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Dive into the research topics where Antonello Tamburrino is active.

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Featured researches published by Antonello Tamburrino.


IEEE Transactions on Magnetics | 2010

Pulsed Eddy-Current Based Giant Magnetoresistive System for the Inspection of Aircraft Structures

Guang Yang; Antonello Tamburrino; Lalita Udpa; Satish S. Udpa; Zhiwei Zeng; Yiming Deng; Peiwen Que

Research in nondestructive evaluation is constantly increasing the sensitivity of detection of small cracks embedded deep in layered aircraft structures. Pulsed eddy-current (PEC) techniques using coil probes have shown considerable promise in detection and characterization of buried cracks in multilayered structures. In this paper, we describe the design and development of a nondestructive inspection system that uses pulse excitation of a planar multiline coil to generate a transient field that is detected via a giant magnetoresistive (GMR) field sensor. An analysis algorithm using features in time and frequency domain processes the experimentally measured signals for automatic detection of small cracks under fasteners in multilayered structures at a depth of up to 10 mm.


Inverse Problems | 2002

A new non-iterative inversion method for electrical resistance tomography

Antonello Tamburrino; G. Rubinacci

In this paper, the inverse problem of resistivity retrieval is addressed in the frame of electrical resistance tomography (ERT). The ERT data is a set of measurements of the dc resistances between pairs of electrodes in contact with the conductor under investigation. This paper is focused on a non-iterative inversion method based on the monotonicity of the resistance matrix (and of its numerical approximations). The main features of the proposed inversion method are its low computational cost requiring the solution of O(n) direct problems, where n is the number of parameters used to represent the unknown resistivity, and its very simple numerical implementation.


Nano Letters | 2012

Genetically engineered plasmonic nanoarrays

Carlo Forestiere; Alyssa J. Pasquale; Antonio Capretti; Giovanni Miano; Antonello Tamburrino; Sylvanus Y. Lee; Björn M. Reinhard; Luca Dal Negro

In the present Letter, we demonstrate how the design of metallic nanoparticle arrays with large electric field enhancement can be performed using the basic paradigm of engineering, namely the optimization of a well-defined objective function. Such optimization is carried out by coupling a genetic algorithm with the analytical multiparticle Mie theory. General design criteria for best enhancement of electric fields are obtained, unveiling the fundamental interplay between the near-field plasmonic and radiative photonic coupling. Our optimization approach is experimentally validated by surface-enhanced Raman scattering measurements, which demonstrate how genetically optimized arrays, fabricated using electron beam lithography, lead to order of ten improvement of Raman enhancement over nanoparticle dimer antennas, and order of one hundred improvement over optimal nanoparticle gratings. A rigorous design of nanoparticle arrays with optimal field enhancement is essential to the engineering of numerous nanoscale optical devices such as plasmon-enhanced biosensors, photodetectors, light sources and more efficient nonlinear optical elements for on chip integration.


Inverse Problems | 1997

On the local minima problem in conductivity imaging via a quadratic approach

Rocco Pierri; Antonello Tamburrino

The nonlinear inverse problem of the reconstruction of the electric conductivity of a cylindrical object embedded in a homogeneous space is addressed by approximating the operator that maps the conductivity into the scattered field at the second order. The problem is stated as the minimization of an error functional that can exhibit local minima. The geometrical properties of the quadratic operator are exploited to avoid the presence of local minima. Numerical results validate the theoretical analysis.


ieee international magnetics conference | 2006

Adaptive Wavelets for Characterizing Magnetic Flux Leakage Signals From Pipeline Inspection

Ameet Joshi; Lalita Udpa; Satish S. Udpa; Antonello Tamburrino

This paper presents an iterative inversion scheme using radial basis function neural network (RBFNN) for predicting the depth profile of a defect in the pipe-wall from the information in the magnetic flux leakage (MFL) signal. Due to the high dimensionality of the data the method uses a multi-resolution approach with adaptive wavelets. The algorithm is fast and provides full three dimensional profile of the defect in the pipewall which is important for predicting the remaining life of the pipe.


IEEE Transactions on Magnetics | 2002

Circuits/fields coupling and multiply connected domains in integral formulations

G. Rubinacci; Antonello Tamburrino; F. Villone

In this paper, we present a unified approach for treating both the coupling between circuits and electromagnetic fields and multiply connected domains. The eddy-currents equations are solved using an integral formulation exploiting nonlocal basis functions.


IEEE Transactions on Magnetics | 2006

Fast Methods for Quantitative Eddy-Current Tomography of Conductive Materials

Antonello Tamburrino; Guglielmo Rubinacci

In this paper, we address the imaging of the spatial distribution of the resistivity of conductive materials by using data from eddy-current nondestructive testing. Specifically, the data consists of measurements of the impedance matrix at several frequencies acquired using a coil array. The imaging method processes the second-order term (estimated from the measured data) of the power series expansion, with respect to frequency, of the impedance matrix. This term accounts for the resistive contribution to changes of the impedance matrix, due to the presence of anomalies in the conductor under test, occurring at relatively low frequencies. The operator mapping a given resistivity distribution inside the conductor into the second-order term satisfies a proper monotonicity property. The monotonicity makes it possible to apply a fast noniterative imaging method initially developed by the authors for elliptic problems such as electrical resistance tomography. Numerical examples show the main features of the proposed method, and demonstrate the possibility of real-time imaging.


Investigative Ophthalmology & Visual Science | 2014

Differential vulnerability of retinal layers to early age-related macular degeneration: Evidence by SD-OCT segmentation analysis

Maria Cristina Savastano; Angelo Maria Minnella; Antonello Tamburrino; G. Giovinco; Salvatore Ventre; Benedetto Falsini

PURPOSE We evaluated layer-by-layer retinal thickness in spectral-domain optical coherence tomography (SD-OCT), determined by automated segmentation analysis (ASA) software in healthy and early age-related maculopathy (ARM) eyes. METHODS There were 57 eyes (specifically, 19 healthy eyes under 60 years old, 19 healthy eyes over 60, and 19 ARM eyes) recruited into this cross-sectional study. The mean ages were 36.78 (SD, ±13.82), 69.89 (SD, ±6.14), and 66.10 (SD, ±8.67) years, respectively, in the three study groups. The SD-OCT scans were transferred into a dedicated software program that performed automated segmentation of different retinal layers. RESULTS Automated layer segmentation showed clear boundaries between the following layers: retinal nerve fiber layer (RNFL), ganglion cell layer plus inner plexiform layer (GCL+IPL), inner nuclear layer plus outer plexiform layer (INL+OPL), outer nuclear layer (ONL), and RPE complex. The thickness of the RNFL, ONL, and RPE layers did not show a statistically significant change across the three groups by ANOVA (P = 0.10, P = 0.09, P = 0.15, respectively). The thickness of GCL+IPL and INL+OPL was significantly different across the groups (P < 0.01), being reduced in the ARM eyes compared to healthy eyes, under and over 60 years old. CONCLUSIONS The early morphologic involvement of the GCL+IPL and INL+OPL layers in ARM eyes, as revealed by the ASA, could be related to early anatomic changes described in the inner retina of ARM eyes. This finding may represent a morphologic correlation to the deficits in postreceptoral retinal function in ARM eyes.


IEEE Transactions on Magnetics | 2006

Numerical models of volumetric insulating cracks in eddy-current testing with experimental validation

Maxim Morozov; Guglielmo Rubinacci; Antonello Tamburrino; Salvatore Ventre

This paper concerns fast electromagnetic modeling of volumetric cracks in conductive materials under eddy-current inspection. The underlying numerical method is described. The model is tested on cracks in aluminum structures employed in aeronautical manufacture. The computational results obtained with the method display satisfactory agreement with the respective experimental and numerical results obtained by representing cracks as nonconductive surfaces.


Journal of The Optical Society of America A-optics Image Science and Vision | 2012

Surface integral formulations for the design of plasmonic nanostructures

Carlo Forestiere; Giovanni Iadarola; Guglielmo Rubinacci; Antonello Tamburrino; Luca Dal Negro; Giovanni Miano

Numerical formulations based on surface integral equations (SIEs) provide an accurate and efficient framework for the solution of the electromagnetic scattering problem by three-dimensional plasmonic nanostructures in the frequency domain. In this paper, we present a unified description of SIE formulations with both singular and nonsingular kernel and we study their accuracy in solving the scattering problem by metallic nanoparticles with spherical and nonspherical shape. In fact, the accuracy of the numerical solution, especially in the near zone, is of great importance in the analysis and design of plasmonic nanostructures, whose operation critically depends on the manipulation of electromagnetic hot spots. Four formulation types are considered: the N-combined region integral equations, the T-combined region integral equations, the combined field integral equations and the null field integral equations. A detailed comparison between their numerical solutions obtained for several nanoparticle shapes is performed by examining convergence rate and accuracy in both the far and near zone of the scatterer as a function of the number of degrees of freedom. A rigorous analysis of SIE formulations and their limitations can have a high impact on the engineering of numerous nano-scale optical devices such as plasmon-enhanced light emitters, biosensors, photodetectors, and nanoantennas.

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Guglielmo Rubinacci

University of Naples Federico II

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Lalita Udpa

Michigan State University

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Satish S. Udpa

Michigan State University

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Giovanni Miano

University of Naples Federico II

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Zhiyi Su

Michigan State University

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Flavio Calvano

University of Naples Federico II

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Alessandro Formisano

Seconda Università degli Studi di Napoli

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