Brian P. Flannery
ExxonMobil
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Featured researches published by Brian P. Flannery.
Mathematics of Computation | 1993
William H. Press; Saul A. Teukolsky; William T. Vetterling; Brian P. Flannery
Keywords: informatique ; numerical recipes Note: contient un CDRom Reference Record created on 2004-09-07, modified on 2016-08-08
Science | 1987
Brian P. Flannery; Harry W. Deckman; Wayne G. Roberge; Kevin L. D'amico
The new technique of x-ray microtomography nondestructively generates three-dimensional maps of the x-ray attenuation coefficient inside small samples with approximately 1 percent accuracy and with resolution approaching 1 micrometer. Spatially resolved elemental maps can be produced with synchrotron x-ray sources by scanning samples at energies just above and below characteristic atomic absorption edges. The system consists of a high-resolution imaging x-ray detector and high-speed algorithms for tomographic image reconstruction. The design and operation of the microtomography device are described, and tomographic images that illustrate its performance with both synchrotron and laboratory x-ray sources are presented.
Journal of Applied Physics | 1987
Brian P. Flannery; Wayne Giles Roberge
We describe essential features of a data set of projection measurements suitable for tomographic imaging with given accuracy and resolution, and apply the results to analyze the use of synchrotron radiation to perform three‐dimensional microtomography. Previously, Grodzins [Nucl. Instrum. Methods 206, 541 (1983)] showed that the number of photons needed to generate an image could be minimized by adjusting the observational energy such that the target’s optical depth FD=2. We correct and extend his results to consider also the spectral distribution of the source. Observational time is minimized at a (typically) lower observational energy where the source flux is larger, even though FD≥2. The results demonstrate that, in principle, synchrotron sources provide sufficient brightness to image small samples with ≂1‐μm resolution.
Review of Scientific Instruments | 1989
K. L. D’Amico; Harry W. Deckman; J. H. Dunsmuir; Brian P. Flannery; Wayne Giles Roberge
We review results obtained with the Exxon Microtomography apparatus. The technique is based on tomographic methods widely used in medicine and nondestructive evaluation. When used with a tunable x‐ray source, it is a powerful diagnostic and research tool for a wide variety of materials problems. It is capable of producing maps of the interior structure and chemical composition of samples approximately 0.5–1.0 mm in size, with spatial resolution in the map of the density variations approaching 10.0 μm.
Review of Scientific Instruments | 1992
K. L. D’Amico; J. H. Dunsmuir; S. R. Ferguson; Brian P. Flannery; Harry W. Deckman
Instrumentation for beam line X2 at the National Synchrotron Light Source is described. The beam line is configured as a dedicated experimental station whose design has been optimized for carrying out both microtomography and microradiography. The facility has proven to be a reliable three‐dimensional microscope for imaging the interior structure of heterogeneous materials.
The Economic Journal | 1994
Chris Birchenhall; William H. Press; Saul A. Teukolsky; William T. Vetterling; Brian P. Flannery
IS B N 0-523108-5) C opright (C ) 19-1992 by C am bidge U nirsity P rss. P rogram s C opright (C ) 19-1992 by N um eical R eipes S ftw are. P rm ission is grnted or inrnet uers to m ke ne pper cpy or teir ow n peonal use. F uther repruction, or ny coying of m acineredable fles (inluding his one) to ny srver om pter, is sictly proibited. T o oder N um eical R eipes boks, disettes, or C D R O M s visit w esite hp://w w w .n.com or call 1-8072-7423 (N orth A m erica oly), or snd em il to trde@ cu.cam .ac.uk (otside N orth A m eca). Numerical Recipes in C
Archive | 1988
William H. Press; Brian P. Flannery; Saul A. Teukolsky; William T. Vetterling
Archive | 1988
William H. Press; Brian P. Flannery; Saul A. Teukolsky; William T. Vetterling
Archive | 1989
William T. Vetterling; Saul A. Teukolsky; William H. Press; Brian P. Flannery
Archive | 1992
William H. Press; Saul A. Teukolsky; William T. Vetterling; Brian P. Flannery