Archana Sinha

Detection and characterisation of delamination in PV modules by active infrared thermography

The paper presents a fast and efficient method for the detection and characterisation of delamination in photovoltaic (PV) modules by using active infrared thermography approach. A discrete part of PV module was irradiated by step heating and its thermal image sequence was used to detect and analyse delamination. Different types of heating source for thermal excitation for this application have been studied. An electro-thermal model was developed to simulate the active thermography approach for the characterisation of delamination in PV module by equivalent resistance–capacitance (RC) network using a circuit simulator. This simulation approach was used to estimate the extent of delamination in the module and to determine the optimum parameters for the characterisation of delamination. Different applications based on front and backsides of heating the module were also proposed in this paper. The proposed method has the potential to be employed for the quality check of PV modules during inline production as well as for the predictive maintenance of outdoor PV plants.

Accelerated Spatially Resolved Electrical Simulation of Photovoltaic Devices Using Photovoltaic-Oriented Nodal Analysis

This paper presents photovoltaic-oriented nodal analysis (PVONA), a general and flexible tool for efficient spatially resolved simulations for photovoltaic (PV) cells and modules. This approach overcomes the major problem of the conventional Simulation Program with Integrated Circuit Emphasis-based approaches for solving circuit network models, which is the limited number of nodes that can be simulated due to memory and computing time requirements. PVONA integrates a specifically designed sparse data structure and a graphics processing unit-based parallel conjugate gradient algorithm into a PV-oriented iterative Newton-Raphson solver. This first avoids the complicated and time-consuming netlist parsing, second saves memory space, and third accelerates the simulation procedure. In the tests, PVONA generated the local current and voltage maps of a model with 316 × 316 nodes with a thin-film PV cell in 15 s, i.e., using only 4.6% of the time required by the latest LTSpice package. The 2-D characterization is used as a case study and the potential application of PVONA toward quantitative analysis of electroluminescence are discussed.

Cross-Characterization for Imaging Parasitic Resistive Losses in Thin-Film Photovoltaic Modules

Thin-film photovoltaic (PV) modules often suffer from a variety of parasitic resistive losses in transparent conductive oxide (TCO) and absorber layers that significantly affect the module electrical performance. This paper presents the holistic investigation of resistive effects due to TCO lateral sheet resistance and shunts in amorphous-silicon (a-Si) thin-film PV modules by simultaneous use of three different imaging techniques, electroluminescence (EL), lock-in thermography (LIT) and light beam induced current (LBIC), under different operating conditions. Results from individual techniques have been compared and analyzed for particular type of loss channel, and combination of these techniques has been used to obtain more detailed information for the identification and classification of these loss channels. EL and LIT techniques imaged the TCO lateral resistive effects with different spatial sensitivity across the cell width. For quantification purpose, a distributed diode modeling and simulation approach has been exploited to estimate TCO sheet resistance from EL intensity pattern and effect of cell width on module efficiency. For shunt investigation, LIT provided better localization of severe shunts, while EL and LBIC given good localization of weak shunts formed by the scratches. The impact of shunts on the photocurrent generation capability of individual cells has been assessed by li-LBIC technique. Results show that the cross-characterization by different imaging techniques provides additional information, which aids in identifying the nature and severity of loss channels with more certainty, along with their relative advantages and limitations in particular cases.

Modeling spatial electrical properties in photovoltaic modules using PV-oriented nodal analysis

Inhomogeneities in photovoltaic (PV) devices can cause spatially nonuniform performances and hence electrical mismatches which will reduce the overall power generation. A hierarchical distributed electrical network modeling technique is developed to investigate localized electrical properties and their impacts on the change of power generation of PV modules. A PV-oriented nodal analysis method is developed to enable the spatially-resolved quantitative analysis of electrical operating points by given localized properties. The simulation results show that the spatial electrical operating points and the overall electrical power output of the module can be calculated from distributed parameters. The possibility of combining this modeling approach with physical characterization techniques is discussed. This approach allows reconstructing PV modules utilizing material related parameters and acceleration over conventional methods, which may enable it to be a manufacturing relevant simulation tool.

Investigation of Degradation in Photovoltaic Modules by Infrared and Electroluminescence Imaging

Photovoltaic (PV) modules suffer from a variety of degradation that reduces their long-term performance and reliability. This paper presents a comprehensive investigation of various outdoor degradation in PV modules by spatially-resolved infrared (IR) thermography and electroluminescence (EL) characterization techniques. Active IR thermography has been implemented for the investigation of delamination, corroded interconnects and other electrical losses in a PV module, while EL characterization technique has been exploited for the quantification of discoloration extent in encapsulant material, and detection of finger and cell breakages. Due to fast and non-destructive nature, these imaging techniques can be employed for large-area inspection of PV modules in shorter time.

Effects of different excitation waveforms on detection and characterisation of delamination in PV modules by active infrared thermography

Abstract Delamination significantly affects the performance and reliability of photovoltaic (PV) modules. Recently, an active infrared thermography approach using step heating has been exploited for the detection and characterisation of delamination in PV modules. However, step heating takes longer observation time and causes overheating problems. This paper presents the effects of different thermal excitation waveforms namely rectangular, half-sine and short pulse, on the detection and characterisation of delamination in PV module by experiments and simulations. For simulation, a 3-dimensional electro-thermal model of heat conduction, based on resistance-capacitance network approach, has been exploited to study the variation in maximum thermal contrast and peak contrast time with the delamination thickness and heating parameters. Results show that the rectangular waveform provides better detection of delamination due to higher absolute contrast, while the half-sine waveform allows better characterisation of delamination in the PV modules with low-cost and low-power heat source. The high-energy short pulse enabled quick visualisation of delamination, but has limited practical implementation. The advantages and limitations of each waveform have been highlighted to assess the specific requirement for appropriate choice in the non-destructive thermographic inspection of delamination in PV modules at the manufacturing units or outdoor fields.

Imaging of TCO lateral resistance effects in thin-film PV modules by lock-in thermography and electroluminescence techniques

The lateral sheet resistance of transparent conductive oxide (TCO) electrode in thin-film photovoltaic (PV) modules is a major component of series resistance losses that causes significant reduction in the fill-factor and output power. This paper presents the investigation of TCO lateral resistance effects in the encapsulated thin-film modules by lock-in thermography (LIT) technique, which is predominantly used for shunt investigation in the solar cells. The LIT technique has been employed under both dark and illuminated conditions to compare their spatial sensitivity for imaging TCO resistance effects in a module. The LIT images have also been compared with electroluminescence (EL) images to find a correlation between localized heating and voltage drop across distributed TCO layer resistances, and to determine their advantages and limitations. Experimental results show that both, DLIT and ILIT, exhibit a gradient in thermal signal along the cell width due to variation in power dissipation across the lateral resistance of TCO electrode. However, ILIT appears to be more sensitive for imaging TCO resistance losses due to less junction masking effect. The spatial sensitivity also depends on the width of cell in a module. For narrower cells, DLIT and EL techniques are observed to be more sensitive near the higher potential edge of a cell as compared to ILIT. The study concludes that the LIT technique is also a potential candidate for providing the spatially-resolved characterization of TCO resistive losses in thin-film modules.