Benjamin Epstein
Wayne State University
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Featured researches published by Benjamin Epstein.
Technometrics | 1960
Benjamin Epstein
It is frequently useful to test, on the basis of life test data, whether or not one is justified in assuming that the underlying distribution of life is exponential. This paper, which appears in two parts, describes a number of graphical and analytical procedures for testing this assumption. Part I of the paper contains descriptions of the mathematical and graphical procedures. Part II contains several worked examples.
Technometrics | 1960
Benjamin Epstein
Part I of this paper was published in the previous issue of Technometrics, (Vol. 2, No. 1, February 1960). In Part I Dr. Epstein describes several graphical and analytical procedures for testing the assumption that the underlying distribution of life is exponential. This portion of the paper contains numerical examples illustrative of these procedures.
Technometrics | 1960
Benjamin Epstein
The theory of extreme values finds many applications in modern technology. This paper is an attempt to unfold the basic elements of the theory. Frequent examples are given to illustrate both derivations and application.
Technometrics | 1960
Benjamin Epstein
This paper describes statistical methods for testing hypotheses about the mean of an exponential distribution of life. Advantage is taken of the time-ordered nature of life test data to shorten substantially the time required to reach a decision. Replacement, non-replacement, sequential, non-sequential, and truncated procedures are described. Some useful tables are given at the end of the paper.
Journal of the American Statistical Association | 1955
Benjamin Epstein
Abstract * Research sponsored by the Office of Ordnance Research of the U. S. Army under Contract No. DA-20-018-ORD-13272.
Technometrics | 1960
Benjamin Epstein
In life testing a two parameter exponential distribution is often required to provide an adequate representation of the observed results. Sufficient statistics and interval estimates for the parameters are given for the case of censored data. Numerical examples are provided.
Ire Transactions on Reliability and Quality Control | 1960
Benjamin Epstein
Technometrics | 1961
Benjamin Epstein
Journal of The Franklin Institute-engineering and Applied Mathematics | 1955
Benjamin Epstein
Technometrics | 1964
Benjamin Epstein