B Bart Smeets
Eindhoven University of Technology
Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by B Bart Smeets.
Applied Physics Letters | 2004
te E Edwin Sligte; B Bart Smeets; van der Kmr Stam; Rw Rudolf Herfst; van der P Peter Straten; Hcw Herman Beijerinck; van Kah Ton Leeuwen
Direct write atom lithography is a technique in which nearly resonant light is used to pattern an atom beam. Nanostructures are formed when the patterned beam falls onto a substrate. We have applied this lithography scheme to a ferromagnetic element, using a 372nm laser light standing wave to pattern a beam of iron atoms. In this proof-of-principle experiment, we have deposited a grid of 50-nm-wide lines 186nm apart. These ultraregular, large-scale, ferromagnetic wire arrays may generate exciting new developments in the fields of spintronics and nanomagnetics.
Microelectronic Engineering | 2003
te E Edwin Sligte; B Bart Smeets; Rcm Roeland Bosch; van der Kmr Stam; Lp Maguire; R. E. Scholten; Hcw Herman Beijerinck; van Kah Ton Leeuwen
We aim to apply atom optical techniques to iron to produce periodic magnetic nanostructures. Laser cooling has been observed experimentally, and calculations predict that a bright beam can be obtained with 200 µrad divergence. We expect to be able to laser focus this beam to feature sizes around 10 nm by the use of nanoseale mechanical beam masking and velocity selection via a supersonic source. In separate calculations, we have modelled surface diffusion of the atoms during deposition using a kinetic Monte Carlo approach taking into account the Ehrlich-Schwoebel barrier. These calculations successfully explain anomalous broadening of structures observed in similar experiments on chromium [Anderson et al., Phys. Rev. A 59 (1999) 2476].
Journal of Applied Physics | 2004
te E Edwin Sligte; van der Kmr Stam; B Bart Smeets; van der P Peter Straten; R. E. Scholten; Hcw Herman Beijerinck; van Kah Ton Leeuwen
Thermally activated surface diffusion has a strong influence on structure widths in atom lithography. We investigate the effects of two barriers to thermally activated atomic diffusion on atom lithography: a thermally activated Ehrlich–Schwoebel (ES) barrier, and pollution from the residual gas in the vacuum system. We performed kinetic Monte Carlo simulations using a one-dimensional surface grid. We find that the ES barrier fails to explain the lack of temperature dependence observed experimentally [W. R. Anderson et al., Phys. Rev. A 59, 2476 (1999)]. The dependencies of the structure width on temperature, vacuum conditions, and beam characteristics can be explained using the pollutant adatom hypothesis. Only the variation of structure width with deposition duration was not entirely reproduced by this model. We attribute this to the one-dimensional nature of our simulations. These results demonstrate that barrier-limited diffusion can play an important role in atom lithography, and that pollutant adatom...
Applied Physics B | 2003
B Bart Smeets; Rcm Roeland Bosch; van der P Peter Straten; te E Edwin Sligte; R. E. Scholten; Hcw Herman Beijerinck; van Kah Ton Leeuwen
Applied Physics B | 2005
B Bart Smeets; Rw Rudolf Herfst; Lp Maguire; te E Edwin Sligte; van der P Peter Straten; Hcw Herman Beijerinck; van Kah Ton Leeuwen
Proceedings of the National Academy of Sciences of the United States of America | 2002
te E Edwin Sligte; Rcm Roeland Bosch; B Bart Smeets; van der P Peter Straten; Hcw Herman Beijerinck; van Kah Ton Leeuwen
Atmospheric Environment | 2010
C.G.C.H.M. Fabrie; L.P. van Dijk; B Bart Smeets; T. Meijer; K.A.H. van Leeuwen
Applied Physics B | 2009
R. E. Scholten; S. C. Bell; D. V. Sheludko; Jd White; L. D. Turner; T Thijs Meijer; B Bart Smeets; P Jeppesen; C. S. Hofmann; M. Jasperse; R. P. Anderson
Archive | 2005
B Bart Smeets; E. te Sligte; P. van der Straten; H.C.W. Beijerinck; K. A. H. van Leeuwen
Journal of the Optical Society of America | 2005
B Bart Smeets; Rw Rudolf Herfst; Edwin Te Sligte; P. van der Straten; H.C.W. Beijerinck; K. A. H. van Leeuwen