C. J. Panchal

Structure and Substructure Properties of Magnesium Oxide Thin Films

In this paper we have conducted a comprehensive study of the structural and substructural characteristics of magnesium oxide films by X-ray diffraction analysis. Thin films of MgO were prepared by spray pyrolysis technique from a magnesium chloride solution. Identified the phase composition, the lattice constant, crystallite size and coherent scattering domain size, microstrain level of the films. The optimal conditions for the application of homogeneous single-phase films of stoichiometric composition were identified.

The influence of the CIGS film thickness on its growth and optical properties

CuIn1.xGaxSe2: x = 0.3 (CIGS) bulk compound in the form of powder is prepared using melt-quenching method. Thin films, of CIGS powder, were grown on organically cleaned soda lime glass substrate for different thicknesses ranging from 0.4 μm to 1 μm using the flash evaporation method. The substrate temperature is kept constant at 250°C. The analysis of surface morphology, chemical composition and the optical properties of CIGS thin films reveal that the films of thickness (∼ 1 μm) are more conducive as an absorber layer in thin film solar cell.