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Dive into the research topics where Boris Benner is active.

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Featured researches published by Boris Benner.


Journal of Synchrotron Radiation | 1999

Imaging by parabolic refractive lenses in the hard X-ray range

B. Lengeler; Christian G. Schroer; J. Tümmler; Boris Benner; M. Richwin; A. Snigirev; I. Snigireva; Michael Drakopoulos

The manufacture and properties of compound refractive lenses (CRLs) for hard X-rays with parabolic profile are described. These novel lenses can be used up to ∼60 keV. A typical focal length is 1 m. They have a geometrical aperture of 1 mm and are best adapted to undulator beams at synchrotron radiation sources. The transmission ranges from a few % in aluminium CRLs up to about 30% expected in beryllium CRLs. The gain (ratio of the intensity in the focal spot relative to the intensity behind a pinhole of equal size) is larger than 100 for aluminium and larger than 1000 for beryllium CRLs. Due to their parabolic profile they are free of spherical aberration and are genuine imaging devices. The theory for imaging an X-ray source and an object illuminated by it has been developed, including the effects of attenuation (photoabsorption and Compton scattering) and of the roughness at the lens surface. Excellent agreement between theory and experiment has been found. With aluminium CRLs a lateral resolution in imaging of 0.3 µm has been achieved and a resolution below 0.1 µm can be expected for beryllium CRLs. The main fields of application of the refractive X-ray lenses are (i) microanalysis with a beam in the micrometre range for diffraction, fluorescence, absorption, scattering; (ii) imaging in absorption and phase contrast of opaque objects which cannot tolerate sample preparation; (iii) coherent X-ray scattering.


Journal of Physics D | 2005

Refractive x-ray lenses

B. Lengeler; Christian G. Schroer; Marion Kuhlmann; Boris Benner; Til Florian Gunzler; Olga Kurapova; Federico Zontone; A. Snigirev; I. Snigireva

Parabolic refractive x-ray lenses are novel optical components for the hard x-ray range from about 5 keV to about 120 keV. They are compact, robust, and easy to align and to operate. They can be used like glass lenses are used for visible light, the main difference being that the numerical aperture is much smaller than 1 (of the order of 10−4–10−3). They have been developed at Aachen University and are made of beryllium, boron, aluminium and silicon. Their main applications are in micro- and nanofocusing, in imaging by absorption and phase contrast. In combination with tomography they allow for three-dimensional imaging of opaque media with sub-micrometre resolution. Finally, they can be used in speckle spectroscopy by means of coherent x-ray scattering. References to a number of applications are given.


Applied Physics Letters | 2002

Nanotomography based on hard x-ray microscopy with refractive lenses

C.G. Schroer; J. Meyer; Marion Kuhlmann; Boris Benner; Til Florian Gunzler; B. Lengeler; Christoph Rau; Timm Weitkamp; A. Snigirev; I. Snigireva

Based on parabolic refractive x-ray lenses we have built a hard x-ray microscope that allows one to image the interior of opaque samples with submicrometer resolution. We have combined magnified imaging with tomography to obtain the three-dimensional structure of the sample at a resolution well below 1 μm. Using an aluminum lens to record a magnified tomogram of a test sample (microprocessor), a resolution of slightly above 400 nm was found for the three-dimensional reconstruction. Lenses made of beryllium are expected to improve this resolution to well below 100 nm. The resulting challenges concerning instrumentation and numerical methods are discussed.


Nuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment | 2001

Parabolic refractive X-ray lenses: a breakthrough in X-ray optics

B. Lengeler; Christian G. Schroer; Boris Benner; Til Florian Gunzler; Marion Kuhlmann; J. Tümmler; A. Simionovici; Michael Drakopoulos; A. Snigirev; I. Snigireva

Refractive X-ray lenses, considered for a long time as unfeasible, have been realized with a rotational parabolic profile at our institute: The main features of the new lenses are: they focus in two directions and are free of spherical aberration. By varying the number of individual lenses in the stack the focal length can be chosen in a typical range from 0.5 to 2 m for photon energies between about 6 and 60 keV. The aperture of the lens is about 1 mm matching the angular divergence of undulator beams at 3d generation synchrotron radiation sources. They cope without problems with the heat load from the white beam of an undulator. Finally, they are easy to align and to operate. Refractive X-ray lenses can be used with hard X-rays in the same way as glass lenses can be used for visible light, if it is taken into account that the numerical aperture is small (of the order 10 � 4 ). Being high-quality optical elements, the refractive X-ray lenses can be used for generating a focal spot in the mm range with a gain of a factor 1000 and more, or for imaging purposes as in a hard X-ray microscope. Recent examples from microanalysis, microtomography, fluorescence tomography, X-ray microscopy will be shown to demonstrate the state of the art. Possible new developments will be discussed. # 2001 Elsevier Science B.V. All rights reserved. PACS: 41.50; 07.85.T


International Symposium on Optical Science and Technology | 2002

Beryllium parabolic refractive x-ray lenses

Christian G. Schroer; Marion Kuhlmann; B. Lengeler; Til Florian Gunzler; Olga Kurapova; Boris Benner; Christoph Rau; Alexandre S. Simionovici; A. Snigirev; I. Snigireva

Recently, we have been able to fabricate high quality parabolic refractive x-ray lenses made of beryllium. We report first experimental results in both full field microscopy and microbeam production using these new lenses. In full field microscopy, undistorted images of test patterns were recorded in a field of view of 450 μm full width half maximum at 12keV with 10 fold magnification. A significant improvement of the lateral resolution as compared to imaging with aluminium refractive lenses was achieved. Microbeam characteristics were determined at 12keV demagnifying a high β undulator source 82 times. The lateral beam size was measured by fluorescence knife-edge. Microbeam characteristics, such as flux, lateral beam size, and low intensity background are discussed.


Review of Scientific Instruments | 2002

High resolution imaging and lithography with hard x rays using parabolic compound refractive lenses

C.G. Schroer; Boris Benner; Til Florian Gunzler; Marion Kuhlmann; Christiane Zimprich; B. Lengeler; C. Rau; T. Weitkamp; A. Snigirev; I. Snigireva; J. Appenzeller

Parabolic compound refractive lenses are high quality optical components for hard x rays. They are particularly suited for full field imaging, with applications in microscopy and x-ray lithography. Taking advantage of the large penetration depth of hard x rays, the interior of opaque samples can be imaged with submicrometer resolution. To obtain the three-dimensional structure of a sample, microscopy is combined with tomographic techniques. In a first hard x-ray lithography experiment, parabolic compound refractive lenses have been used to project the reduced image of a lithography mask onto a resist. Future developments are discussed.


Nuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment | 2001

Hard X-ray full field microscopy and magnifying microtomography using compound refractive lenses

Christian G. Schroer; Til Florian Gunzler; Boris Benner; Marion Kuhlmann; J. Tümmler; B. Lengeler; Christoph Rau; Timm Weitkamp; A. Snigirev; I. Snigireva

For hard X-rays, parabolic compound refractive lenses (PCRLs) are genuine imaging devices like glass lenses for visible light. Based on these new lenses, a hard X-ray full field microscope has been constructed that is ideally suited to image the interior of opaque samples with a minimum of sample preparation. As a result of a large depth of field, CRL micrographs are sharp projection images of most samples. To obtain 3D information about a sample, tomographic techniques are combined with magnified imaging. # 2001 Elsevier Science B.V. All rights reserved. PACS: 07.85.T; 41.50


International Symposium on Optical Science and Technology | 2002

In-line phase contrast in synchrotron-radiation microradiography and tomography

Timm Weitkamp; Christoph Rau; A. Snigirev; Boris Benner; Til Florian Guenzler; Marion Kuhlmann; Christian G. Schroer

When used in microimaging, hard x rays from third-generation synchrotron radiation (SR) sources inevitably generate noninterferometric or in-line phase contrast. It is formed by the propagation of a distorted x-ray wavefront after the sample. In this paper, we discuss phase contrast and its properties in two altogether different experimental modes. First, in edge-enhanced microtomography, we show by phase- propagation simulations that local tomography is possible without special effort. The second part of the paper discusses phase contrast and phase artifacts in magnified x- ray imaging and tomography using refractive lenses. Here, the phase effects degrade resolution to a considerable extent. This part of the paper contains experimental results from the ESRF beamline ID 22 in the photon energy range around 20 keV that are compared to simulated images and to experimental results from conventional high-resolution microtomography. The experimental results show that coherence-degrading devices can reduce but not completely eliminate phase effects, and recent microtomography data gathered with an x-ray microscope still cannot beat conventional state-of-the-art high-resolution microtomography with micrometer resolution.


International Symposium on Optical Science and Technology | 2002

High-resolution element mapping inside biological samples using fluorescence microtomography

Christian G. Schroer; Boris Benner; Til Florian Guenzler; Marion Kuhlmann; B. Lengeler; Walter H. Schroeder; Arnd J. Kuhn; Alexandre S. Simionovici; A. Snigirev; I. Snigireva

Sample preparation for element analysis of many biological tissues is difficult to achieve and prone to introduce contamination. Using x-ray fluorescence element microtomography (XFEMT) the element distribution on a virtual section across the sample can be determined with a resolution in the micrometer range. Fluorescence microtomograms of two plant samples are shown, demonstrating the possibility to map physiologically relevant ions, trace elements, and heavy metal pollutants at the cellular level. Attenuation effects inside the plant are corrected by a self-consistent tomographic reconstruction technique.


International Symposium on Optical Science and Technology | 2002

Magnified hard x-ray microtomography: toward tomography with submicron resolution

Christian G. Schroer; Boris Benner; Til Florian Guenzler; Marion Kuhlmann; B. Lengeler; Christoph Rau; Timm Weitkamp; A. Snigirev; I. Snigireva

Parabolic compound refractive lenses (PCRLs) are high quality imaging optics for hard x-rays that can be used as an objective lens in a new type of hard x-ray full field microscope. Using an aluminium PCRL, this new type of microscope has been shown to have a resolution of 350 nm. Further improvement of the resolution down to 50 nm can be expected using beryllium as a lens material. The large depth of field (several mm) of the microscope results in sharp projection images for samples that fit into the field of view of about 300 micrometers. This allows to combine magnified imaging with tomographic techniques. First results of magnified microtomography are shown. Contrast formation in the microscope and the consequences for tomographic reconstruction are discussed. An outlook on further developments is given.

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B. Lengeler

RWTH Aachen University

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A. Snigirev

Immanuel Kant Baltic Federal University

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I. Snigireva

European Synchrotron Radiation Facility

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Christian G. Schroer

Dresden University of Technology

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Christoph Rau

University of California

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Timm Weitkamp

European Synchrotron Radiation Facility

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