Andrius Melninkaitis
Vilnius University
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Publication
Featured researches published by Andrius Melninkaitis.
Optics Letters | 2012
Benoit Mangote; Laurent Gallais; Mireille Commandré; Mathias Mende; Lars Jensen; Henrik Ehlers; Marco Jupé; Detlev Ristau; Andrius Melninkaitis; Julius Mirauskas; Valdas Sirutkaitis; Simonas Kičas; Tomas Tolenis; Ramutis Drazdys
We report on the laser damage resistance of ion beam-sputtered oxide materials (Al2O3, Nb2O5, HfO2, SiO2, Ta2O5, ZrO2) and mixtures of Al2O3-SiO2, Nb2O5-SiO2, HfO2-SiO2, Ta2O5-SiO2, and ZrO2-SiO2, irradiated by single 500 fs pulses at 1030 nm. Laser-induced damage threshold (LIDT), refractive index, and bandgaps of the single-layer coatings are measured. For pure oxide materials a linear evolution of the LIDT with bandgap is observed. The results are in accordance with our simulations based on photo-ionization and avalanche-ionization. In the case of mixtures, however, deviations from the previous behaviors are evidenced. The evolution of the LIDT as a function of the refractive index is analyzed, and an empirical description of the relation between refractive index and LIDT is proposed.
Optics Letters | 2008
Tadas Balciunas; Andrius Melninkaitis; G. Tamošauskas; Valdas Sirutkaitis
We present the application of time-resolved off-axis digital holography for the investigation of refractive index/transmission properties of laser-induced plasma filaments in water. Time evolution of both amplitude- and phase-contrast images of the self-focused beam in water was characterized with temporal resolution better than 50 fs. To the best of our knowledge, this is the first attempt to characterize the propagation of femtosecond laser pulse in nonlinear media using off-axis digital holography.
Optics Express | 2009
Marco Jupé; Lars Jensen; Andrius Melninkaitis; Valdas Sirutkaitis; Detlev Ristau
Laser damage phenomena are governed by a number of different effects for the respective operation modes and pulse durations. In the ultra short pulse regime the electronic structure in the dielectric coating and the substrate material set the prerequisite for the achieved laser damage threshold of an optical component. Theoretical considerations have been done to assess the impact of contributing ionization phenomena in order to find a valid description for laser-induced damage in the femtosecond (fs) domain. Subsequently, a special set of sample has been designed to verify these considerations via ISO certified laser damage testing. Examining the theoretical and experimental data reveals the importance of multi-photon absorption for the optical breakdown. For titania, the influence of multi-photon absorption has been clearly shown by a quantized wavelength characteristic of the laser damage threshold.
Applied Optics | 2011
Andrius Melninkaitis; Tomas Tolenis; Lina Mažulė; Julius Mirauskas; Valdas Sirutkaitis; Benoit Mangote; Xinghai Fu; Myriam Zerrad; Laurent Gallais; Mireille Commandré; Simonas Kičas; Ramutis Drazdys
ZrO2-SiO2 and Nb2O5-SiO2 mixture coatings as well as those of pure zirconia (ZrO2), niobia (Nb2O5), and silica (SiO2) deposited by ion-beam sputtering were investigated. Refractive-index dispersions, bandgaps, and volumetric fractions of materials in mixed coatings were analyzed from spectrophotometric data. Optical scattering, surface roughness, nanostructure, and optical resistance were also studied. Zirconia-silica mixtures experience the transition from crystalline to amorphous phase by increasing the content of SiO2. This also results in reduced surface roughness. All niobia and silica coatings and their mixtures were amorphous. The obtained laser-induced damage thresholds in the subpicosecond range also correlates with respect to the silica content in both zirconia- and niobia-silica mixtures.
Journal of Applied Physics | 2015
Laurent Gallais; D.-B. Douti; Mireille Commandré; Gintarė Batavičiūtė; Egidijus Pupka; Mindaugas Ščiuka; Linas Smalakys; Valdas Sirutkaitis; Andrius Melninkaitis
An experimental and numerical study of the laser-induced damage of the surface of optical material in the femtosecond regime is presented. The objective of this work is to investigate the different processes involved as a function of the ratio of photon to bandgap energies and compare the results to models based on nonlinear ionization processes. Experimentally, the laser-induced damage threshold of optical materials has been studied in a range of wavelengths from 1030 nm (1.2 eV) to 310 nm (4 eV) with pulse durations of 100 fs with the use of an optical parametric amplifier system. Semi-conductors and dielectrics materials, in bulk or thin film forms, in a range of bandgap from 1 to 10 eV have been tested in order to investigate the scaling of the femtosecond laser damage threshold with the bandgap and photon energy. A model based on the Keldysh photo-ionization theory and the description of impact ionization by a multiple-rate-equation system is used to explain the dependence of laser-breakdown with the...
Applied Optics | 2011
Laurent Gallais; Benoit Mangote; Myriam Zerrad; Mireille Commandré; Andrius Melninkaitis; Julius Mirauskas; Maksim Jeskevic; Valdas Sirutkaitis
Laser-damage thresholds and morphologies of hafnia single layers exposed under femtosecond, picosecond, and nanosecond single pulses (1030/1064 nm) are reported. The samples were made with different deposition parameters in order to study how the damage behavior of the samples evolves with the pulse duration and how it is linked to the deposition process. In the femtosecond to picosecond regime, the scaling law of the laser-induced damage threshold as a function of pulse duration is in good agreement with the models of photo and avalanche ionization based on the rate equation for free electron generation. However, differences in the damage morphologies between samples are shown. No correlation between the nanosecond and femtosecond/picosecond laser-damage resistance of hafnia coatings could be established. We also report evidence of the transition in damage mechanisms for hafnia, from an ablation process linked to intrinsic properties of the material to a defect-induced process, that exists between a few picoseconds and a few tens of picoseconds.
Applied Physics Letters | 2010
Laurent Gallais; Benoit Mangote; Mireille Commandré; Andrius Melninkaitis; Julius Mirauskas; Maksim Jeskevic; Valdas Sirutkaitis
Laser-induced damage in optical thin films with subpicosecond pulses is investigated. A model dedicated to optical interference coatings and based on the rate equation for free electron generation is introduced. It takes into account the transient interference effects induced by changes in the dielectric function during the laser pulse and its feedback effect on the electron density distribution in the multilayer stack. Simulations are compared to experiments on HfO2 and Ta2O5 films with pulses ranging from 45 fs to 1 ps. It is shown that this approach can improve the interpretation of femtosecond and picosecond laser induced damage in thin films.
Optical Materials Express | 2014
A. Žukauskas; Gintarė Batavičiūtė; Mindaugas Ščiuka; Tomas Jukna; Andrius Melninkaitis; Mangirdas Malinauskas
An ISO certified laser-induced damage threshold testing method was applied to characterize photopolymers widely used in 3D laser micro/nano-lithography. For the first time, commercial as well as custom made materials, including epoxy based photoresist (SU-8), hybrid organic-inorganic polymers (OrmoComp and SZ2080), thermopolymer (PDMS) and pure acrylate (PMMA), are investigated and directly compared. The presence of photoinitiator molecules within host matrix clearly indicating the relation between damage threshold and absorption of light is revealed. To simulate single- and multiphoton absorption processes optical resistance measurements were carried out at both fundamental (1064 and 1030 nm) and second harmonic (532 and 515 nm) wavelengths with laser pulse duration’s representing nanosecond and femtosecond regimes. Damage morphology differences from post mortal microscopic analysis were used to enrich the discussion about the possible breakdown mechanisms. The obtained characteristic values of damage threshold reveal potential of photopolymers and their possible applications in high power lasers.
Optics Letters | 2014
Nerijus Šiaulys; Laurent Gallais; Andrius Melninkaitis
Dynamic process of femtosecond laser-induced damage formation in dielectric thin films is reconstructed from a series of time-resolved images. Ta2O5 single-layer coatings of four different thicknesses have been investigated in transmission mode by means of time-resolved off-axis digital holography. Different processes overlapped in time were found to occur; namely, the Kerr effect, free-electron generation, ultrafast lattice heating, and shockwave generation. The trends in contribution of these effects are qualitatively reproduced by numerical models based on electron-rate equations and Drude theory, which take into account transient changes in the films and interference effects of the pump and probe pulses.
Review of Scientific Instruments | 2013
Gintarė Batavičiutė; Povilas Grigas; Linas Smalakys; Andrius Melninkaitis
In this study, the applicability of commonly used Damage Frequency Method (DFM) is addressed in the context of Laser-Induced Damage Threshold (LIDT) testing with pulsed lasers. A simplified computer model representing the statistical interaction between laser irradiation and randomly distributed damage precursors is applied for Monte Carlo experiments. The reproducibility of LIDT predicted from DFM is examined under both idealized and realistic laser irradiation conditions by performing numerical 1-on-1 tests. A widely accepted linear fitting resulted in systematic errors when estimating LIDT and its error bars. For the same purpose, a Bayesian approach was proposed. A novel concept of parametric regression based on varying kernel and maximum likelihood fitting technique is introduced and studied. Such approach exhibited clear advantages over conventional linear fitting and led to more reproducible LIDT evaluation. Furthermore, LIDT error bars are obtained as a natural outcome of parametric fitting which exhibit realistic values. The proposed technique has been validated on two conventionally polished fused silica samples (355 nm, 5.7 ns).