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Dive into the research topics where Brian J. Rodriguez is active.

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Featured researches published by Brian J. Rodriguez.


Nanotechnology | 2007

The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale

Stephen Jesse; Sergei V. Kalinin; Roger Proksch; Arthur P. Baddorf; Brian J. Rodriguez

Mapping energy transformation pathways and dissipation on the nanoscale and understanding the role of local structure in dissipative behavior is a key challenge for imaging in areas ranging from electronics and information technologies to efficient energy production. Here we develop a family of novel scanning probe microscopy (SPM) techniques in which the cantilever is excited and the response is recorded over a band of frequencies simultaneously, rather than at a single frequency as in conventional SPMs. This band excitation (BE) SPM allows very rapid acquisition of the full frequency response at each point (i.e. transfer function) in an image and in particular enables the direct measurement of energy dissipation through the determination of the Q-factor of the cantilever–sample system. The BE method is demonstrated for force–distance and voltage spectroscopies and for magnetic dissipation imaging with sensitivity close to the thermomechanical limit. The applicability of BE for various SPMs is analyzed, and the method is expected to be universally applicable to ambient and liquid SPMs.


Nanotechnology | 2007

Dual-frequency resonance-tracking atomic force microscopy

Brian J. Rodriguez; Clint Callahan; Sergei V. Kalinin; Roger Proksch

A dual-excitation method for resonant-frequency tracking in scanning probe microscopy based on amplitude detection is developed. This method allows the cantilever to be operated at or near resonance for techniques where standard phase locked loops are not possible. This includes techniques with non-acoustic driving where the phase of the driving force is frequency and/or position dependent. An example of the latter is piezoresponse force microscopy (PFM), where the resonant frequency of the cantilever is strongly dependent on the contact stiffness of the tip–surface junction and the local mechanical properties, but the spatial variability of the drive phase rules out the use of a phase locked loop. Combined with high-voltage switching and imaging, dual-frequency, resonance-tracking PFM allows reliable studies of electromechanical and elastic properties and polarization dynamics in a broad range of inorganic and biological systems, and is illustrated using lead zirconate–titanate, rat tail collagen, and native and switched ferroelectric domains in lithium niobate.


Reports on Progress in Physics | 2010

Local polarization dynamics in ferroelectric materials

Sergei V. Kalinin; Anna N. Morozovska; Long-Qing Chen; Brian J. Rodriguez

Ferroelectrics and multiferroics have recently emerged as perspective materials for information technology and data storage applications. The combination of extremely narrow domain wall width and the capability to manipulate polarization by electric field opens the pathway toward ultrahigh (>10 TBit inch−2) storage densities and small (sub-10 nm) feature sizes. The coupling between polarization and chemical and transport properties enables applications in ferroelectric lithography and electroresistive devices. The progress in these applications, as well as fundamental studies of polarization dynamics and the role of defects and disorder on domain nucleation and wall motion, requires the capability to probe these effects on the nanometer scale. In this review, we summarize the recent progress in applications of piezoresponse force microscopy (PFM) for imaging, manipulation and spectroscopy of ferroelectric switching processes. We briefly introduce the principles and relevant instrumental aspects of PFM, with special emphasis on resolution and information limits. The local imaging studies of domain dynamics, including local switching and relaxation accessed through imaging experiments and spectroscopic studies of polarization switching, are discussed in detail. Finally, we review the recent progress on understanding and exploiting photochemical processes on ferroelectric surfaces, the role of surface adsorbates, and imaging and switching in liquids. Beyond classical applications, probing local bias-induced transition dynamics by PFM opens the pathway to studies of the influence of a single defect on electrochemical and solid state processes, thus providing model systems for batteries, fuel cells and supercapacitor applications.


Nature Materials | 2008

Direct imaging of the spatial and energy distribution of nucleation centres in ferroelectric materials

Stephen Jesse; Brian J. Rodriguez; S. Choudhury; Arthur P. Baddorf; Dietrich Hesse; Marin Alexe; Eugene A. Eliseev; Anna N. Morozovska; J. X. Zhang; Long-Qing Chen; Sergei V. Kalinin

Macroscopic ferroelectric polarization switching, similar to other first-order phase transitions, is controlled by nucleation centres. Despite 50 years of extensive theoretical and experimental effort, the microstructural origins of the Landauer paradox, that is, the experimentally observed low values of coercive fields in ferroelectrics corresponding to implausibly large nucleation activation energies, are still a mystery. Here, we develop an approach to visualize the nucleation centres controlling polarization switching processes with nanometre resolution, determine their spatial and energy distribution and correlate them to local microstructure. The random-bond and random-field components of the disorder potential are extracted from positive and negative nucleation biases. Observation of enhanced nucleation activity at the 90 composite function domain wall boundaries and intersections combined with phase-field modelling identifies them as a class of nucleation centres that control switching in structural-defect-free materials.


Applied Physics Letters | 2005

Direct studies of domain switching dynamics in thin film ferroelectric capacitors

Alexei Gruverman; Brian J. Rodriguez; C. Dehoff; J. D. Waldrep; Angus I. Kingon; R. J. Nemanich; Jeffrey S. Cross

An experimental approach for direct studies of the polarization reversal mechanism in thin film ferroelectric capacitors based on piezoresponse force microscopy (PFM) in conjunction with pulse switching capabilities is presented. Instant domain configurations developing in a 3×3μm2 capacitor at different stages of the polarization reversal process have been registered using step-by-step switching and subsequent PFM imaging. The developed approach allows direct comparison of experimentally measured microscopic switching behavior with parameters used by phenomenological switching models. It has been found that in the low field regime (just above the threshold value) used in the present study, the mechanism of polarization reversal changes during the switching cycle from the initial nucleation-dominated process to the lateral domain expansion at the later stages. The classical nucleation model of Kolmogorov–Avrami–Ishibashi (KAI) provides reasonable approximation for the nucleation-dominated stage of switchi...


Applied Physics Letters | 2003

Mechanical stress effect on imprint behavior of integrated ferroelectric capacitors

Alexei Gruverman; Brian J. Rodriguez; Angus I. Kingon; R. J. Nemanich; A. K. Tagantsev; Jeffrey S. Cross; Mineharu Tsukada

Stress-induced changes in the imprint and switching behavior of (111)-oriented Pb(Zr,Ti)O3 (PZT)-based capacitors have been studied using piezoresponse force microscopy. Visualization of polarization distribution and d33-loop measurements in individual 1×1.5-μm2 capacitors before and after stress application, generated by substrate bending, provided direct experimental evidence of stress-induced switching. Mechanical stress caused elastic switching in capacitors with the direction of the resulting polarization determined by the sign of the applied stress. In addition, stress application turned capacitors into a heavily imprinted state characterized by strongly shifted hysteresis loops and almost complete backswitching after application of the poling voltage. It is suggested that substrate bending generated a strain gradient in the PZT layer, which produced asymmetric lattice distortion with preferential polarization direction and triggered polarization switching due to the flexoelectric effect.


Applied Physics Letters | 2005

Domain growth kinetics in lithium niobate single crystals studied by piezoresponse force microscopy

Brian J. Rodriguez; R. J. Nemanich; Angus I. Kingon; Alexei Gruverman; Sergei V. Kalinin; Kazuya Terabe; Xiangming Liu; Kenji Kitamura

The kinetics of sidewise domain growth in an inhomogeneous electric field has been investigated in stoichiometric LiNbO3 single crystals by measuring the lateral domain size as a function of the voltage pulse magnitude and duration using piezoresponse force microscopy. The domain size increases linearly with the voltage magnitude suggesting that the domain size is kinetically limited in a wide range of pulse magnitudes and durations. In spite of that, the written domains exhibit strong retention behavior. It is suggested that the switching behavior can be described by the universal scaling curve. Domain kinetics can be described as an activation process by calculating the field distribution using the charged sphere model under the assumption of an exponential field dependence of the wall velocity. The activation energy is found to be a function of the external field.


Microscopy and Microanalysis | 2006

Vector Piezoresponse Force Microscopy

Sergei V. Kalinin; Brian J. Rodriguez; Stephen Jesse; Junsoo Shin; Arthur P. Baddorf; Pradyumna Gupta; H. Jain; David B. Williams; Alexei Gruverman

A novel approach for nanoscale imaging and characterization of the orientation dependence of electromechanical properties-vector piezoresponse force microscopy (Vector PFM)-is described. The relationship between local electromechanical response, polarization, piezoelectric constants, and crystallographic orientation is analyzed in detail. The image formation mechanism in vector PFM is discussed. Conditions for complete three-dimensional (3D) reconstruction of the electromechanical response vector and evaluation of the piezoelectric constants from PFM data are set forth. The developed approach can be applied to crystallographic orientation imaging in piezoelectric materials with a spatial resolution below 10 nm. Several approaches for data representation in 2D-PFM and 3D-PFM are presented. The potential of vector PFM for molecular orientation imaging in macroscopically disordered piezoelectric polymers and biological systems is discussed.


Nano Letters | 2009

Vortex Polarization States in Nanoscale Ferroelectric Arrays

Brian J. Rodriguez; Xuefei Gao; Lifeng Liu; W. Lee; I.I. Naumov; A.M. Bratkovsky; Dietrich Hesse; Marin Alexe

Two-dimensional arrays of ferroelectric lead zirconate titanate (PZT) nanodots were fabricated using pulsed laser deposition through ultrathin anodic aluminum oxide membrane stencil masks. The static distribution of polarization configurations was investigated using in- and out-of-plane piezoresponse force microscopy (PFM). The observed presence of an in-plane polarization component in nominally (001) oriented PZT suggests the existence of a significant deviation from the regular tetragonal structure that allows the formation of complex core-polarization states. Core-polarization states may indicate the presence of quasi-toroidal polarization ordering. The experimental results are compared with a theoretical model to determine the fingerprint of a vortex polarization state in PFM.


Nanotechnology | 2006

Fabrication of metallic nanowires on a ferroelectric template via photochemical reaction

J N Hanson; Brian J. Rodriguez; R. J. Nemanich; Alexei Gruverman

Fabrication of silver nanowires on a domain-patterned lithium niobate template by inducing a photochemical reaction in an aqueous solution is reported. Silver deposition occurs preferentially along the domain boundaries which separate antiparallel domains. The nanowires can reach lengths of hundreds of micrometres, and their location can be controlled by generating domain patterns of a desired configuration while their width depends on deposition conditions, such as temperature, solution concentration and ultraviolet (UV) light exposure time. The selective deposition process is explained by a combination of the inhomogeneous distribution of the electric field in the vicinity of the domain wall and the polarization screening mechanism of the template material. Controllable and selective deposition of metal species onto nanoscale domain-patterned ferroelectric templates may provide an alternative bottom-up route to lithographic fabrication methods.

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Sergei V. Kalinin

Oak Ridge National Laboratory

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Stephen Jesse

Oak Ridge National Laboratory

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Alexei Gruverman

University of Nebraska–Lincoln

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Katia Gallo

Royal Institute of Technology

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Arthur P. Baddorf

Oak Ridge National Laboratory

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R. J. Nemanich

Arizona State University

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Michele Manzo

Royal Institute of Technology

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Liam Collins

Oak Ridge National Laboratory

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James H. Rice

University College Dublin

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Anna N. Morozovska

National Academy of Sciences of Ukraine

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