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Proceedings of SPIE | 2008

Micro Fabry-Perot sensor for surface measurement

Andrei Brunfeld; Morey T. Roscrow; Bryan Clark

A high accuracy surface inspection system for testing polished surfaces is based on a Fabry-Perot resonator. The inspected surface serves as a relay mirror in a cat-eye retroreflector incorporated into the resonating cavity, which makes the optical configuration insensitive to surface tilts. The laser wavelength is swept periodically over a given range, and the local surface height is obtained by timing the resonance occurrence during each sweep. An additional highly stable reference Fabry-Perot interferometer using the same laser is employed for obtaining differential measurements, yielding absolute height values, distinguishing between up and down defects. Due to the finesse of the multi-beam Fabry Perot interferometer relative to the two-beam Michelson interferometer response function, the height sensitivity is greatly enhanced. In order to detect small contamination particles, the interferometer was supplemented by a scattering detection channel integrated into the same compact optical head. The combination of the bright-field interferometric signal, yielding both the phase (surface height) and amplitude (surface reflectivity), and the dark-field scattering channel, allows one to build a sensitive and reliable defect detection and classification procedure. The interferometer was incorporated into high-speed high-accuracy in-line machines for inspection of the surfaces in data storage applications. With a 0.2 Angstroms resolution, the height rms repeatability at a surface scanning speed of 40 m/s is 1.5 Angstroms.


Archive | 2004

Method and system for performing swept-wavelength measurements within an optical system incorporating a reference resonator

Bryan Clark; Andrei Brunfeld


Archive | 2005

Resonator method and system for distinguishing characteristics of surface features or contaminants

Andrei Brunfeld; Bryan Clark


Archive | 2005

Resonant ellipsometer and method for determining ellipsometric parameters of a surface

Andrei Brunfeld; Bryan Clark


Archive | 2003

Method and system for determining surface feature characteristics using slit detectors

Bryan Clark; Andrei Brunfeld


Archive | 2007

SCATTEROMETER-INTERFEROMETER AND METHOD FOR DETECTING AND DISTINGUISHING CHARACTERISTICS OF SURFACE ARTIFACTS

Bryan Clark; Andrei Brunfeld


Archive | 2004

Method and system for optical measurement via a resonator having a non-uniform phase profile

Andrei Brunfeld; Bryan Clark


Archive | 2003

Method and apparatus including in-resonator imaging lens for improving resolution of a resonator-enhanced optical system

Bryan Clark; Andrei Brunfeld


Archive | 2010

Optical inspection system with polarization isolation of detection system reflections

Andrei Brunfeld; Bryan Clark


Archive | 2010

OPTICAL MEASURING SYSTEM WITH ILLUMINATION PROVIDED THROUGH A VOID IN A COLLECTING LENS

Andrei Brunfeld; Bryan Clark; Morey T. Roscrow

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Andrei Brunfeld

Technion – Israel Institute of Technology

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