Brett C. Ong
Sun Microsystems
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Publication
Featured researches published by Brett C. Ong.
semiconductor thermal measurement and management symposium | 2006
Margaret Stern; Gawtam Jhoty; Donald Kearns; Brett C. Ong
For high performance cooling applications, a separable thermal interface material (TIM) is inserted between the CPU lid (electrical component) and heat sink surface to reduce the thermal resistance. Non-curing TIMs, including thermal greases, phase change materials (PCMs), putty-like gap fillers, pads, and dry films are potential classes of TIMs that are used in this application. Materials that have higher effective thermal conductivity, such as filled thermal greases and PCMs tend to have lower interfacial contact resistance. The TIMs also mechanically couple the two interfaces through a weak adhesive bond. Data on the adhesive bonding properties of these materials is needed to predict how the TIM interface will behave when the system is subject to tensile forces during manual separation or dynamic loading induced by shock impulses. A series of controlled tests have been designed and implemented to measure the tensile pull strength of the adhesive bond. The suggested methodology, based on ASTM standards for adhesives, presents one approach for characterizing the adhesive TIM interface that could be readily adapted by others in the industry. These measurements complement in-house thermal testing of these thermal interface materials
Archive | 2002
David K. Kim; William W. Ruckman; Brett C. Ong
Archive | 2003
Russell K. Brovald; Brett C. Ong; Donggyu Kim
Archive | 2007
Timothy W. Olesiewicz; Brett C. Ong; William A. De Meulenaere
Archive | 2007
Michael T. Milo; Mark H. Chen; Brett C. Ong; Daniel Hruska
Archive | 2008
Brett C. Ong; Timothy W. Olesiewicz; Kenneth D. Shaul
Archive | 2007
Brett C. Ong; William A. De Meulenaere
Archive | 2009
An-Sheng Anson Zheng; Brett C. Ong; Michael T. Milo
Archive | 2009
Brett C. Ong; Timothy W. Olesiewicz; Frank M. Miyahira
Archive | 2008
Brett C. Ong; Brian Benstead; Timothy W. Olesiewicz