Bernard Rasser
CAMECA
Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by Bernard Rasser.
Applied Surface Science | 2003
E. de Chambost; Pierre Monsallut; Bernard Rasser; M. Schuhmacher
The depth scale calibration of a SIMS depth profile requires to determine the sputter rate used for the analysis from the crater depth measurement. An in situ crater depth measurement system based on the heterodyne laser interferometer has been developed. Experimental results demonstrate that crater depths can be measured from nanometers to micrometers range with an accuracy better than 5% in different matrices and a repeatability of 1%.
Archive | 1988
Henri-Noel Migeon; Bernard Rasser
Fresenius Journal of Analytical Chemistry | 1999
M. Schuhmacher; Bernard Rasser; E. de Chambost; F. Hillion; Th. Mootz; H.-N. Migeon
Archive | 1991
Emmanuel de Chambost; Bernard Rasser
Applied Surface Science | 2004
E. de Chambost; A. Merkulov; P. Peres; Bernard Rasser; M. Schuhmacher
Archive | 1988
Wielfried Vandervorst; Bernard Rasser; Bisschop Peter De
Archive | 1992
Emmanuel de Chambost; Bernard Rasser
Archive | 1988
Henri Migeon; Bernard Rasser
Archive | 1988
Henri Migeon; Bernard Rasser
Archive | 1988
Wielfried Vandervorst; Bernard Rasser; Bisschop Peter De
