Burkhard Kaulich

Photoelectron microscopy and applications in surface and materials science

We review the recent achievements of photoelectron microscopy (PEM), which is a rapidly developing technique that is significantly advancing the frontiers of surface and materials science. The operation principles of scanning photoelectron microscopes (SPEM), using different photon optic systems to obtain a micro-probe of sub-micrometer dimensions, and of the full-field imaging microscope, using electrostatic lenses for magnification of the irradiated sample area, are presented. The contrast mechanisms, based on photon absorption and photon-induced electron emission, are described and the expected development in the photon and electron optics and detection systems are discussed. Particular attention is paid to the present state-of-art performance of the microscopes collecting photoelectrons (PEs), which carry specific information about the lateral variations in the chemical, magnetic and electronic properties of the material under investigation. Selected results, obtained recently with instruments installed at synchrotron light facilities, are used to illustrate the potential of PEM in characterising micro-phases and dynamic processes with a lateral resolution better than 100 nm.

Transmission and emission x-ray microscopy: operation modes, contrast mechanisms and applications

Advances in microscopy techniques based on x-rays have opened unprecedented opportunities in terms of spatial resolution, combined with chemical and morphology sensitivity, to analyze solid, soft and liquid matter. The advent of ultrabright third and fourth generation photon sources and the continuous development of x-ray optics and detectors has pushed the limits of imaging and spectroscopic analysis to structures as small as a few tens of nanometers. Specific interactions of x-rays with matter provide elemental and chemical sensitivity that have made x-ray spectromicroscopy techniques a very attractive tool, complementary to other microscopies, for characterization in all actual research fields. The x-ray penetration power meets the demand to examine samples too thick for electron microscopes implementing 3D imaging and recently also 4D imaging which adds time resolution as well. Implementation of a variety of phase contrast techniques enhances the structural sensitivity, especially for the hard x-ray regime. Implementation of lensless or diffraction imaging helps to enhance the lateral resolution of x-ray imaging to the wavelength dependent diffraction limit.

Soft X-ray spectromicroscopy using ptychography with randomly phased illumination

Ptychography is a form of scanning diffractive imaging that can successfully retrieve the modulus and phase of both the sample transmission function and the illuminating probe. An experimental difficulty commonly encountered in diffractive imaging is the large dynamic range of the diffraction data. Here we report a novel ptychographic experiment using a randomly phased X-ray probe to considerably reduce the dynamic range of the recorded diffraction patterns. Images can be reconstructed reliably and robustly from this setup, even when scatter from the specimen is weak. A series of ptychographic reconstructions at X-ray energies around the L absorption edge of iron demonstrates the advantages of this method for soft X-ray spectromicroscopy, which can readily provide chemical sensitivity without the need for optical refocusing. In particular, the phase signal is in perfect registration with the modulus signal and provides complementary information that can be more sensitive to changes in the local chemical environment.

The Scanning X-Ray Microprobe At The Esrf "X-Ray Microscopy" Beamline

The development of high brilliance X-ray sources coupled with advances in manufacturing technologies of focusing optics has led to significant improvements in submicrometer probes for spectroscopy, diffraction and imaging applications. For instance, X-ray microscopy in the 1–10 keV energy range is better-suited for analyzing trace elements in fluorescence yield. This article will be biased towards submicron fluorescence microscopy developed on the ID21 beamline at the ESRF. The main technical developments, involving new focusing lenses or novel phase contrast method, are presented. Strengths and weaknesses of X-ray microscopy and spectromicroscopy techniques are discussed and illustrated by examples in biology, materials science and geology.

Differential interference contrast x-ray microscopy with submicron resolution

Progress in lithography and nanofabrication [E. Di Fabrizio et al., Nature (London) 401, 895 (1999)] has made it possible to apply differential interference contrast (DIC) in x-ray microscopy using an original x-ray doublet lens based on two specially developed zone plates. Switching from bright-field imaging (absorption contrast) to x-ray DIC, we observe, similar to visible-light microscopy, a dramatic increase in image contrast for weak absorbing samples. We anticipate that this technique will have a significant impact on x-ray imaging and may play a role comparable to DIC imaging in visible-light microscopy.

Scanning transmission x-ray microscopy with a configurable detector

A configurable charge-coupled-device (CCD) detector is used in a scanning transmission x-ray microscope to record the transmitted intensity distribution for every pixel in a raster scan of the sample. Real-time processing of the CCD frames gives simultaneous absorption and phase contrast image signals from a single scan. The CCD combines fast frame-transfer readout with very high sensitivity and makes use of x-ray to visible-light coupling to allow operation over a wide range of photon energies, from the oxygen K edge upwards. Tests on the Twinmic end station at the Elettra synchrotron are reported.

New insights into globoids of protein storage vacuoles in wheat aleurone using synchrotron soft X-ray microscopy

Mature developed seeds are physiologically and biochemically committed to store nutrients, principally as starch, protein, oils, and minerals. The composition and distribution of elements inside the aleurone cell layer reflect their biogenesis, structural characteristics, and physiological functions. It is therefore of primary importance to understand the mechanisms underlying metal ion accumulation, distribution, storage, and bioavailability in aleurone subcellular organelles for seed fortification purposes. Synchrotron radiation soft X-ray full-field imaging mode (FFIM) and low-energy X-ray fluorescence (LEXRF) spectromicroscopy were applied to characterize major structural features and the subcellular distribution of physiologically important elements (Zn, Fe, Na, Mg, Al, Si, and P). These direct imaging methods reveal the accumulation patterns between the apoplast and symplast, and highlight the importance of globoids with phytic acid mineral salts and walls as preferential storage structures. C, N, and O chemical topographies are directly linked to the structural backbone of plant substructures. Zn, Fe, Na, Mg, Al, and P were linked to globoid structures within protein storage vacuoles with variable levels of co-localization. Si distribution was atypical, being contained in the aleurone apoplast and symplast, supporting a physiological role for Si in addition to its structural function. These results reveal that the immobilization of metals within the observed endomembrane structures presents a structural and functional barrier and affects bioavailability. The combination of high spatial and chemical X-ray microscopy techniques highlights how in situ analysis can yield new insights into the complexity of the wheat aleurone layer, whose precise biochemical composition, morphology, and structural characteristics are still not unequivocally resolved.

Low-energy X-ray fluorescence microscopy opening new opportunities for bio-related research

Biological systems are unique matter with very complex morphology and highly heterogeneous chemical composition dominated by light elements. Discriminating qualitatively at the sub-micrometer level the lateral distribution of constituent elements, and correlating it to the sub-cellular biological structure, continues to be a challenge. The low-energy X-ray fluorescence microspectroscopy, recently implemented in TwinMic scanning transmission mode, has opened up new opportunities for mapping the distribution of the light elements, complemented by morphology information provided by simultaneous acquisition of absorption and phase contrast images. The important new information that can be obtained in bio-related research domains is demonstrated by two pilot experiments with specimens of interest for marine biology and food science. They demonstrate the potential to yield important insights into the structural and compositional enrichment, distribution and correlation of essential trace elements in the lorica of Tintinnopsis radix, and the lateral distribution of trace nutrients in the seeds of wheat Triticum aestivum.

Differential interference contrast x-ray microscopy with twin zone plates

X-ray imaging in differential interference contrast (DIC) with submicrometer optical resolution was performed by using a twin zone plate (TZP) setup generating focal spots closely spaced within the TZP spatial resolution of 160 nm. Optical path differences introduced by the sample are recorded by a CCD camera in a standard full-field imaging and by an aperture photodiode in a standard scanning transmission x-ray microscope. Applying this x-ray DIC technique, we demonstrate for both the full-field imaging and scanning x-ray microscope methods a drastic increase in image contrast (approximately 20×) for a low-absorbing specimen, similar to the Nomarski DIC method for visible-light microscopy.

Diffractive optical elements for differential interference contrast x-ray microscopy

In this paper we introduce phase diffractive optical elements (DOEs) that beside simple focusing, can perform new optical functions in the range of x-rays. In particular, the intensity of the wavefront can be distributed with almost complete freedom. We calculated and fabricated high resolution DOEs that can focus a monochromatic x-ray beam into multiple spots displaced in a single or two planes along the optical axis or can shape the beam into a desired continuous geometrical pattern. The possibility to introduce a specified phase shift between the generated spots, which can increase the image contrast, is demonstrated by preliminary results obtained from computer simulations and experiments performed in visible light. The functionality of the DOEs has been tested successfully in full-field differential interference contrast (DIC) x-ray microscopy at the ID21 beamline of the European Synchrotron Radiation Facility (ESRF) operated at 4 keV photon energy.