Bai Ningfeng
Southeast University
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Publication
Featured researches published by Bai Ningfeng.
international vacuum electronics conference | 2011
Fan Hehong; Xu Yishu; Bai Ningfeng; Li Ji; Xiao Jinbiao; Sun Xiaohan
Reliability of cathodes is critical for the reliability of traveling wave tubes. Accordingly, the reliability test and life prediction of diodes can provide useful information for cathode and TWT reliability evaluation. In this paper, a simple cathode life prediction method considering the evolving of heater power and perveance is presented. The method is applied on the reliability test data for some glass diode samples and several gun samples. The evaluation results show that the cathode life in the electron guns is much longer than those in the diode samples. And the cathode life prediction result for the diodes, based on the evolving of perveance and heater power for a certain anode current and voltage, is close to the final test result.
Archive | 2013
Sun Xiaohan; Jiang Weifeng; Bai Ningfeng; Xu Aimin; Lu Zhongming
Archive | 2013
Sun Xiaohan; Jiang Weifeng; Bai Ningfeng; Liu Xu; Wu Chen
Archive | 2015
Liu Xu; Cai Yuanyuan; Sun Xiaohan; Bai Ningfeng; Chen Han
Archive | 2014
Sun Xiaohan; Jiang Weifeng; Liu Xu; Bai Ningfeng; Xiao Jinbiao; Xu Aimin; Lu Zhongming
Archive | 2013
Liu Xu; Liu Wenqiang; Jiang Weifeng; Sun Xiaohan; Bai Ningfeng
Archive | 2013
Sun Xiaohan; Jiang Weifeng; Xu Daxin; Bai Ningfeng; Liu Xu
international vacuum electronics conference | 2017
Zhao Xingqun; Lou Jilin; Bai Ningfeng; Fan Hehong; Shen Chang-Sheng; Sun Xiaohan
Archive | 2015
Bai Ningfeng; Xu Zhengying; Sun Xiaohan; Jiang Weifeng; Liu Xu; Xu Aimin; Wu Tirong
Archive | 2013
Sun Xiaohan; Jiang Weifeng; Liu Xu; Bai Ningfeng; Xiao Jinbiao; Xu Aimin; Lu Zhongming