Brian Cobb

Band transport and mobility edge in amorphous solution-processed zinc tin oxide thin-film transistors

We report on charge transport phenomena in high-mobility solution-deposited amorphous zinc-tin oxide based thin-film transistors. At low carrier concentrations, the dominant transport mechanism is multiple trap and release, with the activation energy steadily decreasing with increasing carrier density. The activation energy decreases to zero and beyond a threshold carrier density, the mobility decreases with increasing temperature. This temperature dependence as well as the value of the mobility clearly indicates that transport is bandlike. Also observed is a clear mobility edge in accordance with the prediction of Mott’s model, which are normally observed in crystalline semiconductors.

Highly stable carbon nanotube top-gate transistors with tunable threshold voltage

Carbon-nanotube top-gate transistors with fluorinated dielectrics are presented. With PTrFE as the dielectric, the devices have absent or small hysteresis at different sweep rates and excellent bias-stress stability under ambient conditions. Ambipolar single-walled carbon nanotube (SWNT) transistors are observed when P(VDF-TrFE-CTFE) is utilized as a topgate dielectric. Furthermore, continuous tuning of the threshold voltages of both unipolar and ambipolar SWNT thin-film transistors (TFTs) is demonstrated for the first time.

Charge transport and trapping in organic field effect transistors exposed to polar analytes

Pentacene based organic thin-film transistors were used to study the effects of polar analytes on charge transport and trapping behavior during vapor sensing. Three sets of devices with differing morphology and mobility (0.001−0.5 cm2/V s) were employed. All devices show enhanced trapping upon exposure to analyte molecules. The organic field effect transistors with different mobilities also provide evidence for morphology dependent partition coefficients. This study helps provide a physical basis for many reports on organic transistor based sensor response.

Spatial atmospheric atomic layer deposition of InxGayZnzO for thin film transistors.

We have investigated the nucleation and growth of InGaZnO thin films by spatial atmospheric atomic layer deposition. Diethyl zinc (DEZ), trimethyl indium (TMIn), triethyl gallium (TEGa), and water were used as Zn, In, Ga and oxygen precursors, respectively. The vaporized metal precursors have been coinjected in the reactor. The metal composition of InGaZnO has been controlled by varying the TMIn or TEGa flow to the reactor, for a given DEZ flow and exposure time. The morphology of the films changes from polycrystalline, for ZnO and In-doped ZnO, to amorphous for In-rich IZO and InGaZnO. The use of these films as the active channel in TFTs has been demonstrated and the influence of In and Ga cations on the electrical characteristics of the TFTs has been studied.

30.1 8b Thin-film microprocessor using a hybrid oxide-organic complementary technology with inkjet-printed P 2 ROM memory

We present an 8b general-purpose microprocessor realized in a hybrid oxide-organic complementary thin-film technology. The n-type transistors are based on a solution-processed n-type metal-oxide semiconductor, and the p-type transistors use an organic semiconductor. As compared to previous work utilizing unipolar logic gates [1], the higher mobility n-type semiconductor and the use of complementary logic allow for a >50x speed improvement. It also adds robustness to the design, which allowed for a more complex and complete standard cell library. The microprocessor consists of two parts, a processor core chip and an instruction generator. The instructions are stored in a Write-Once-Read-Many (WORM) memory formatted by a post-fabrication inkjet printing step, called Print-Programmable Read-Only Memory (P2ROM). The entire processing was performed at temperatures compatible with plastic foil substrates, i.e., at or below 250°C [2].

16.3 Flexible thin-film NFC tags powered by commercial USB reader device at 13.56MHz

Our goal is to create thin low-cost flexible NFC tags to allow everyday objects to communicate to smartphones and computers and thus participate in the Internet of Things. We employ amorphous Indium-Gallium-Zinc-Oxide (a-IGZO) thin-film transistor circuits processed at low temperatures, less than 250C, directly on thin polyester substrates. Reaching NFC standards with a-IGZO circuits is challenging because the technology is n-type only and the electron mobility (~15cm7Vs) is lower compared to silicon. As the main result, we show that the most important NFC regulatory standards are met, even with relaxed 5 micron design rules, using optimized design topologies.

Low-temperature formation of source–drain contacts in self-aligned amorphous oxide thin-film transistors

We demonstrated self-aligned amorphous-Indium-Gallium-Zinc-Oxide (a-IGZO) thin-film transistors (TFTs) where the source–drain (S/D) regions were made conductive via chemical reduction of the a-IGZO via metallic calcium (Ca). Due to the higher chemical reactivity of Ca, the process can be operated at lower temperatures. The Ca process has the additional benefit of the reaction byproduct calcium oxide being removable through a water rinse step, thus simplifying the device integration. The Ca-reduced a-IGZO showed a sheet resistance (RSHEET) value of 0.7 kΩ/sq., with molybdenum as the S/D metal. The corresponding a-IGZO TFTs exhibited good electrical properties, such as a field-effect mobility (μFE) of 12.0 cm2/(V s), a subthreshold slope (SS−1) of 0.4 V/decade, and an on/off current ratio (ION/OFF) above 108.

Flexible thin-film NFC tags

Thin-film transistor technologies have great potential to become the key technology for leaf-node Internet of Things by utilizing the NFC protocol as a communication medium. The main requirements are manufacturability on flexible substrates at a low cost while maintaining good device performance characteristics, necessary to be compatible with the NFC specifications. Such low-cost flexible NFC tags can be attached to any object with any form factor, connecting this object to the Internet using a smartphone or tablet as an intermediate node. Among all commercial thin-film transistor technologies, metal oxide transistors is a viable technology for this application. The metal-oxide transistors in this work are based on InGaZnO as semiconductor. Since these are unipolar by nature (i.e., they exhibit only n-type transistors), different options to make logic circuits are studied from static and dynamic points of view. The different topologies are diode-load logic, dual-gate diode-load logic, and pseudo-CMOS logic. The static parameters lead to a comparison of soft yield between those circuit topologies, while the transient analysis provides insight on the power consumption and circuit speed. This is indicative for selecting the logic style matching the data rate requirements of the NFC standards. Moreover, metal-oxide NFC circuits that combine 12-bit code generators to the analog front-end of RFID tags are integrated on a PCB board to evaluate performance of a matched and optimized system. The measured data rates of these integrated NFC tags are compatible with the ISO 15693 specifications. Finally, a fully integrated, flexible NFC tag is realized, which comprises the tuning capacitor, rectifier, load modulator, and code generator.

Drift mobility and the frequency response of diode connected organic transistors

A method to characterize the frequency response of an organic field effect transistor (FET) is presented. Analysis then shows a method to calculate the average drift mobility from the frequency at which a pole appears in the response. This pole is believed to appear at the point where charge carriers can no longer fully traverse the channel in one period of the input signal. The dc output characteristics of the device are also described, and saturation mobility values are derived. This saturation mobility and the drift mobility calculated from the frequency response are comparable. This method can be used in determining the drift mobility in other materials such as single nanowires in the FET configuration.

Organic CMOS Line Drivers on Foil

In this paper, the design of a low-voltage line driver in a complementary organic technology on foil is presented. The behavior and the variability of circuits are predicted by means of transistor modeling and statistical characterization. The comparison of measurements and simulations of simple digital blocks verifies the effectiveness of the design approach. A transmission-gate based 32-stage line driver and a fully-static one are shown. It is also shown that, based on the statistical organic thin-film transistor (OTFT) characterization, the fully-static logic style is a more suitable choice for implementing line drivers in this technology. The implemented fully-static line driver, which is comprised of 1216 transistors, has the highest transistor count reported for a complementary organic circuit to date. It works at supply voltages from 10 V to as low as 3.3 V, reaching a 1 kHz clock frequency, and occupying an area of 25 ×4.7 mm2. The drivers are implemented in a technology compatible with that of flat-panel display backplanes and are tested with a QQVGA AMOLED display.