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Dive into the research topics where Ba Bas Korevaar is active.

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Featured researches published by Ba Bas Korevaar.


Journal of Applied Physics | 2001

Hydrogenated amorphous silicon deposited at very high growth rates by an expanding Ar–H2–SiH4 plasma

Wmm Erwin Kessels; Rj René Severens; Ahm Arno Smets; Ba Bas Korevaar; Guy Adriaenssens; Dc Daan Schram; van de Mcm Richard Sanden

The properties of hydrogenated amorphous silicon (a-Si:H) deposited at very high growth rates (6–80 nm/s) by means of a remote Ar–H2–SiH4 plasma have been investigated as a function of the H2 flow in the Ar–H2 operated plasma source. Both the structural and optoelectronic properties of the films improve with increasing H2 flow, and a-Si:H suitable for the application in solar cells has been obtained at deposition rates of 10 nm/s for high H2 flows and a substrate temperature of 400 °C. The “optimized” material has a hole drift mobility which is about a factor of 10 higher than for standard a-Si:H. The electron drift mobility, however, is slightly lower than for standard a-Si:H. Furthermore, preliminary results on solar cells with intrinsic a-Si:H deposited at 7 nm/s are presented. Relating the film properties to the SiH4 dissociation reactions reveals that optimum film quality is obtained for conditions where H from the plasma source governs SiH4 dissociation and where SiH3 contributes dominantly to film ...


Journal of Non-crystalline Solids | 2000

High hole drift mobility in a-Si:H deposited at high growth rates for solar cell application

Ba Bas Korevaar; Guy Adriaenssens; Ahm Arno Smets; Wmm Erwin Kessels; H-Z Song; van de Mcm Richard Sanden; Dc Daan Schram

Time-of-flight measurements on hydrogenated amorphous silicon deposited with a remote expanding thermal plasma at growth rates up to 12 nm/s have revealed a 7 to 10 times larger hole mobility than for films deposited with conventional rf-PECVD. The electron mobility on the other hand is up to 3 times less. Based on a determination of the density of states by post-transit photo-current analysis we suggest a comparable defect density at mid-gap as for films deposited with rf-PECVD. These material properties have been obtained at a substrate temperature of 400°C, which is needed to obtain solar grade material at these growth rates. Possible causes of these particular material properties, which may have application in thin film solar cells, are discussed. Furthermore we show that the high substrate temperature is still a drawback in solar cell preparation when using the standard p-i-n configuration.


Journal of Non-crystalline Solids | 2002

Fast deposition of microcrystalline silicon with an expanding thermal plasma

C Chiel Smit; Eag Hamers; Ba Bas Korevaar; van Racmm René Swaaij; van de Mcm Richard Sanden

Abstract Microcrystalline silicon has been deposited using an expanding thermal plasma. High deposition rates are achieved, which is attractive for solar cell production. A first survey of the influence of the deposition parameters on the optical, electrical and structural material properties is performed. SEM analyses show columnar growth and infrared absorption shows varying oxygen content. For some of the deposition conditions the dark and photoconductivities approximate 10−7 and 10−5 S/cm, respectively. Also the deposition plasma has been studied by means of mass spectrometry. It is concluded that the expanding thermal plasma is well suited for the deposition of microcrystalline silicon at growth rates up to 3.7 nm/s.


MRS Proceedings | 2002

Integration of expanding thermal plasma deposited hydrogenated amorphous silicon in solar cells

Ba Bas Korevaar; C Chiel Smit; A.M.H.N. Petit; R.A.C.M.M. van Swaaij; M.C.M. van de Sanden

• A submitted manuscript is the authors version of the article upon submission and before peer-review. There can be important differences between the submitted version and the official published version of record. People interested in the research are advised to contact the author for the final version of the publication, or visit the DOI to the publishers website. • The final author version and the galley proof are versions of the publication after peer review. • The final published version features the final layout of the paper including the volume, issue and page numbers.


MRS Proceedings | 1999

The role of H in the growth mechanism of PECVD a-Si:H

van de Mcm Richard Sanden; Wmm Erwin Kessels; Ahm Arno Smets; Ba Bas Korevaar; Dc Daan Schram; Rj René Severens

This paper describes an extension of the silyl radical based kinetic growth model by atomic hydrogen induced surface hydrogen abstraction processes. It is shown that by including this direct abstraction process several problems of the SiH 3 based model are resolved. The defect density can be predicted with the proper temperature dependence and order of magnitude. The implications for high rate deposition of a-Si:H are discussed


MRS Proceedings | 1997

Argon-surface interactions in ibad-deposited molybdenum films

Jan van der Kuur; Ba Bas Korevaar; Martin Pols; Jacqueline van der Linden; Barend J. Thijsse

Argon incorporation and defect creation were studied experimentally. Direct desorption measurements have been used to establish the argon implantation profile. A projected range and range straggle of 0.8 and 3.5 A were found. Argon is incorporated at substitutional positions. The creation rate of defects by argon was studied by helium desorption spectrometry. A net creation rate of (0.7 ± 0.4) × 10 −3 vacancy/argon atom was found. Ion assisted deposition at elevated substrate temperatures shows that all incorporated argon acts as helium trap. Argon fluence variations show an effective cross-section for self sputtering of 31 A 2 , a trapping probability of 6.5%, and a maximum achievable argon concentration of 4 × 10 −3


photovoltaic specialists conference | 2013

Electron paramagnetic resonance as a probe of technologically relevant processing effects on CdTe solar cell materials

Michael Pigott; Liam Young; P. M. Lenahan; Adam F. Halverson; Kristian William Andreini; Ba Bas Korevaar

The performance of polycrystalline thin film CdTe solar cells is limited by as yet poorly understood deep level defects which serve as recombination centers. Electron paramagnetic resonance (EPR) has unrivaled analytical power and sensitivity in the identification of deep level defects in semiconductors; however, very little EPR literature exists with regard to technologically relevant processing of present day polycrystalline CdTe solar cells. In this study we explore the effects of several features important in these present day processing techniques: (1) effects of CdCl2 etching and (2) effects of Cu on the CdTe. Cu is widely used with CdTe solar cells and is thought to play a significant role in CdTe solar cells performance. Although the EPR spectra in all the cases we explored are dominated by a substitutional Mn site signal, our results are clearly sensitive to multiple changes caused by the aforementioned processing parameters.


photovoltaic specialists conference | 2002

High-rate microcrystalline silicon for solar cells

C Chiel Smit; Ba Bas Korevaar; Amhn Petit; van Racmm René Swaaij; Wmm Erwin Kessels; van de Mcm Richard Sanden

In order to produce thin silicon films for solar cells at high growth rates we deposited films with a cascaded arc expanding thermal plasma. We demonstrate the power of this technique by applying amorphous films deposited at rates up to 1.4 nm/s in solar cells. We used the same deposition technique to produce microcrystalline silicon films. Growth rates up to 3.7 nm/s are achieved. The material structure is analyzed using Raman spectroscopy and XRD. We see that the crystalline fraction increases with the H/sub 2/ flow, whereas the amorphous and the void fraction decrease.


photovoltaic specialists conference | 2000

Temperature dependence at various intrinsic a-Si:H growth rates of p-i-n deposited solar cells

Ba Bas Korevaar; C Chiel Smit; Ahm Arno Smets; van Racmm René Swaaij; Dc Daan Schram; van de Mcm Richard Sanden

With a cascaded arc expanding thermal plasma, intrinsic solar grade amorphous silicon can be deposited at growth rates varying from 2 to 100 /spl Aring//s. The temperature above which good material is obtained becomes higher for higher growth rates. Higher deposition temperatures affect the p-layer within p-i-n grown solar cells, which will result in other optimum deposition temperatures of the i-layer. In this paper, the authors address the dependence of the p-i-n solar cell performance on the deposition rate and deposition temperature.


Thin Solid Films | 2005

High-rate deposition of microcrystalline silicon with an expanding thermal plasma

C Chiel Smit; A Arjen Klaver; Ba Bas Korevaar; Amhn Petit; D. L. Williamson; van Racmm René Swaaij; van de Mcm Richard Sanden

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van de Mcm Richard Sanden

Eindhoven University of Technology

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Dc Daan Schram

Eindhoven University of Technology

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Ahm Arno Smets

Eindhoven University of Technology

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Wmm Erwin Kessels

Eindhoven University of Technology

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C Chiel Smit

Eindhoven University of Technology

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van Racmm René Swaaij

Delft University of Technology

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Amhn Petit

Delft University of Technology

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J.W. Metselaar

Delft University of Technology

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Guy Adriaenssens

Katholieke Universiteit Leuven

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Daniel C. Schram

Eindhoven University of Technology

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