking the potentially greater contrast and resolution of the intermediate‐field regime. Widespread applications are envisaged for fields such as materials science, biological and biomedical research and microelectronics device inspection. Some illustrative examples are presented. The quantitative methods described here are also very relevant to projection microscopy using other sources of radiation, such as visible light and electrons.

Refracting Röntgen’s rays: Propagation-based x-ray phase contrast for biomedical imaging

Absorption-contrast x-ray imaging serves to visualize the variation in x-ray attenuation within the volume of a given sample, whereas phase contrast allows one to visualize variations in x-ray refractive index. The former imaging mechanism has been well known and widely utilized since the time of Rontgen’s Nobel prize winning work, whereas the latter mechanism—sought for, but not found, by Rontgen himself—has laid the foundation for a revolution in x-ray imaging which is the central topic of this review. We consider the physical imaging mechanisms underlying both absorption contrast and phase contrast, together with the associated inverse problem of how one may obtain quantitative two- or three-dimensional information regarding a sample, given one or more phase-contrast images of the same. Practical questions are considered, regarding optimized phase-contrast imaging geometries as a function of detector resolution, source size, x-ray spectrum, and dose. Experimental examples pertaining to biomedical appli...

On the concentration, focusing, and collimation of x‐rays and neutrons using microchannel plates and configurations of holes

A new class of focusing, condensing, and collimating devices for x rays, γ rays, and neutrons is described which is based on the use of microchannel plates (MCPs) or configurations of holes. As well as providing a simple collimating action due to the absorption of severely divergent rays in the channel walls, the microchannel‐plate‐type structures are capable of providing a focusing and collimating action arising from the reflection of near‐grazing‐incidence rays at the channel walls. The focusing action is in principle controllable by mechanical bending or slump forming of the channel plates or by appropriate shaping of the channel walls and is remarkably insensitive to source location, device alignment, and wavelength. Theoretical predictions for the performance of such devices are presented via both simple model calculations and Monte Carlo simulations. These suggest that some simple scaling relations hold between key parameters, and provide a guide to the optimum performance levels achievable with suc...

On the optimization of experimental parameters for x-ray in-line phase-contrast imaging

General principles and results for the optimization of the performance of x-ray in-line phase-contrast imaging systems for spatially incoherent sources are investigated. In particular, formulas expressing the dependence of image contrast, spatial resolution, and signal-to-noise ratio on instrumental parameters including source size, detector resolution, geometrical factors, x-ray energy as well as sample properties are derived for different models of sample features. The results for some special cases of interest are presented. Optimization procedures are proposed that are expected to be useful in the design of imaging systems seeking to exploit x-ray in-line phase contrast.

In-Line Phase-Contrast X-ray Imaging and Tomography for Materials Science

X-ray phase-contrast imaging and tomography make use of the refraction of X-rays by the sample in image formation. This provides considerable additional information in the image compared to conventional X-ray imaging methods, which rely solely on X-ray absorption by the sample. Phase-contrast imaging highlights edges and internal boundaries of a sample and is thus complementary to absorption contrast, which is more sensitive to the bulk of the sample. Phase-contrast can also be used to image low-density materials, which do not absorb X-rays sufficiently to form a conventional X-ray image. In the context of materials science, X-ray phase-contrast imaging and tomography have particular value in the 2D and 3D characterization of low-density materials, the detection of cracks and voids and the analysis of composites and multiphase materials where the different components have similar X-ray attenuation coefficients. Here we review the use of phase-contrast imaging and tomography for a wide variety of materials science characterization problems using both synchrotron and laboratory sources and further demonstrate the particular benefits of phase contrast in the laboratory setting with a series of case studies.

Some simple rules for contrast, signal-to-noise and resolution in in-line x-ray phase-contrast imaging

Simple analytical expressions are derived for the spatial resolution, contrast and signal-to-noise in X-ray projection images of a generic phase edge. The obtained expressions take into account the maximum phase shift generated by the sample and the sharpness of the edge, as well as such parameters of the imaging set-up as the wavelength spectrum and the size of the incoherent source, the source-to-object and object-to-detector distances and the detector resolution. Different asymptotic behavior of the expressions in the cases of large and small Fresnel numbers is demonstrated. The analytical expressions are compared with the results of numerical simulations using Kirchhoff diffraction theory, as well as with experimental X-ray measurements.

On the evolution and relative merits of hard X-ray phase-contrast imaging methods

This review provides a brief overview, albeit from a somewhat personal perspective, of the evolution and key features of various hard X-ray phase-contrast imaging (PCI) methods of current interest in connection with translation to a wide range of imaging applications. Although such methods have already found wide-ranging applications using synchrotron sources, application to dynamic studies in a laboratory/clinical context, for example for in vivo imaging, has been slow due to the current limitations in the brilliance of compact laboratory sources and the availability of suitable high-performance X-ray detectors. On the theoretical side, promising new PCI methods are evolving which can record both components of the phase gradient in a single exposure and which can accept a relatively large spectral bandpass. In order to help to identify the most promising paths forward, we make some suggestions as to how the various PCI methods might be compared for performance with a particular view to identifying those which are the most efficient, given the fact that source performance is currently a key limiting factor on the improved performance and applicability of PCI systems, especially in the context of dynamic sample studies. The rapid ongoing development of both suitable improved sources and detectors gives strong encouragement to the view that hard X-ray PCI methods are poised for improved performance and an even wider range of applications in the near future.

Toolbox for advanced x-ray image processing

A software system has been developed for high-performance Computed Tomography (CT) reconstruction, simulation and other X-ray image processing tasks utilizing remote computer clusters optionally equipped with multiple Graphics Processing Units (GPUs). The system has a streamlined Graphical User Interface for interaction with the cluster. Apart from extensive functionality related to X-ray CT in plane-wave and cone-beam forms, the software includes multiple functions for X-ray phase retrieval and simulation of phase-contrast imaging (propagation-based, analyzer crystal based and Talbot interferometry). Other features include several methods for image deconvolution, simulation of various phase-contrast microscopy modes (Zernike, Schlieren, Nomarski, dark-field, interferometry, etc.) and a large number of conventional image processing operations (such as FFT, algebraic and geometrical transformations, pixel value manipulations, simulated image noise, various filters, etc.). The architectural design of the system is described, as well as the two-level parallelization of the most computationally-intensive modules utilizing both the multiple CPU cores and multiple GPUs available in a local PC or a remote computer cluster. Finally, some results about the current system performance are presented. This system can potentially serve as a basis for a flexible toolbox for X-ray image analysis and simulation, that can efficiently utilize modern multi-processor hardware for advanced scientific computations.

Phase-contrast X-ray imaging with synchrotron radiation for materials science applications

Since R€ os discovery of X-rays just over a century ago the vast majority of radiographs have been collected and interpreted on the basis of absorption contrast and geometrical (ray) optics. Recently the possibility of obtaining new and complementary information in X-ray images by utilizing phase-contrast effects has received considerable attention, both in the laboratory context and at synchrotron sources (where much of this activity is a consequence of the highly coherent X-ray beams which can be produced). Phase-contrast X-ray imaging is capable of providing improved information from weakly absorbing features in a sample, together with improved edge definition. Four different experimental arrangements for achieving phase contrast in the hard X-ray regime, for the purpose of non-destructive characterization of materials, will be described. Two of these, demonstrated at ESRF in France and AR in Japan, are based on parallel-beam geometry; the other two, demonstrated at PLS in Korea and APS in USA, are based on spherical-beam geometry. In each case quite different X-ray optical arrangements were used. Some image simulations will be employed to demonstrate salient features of hard X-ray phase-contrast imaging and examples of results from each of the experiments will be shown. 2002 Elsevier Science B.V. All rights reserved.