Ashish Pancholy
Cypress Semiconductor
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Publication
Featured researches published by Ashish Pancholy.
IEEE Design & Test of Computers | 1992
Ashish Pancholy; Janusz Rajski; Larry J. McNaughton
A way to empirically validate fault models and to measure the effectiveness of test sets based on the targeted fault models is described. The authors use automated fault diagnosis of test circuits representative of the circuits being studied and of the fabrication process, cell libraries, and CAD tools used in their development. The design and fabrication of a test chip using an experimental CMOS, 1.5- mu m double-layer metal process are discussed.<<ETX>>
Archive | 2001
Jonathan F. Churchill; Jeffrey F. Kooiman; Cathal G. Phelan; Ashish Pancholy; Gary A. Gibbs
Archive | 1999
Ashish Pancholy; Cathal G. Phelan; Simon J. Lovett
Archive | 1997
Jonathan F. Churchill; Neil P. Raftery; Colin J. Hendry; Jeyakumar Shanmugam; Mark A. Finn; Thomas M. Surrette; Cathal G. Phelan; Ashish Pancholy
Archive | 1997
Jonathan F. Churchill; Neil P. Raftery; Colin J. Hendry; Jeyakumar Shanmugam; Mark A. Finn; Thomas M. Surrette; Cathal G. Phelan; Ashish Pancholy
Archive | 1997
Jonathan F. Churchill; Neil P. Raftery; Jeyakumar Shanmugam; Mark A. Finn; Thomas M. Surrette; Cathal G. Phelan; Ashish Pancholy
Archive | 1999
Mathew R. Arcoleo; Cathal G. Phelan; Ashish Pancholy; Simon J. Lovett
Archive | 2001
Mathew R. Arcoleo; Cathal G. Phelan; Ashish Pancholy; Simon J. Lovett
Archive | 2001
Mathew R. Arcoleo; Cathal G. Phelan; Ashish Pancholy; Simon J. Lovett
Archive | 1997
Raymond E. Bloker; Ashish Pancholy; Gary A. Gibbs