Camden R. Hubbard

RIR - Measurement and Use in Quantitative XRD

The Reference Intensity Ratio (RIR) is a general, instrument-independent constant for use in quantitative phase analysis by the X-ray powder diffraction internal standard method. When the reference standard is corundum, RIR is known as I/Ic; These constants are collected in the Powder Diffraction File (1987), can be calculated, and can be measured. Recommended methods for accurate measurement of RIR constants are presented, and methods of using these constants for quantitative analysis are discussed. The numerous, complex constants in Copeland and Braggs method introduced to account for superimposed lines can be simply expressed in terms of RIR constants and relative intensities. This formalism also permits introduction of constraints and supplemental equations based on elemental analysis.

Methods of Producing Standard X-Ray Diffraction Powder Patterns

Patterns useful for identification are obtained by automated diffractometer methods. The lattice constants from the experimental work are refined by least-squares methods; reflections are assigned hkl indices consistent with space group extinctions. Relative intensities, calculated densities, literature references, and other relevant data are included.

JCPDS-ICDD Research Associateship (cooperative program with NBS/NIST)

The Research Associateship program of the Joint Committee on Powder Diffraction-International Centre for Diffraction Data (JCPDS-ICDD, now known as the ICDD) at NBS/NIST was a long standing (over 35 years) successful industry-government cooperation. The main mission of the Associateship was to publish high quality x-ray reference patterns to be included in the Powder Diffraction File (PDF). The PDF is a continuing compilation of patterns gathered from many sources, compiled and published by the ICDD. As a result of this collaboration, more than 1500 high quality powder diffraction patterns, which have had a significant impact on the scientific community, were reported. In addition, various research collaborations with NBS/NIST also led to the development of several standard reference materials (SRMs) for instrument calibration and quantitative analyses, and computer software for data collection, calibration, reduction, for the editorial process of powder pattern publication, analysis of powder data, and for quantitative analyses. This article summarizes information concerning the JCPDS-ICDD organization, the Powder Diffraction File (PDF), history and accomplishments of the JCPDS-ICDD Research Associateship.

Standard Reference Materials For X-Ray Diffraction Part II. Calibration Using d-Spacing Standards

External standard and internal standard calibrations are important procedures for achieving high accuracy in X-ray powder diffraction studies. The theoretical basis as well as procedures for obtaining calibration curves are given. Methods and examples of selecting Standard Reference Materials (SRMs) which are produced and issued by the National Bureau of Standards (NBS), and procedures of sample preparation with these standards are also described. Three examples are presented to indicate the value of using SRMs.

Platinum thiotungsten compounds. Crystal and molecular structure of bis(triethylphosphine)platinum tetrathiotungsten

Abstract Reaction of (Ph3P)2PtCl2 with Ph3P and (Ph3PCH3)2WO2S2 produced (Ph3P)2PtWS4 and (Ph3P)2PtWOS3. [(C2H5)3P]2PtWS4 was similarly synthesized from [(C2H5)3P]2PtCl2 and its structure determined by X-ray diffraction (R = 0.026). Crystal data: P21/n, a = 9.081, b = 14.516, c = 16.819 A, β = 82.33°, Z = 4. The molecule consist of an approximately tetrahedral WS4 unit bridged on one edged by [(C2H5)3P]2Pt.

Establishing an Instrumental Peak Profile Calibration Standard for Powder Diffraction Analyses: International Round Robin Conducted by the JCPDS-ICDD and the U.S. National Bureau of Standards

With the explosive growth in the number of highly automated powder diffraction systems, many types of analyses which were previously considered a specialty analysis are now performed on a routine basis. Algorithms have been developed for measuring peak profiles from which crystallite sizes, residual microstrain, and X-ray crystal structure (Rietveld techniques for example) can be determined. However, these techniques require an instrumental peak profile calibration standard to correct the experimental data for instrumental broadening due to the system optics. Significant problems are encountered when laboratories try to cross-correlate or reproduce published data due to the lack of a common reference material for instrumental calibration. This is particularly distressing in microstrain and crystallite size calculations which can be dramatically affected by a poor choice of standard materials. Microstrain and crystallite size measurement are becoming increasingly important for the characterization of advanced materials and catalysts.

Standard Reference Material (SRM 1990) for Single Crystal Diffractometer Alignment

An international project was successfully completed which involved two major undertakings: (1) a round-robin to demonstrate the viability of the selected standard and (2) the certification of the lattice parameters of the SRM 1990, a Standard Reference Material® for single crystal diffractometer alignment. This SRM is a set of ≈3500 units of Cr-doped Al2O3, or ruby spheres [(0.420.011 mole fraction % Cr (expanded uncertainty)]. The round-robin consisted of determination of lattice parameters of a pair of crystals: the ruby sphere as a standard, and a zeolite reference to serve as an unknown. Fifty pairs of crystals were dispatched from Hauptman-Woodward Medical Research Institute to volunteers in x-ray laboratories world-wide. A total of 45 sets of data was received from 32 laboratories. The mean unit cell parameters of the ruby spheres was found to be a=4.7608 ű0.0062 Å, and c=12.9979 ű0.020 Å (95 % intervals of the laboratory means). The source of errors of outlier data was identified. The SRM project involved the certification of lattice parameters using four well-aligned single crystal diffractometers at (Bell Laboratories) Lucent Technologies and at NRC of Canada (39 ruby spheres), the quantification of the Cr content using a combined microprobe and SEM/EDS technique, and the evaluation of the mosaicity of the ruby spheres using a double-crystal spectrometry method. A confirmation of the lattice parameters was also conducted using a Guinier-Hägg camera. Systematic corrections of thermal expansion and refraction corrections were applied. These rubies– are rhombohedral, with space group R3¯c. The certified mean unit cell parameters are a=4.76080±0.00029 Å, and c=12.99568 ű0.00087 Å (expanded uncertainty). These certified lattice parameters fall well within the results of those obtained from the international round-robin study. The Guinier-Hägg transmission measurements on five samples of powdered rubies (a=4.7610 ű0.0013 Å, and c = 12.9954 ű0.0034 Å) agreed well with the values obtained from the single crystal spheres.

Computerization of the ICDD Powder Diffraction Database Critical Review of Sets 1 to 32

The Powder Diffraction File of crystallographic data has been converted from printed data cards to a computer database. Extensive testing, review, and editing of the database were completed, the history and first stages of which are presented. Computer programs used to create and analyze the database are described.