Brian D. Cull
Honeywell
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Publication
Featured researches published by Brian D. Cull.
SID Symposium Digest of Technical Papers | 1999
Geoffrey K. Torrington; Brian D. Cull; Victoria P. Haim; John Wiggs
Honeywell has developed and implemented a comprehensive intraplant and interplant colorimeter certification method with traceability to NIST standards for inspection of avionics LCDs. To perform effective interplant correlation of optical measurements, special-purpose hardware was specified, designed, and built. Since the implementation of these procedures, increases in interplant correlation have helped to dramatically reduce the cycle time for LCD glass; and intraplant correlation has improved to the level where grouping in CIELuv space by colorimeters is no longer apparent.
Archive | 2004
Brian D. Cull; Allan E. Harris; Elias S. Haim; Brent D. Larson
Archive | 2004
Brian D. Cull; Dennis M. Davey; Eric D. Ronning
Archive | 1999
Alan S. Feldman; Brian D. Cull; Dennis M. Davey
Archive | 2007
Alan S. Feldman; Brian D. Cull; Dennis M. Davey
Archive | 1998
Brian D. Cull; Elias S. Haim
IEE Proceedings A Science, Measurement and Technology | 1993
Brian D. Cull; Danny Lee Heath; Allan E. Harris; Elias S. Haim
Archive | 2003
Brian D. Cull; Elias S. Haim; Allan E. Harris; John F. L. Schmidt
Archive | 2001
Brian D. Cull; Dennis M. Davey; Alan S. Feldman
Archive | 2001
Brian D. Cull; Elias S. Haim
