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Dive into the research topics where Camilla La Torre is active.

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Featured researches published by Camilla La Torre.


Advanced Materials | 2017

Anomalous Resistance Hysteresis in Oxide ReRAM: Oxygen Evolution and Reincorporation Revealed by In Situ TEM

David Neil Cooper; Christoph Baeumer; Nicolas Bernier; Astrid Marchewka; Camilla La Torre; Rafal E. Dunin-Borkowski; Stephan Menzel; Rainer Waser; Regina Dittmann

The control and rational design of redox-based memristive devices, which are highly attractive candidates for next-generation nonvolatile memory and logic applications, is complicated by competing and poorly understood switching mechanisms, which can result in two coexisting resistance hystereses that have opposite voltage polarity. These competing processes can be defined as regular and anomalous resistive switching. Despite significant characterization efforts, the complex nanoscale redox processes that drive anomalous resistive switching and their implications for current transport remain poorly understood. Here, lateral and vertical mapping of O vacancy concentrations is used during the operation of such devices in situ in an aberration corrected transmission electron microscope to explain the anomalous switching mechanism. It is found that an increase (decrease) in the overall O vacancy concentration within the device after positive (negative) biasing of the Schottky-type electrode is associated with the electrocatalytic release and reincorporation of oxygen at the electrode/oxide interface and is responsible for the resistance change. This fundamental insight presents a novel perspective on resistive switching processes and opens up new technological opportunities for the implementation of memristive devices, as anomalous switching can now be suppressed selectively or used deliberately to achieve the desirable so-called deep Reset.


Advanced Materials | 2018

Oxygen Exchange Processes between Oxide Memristive Devices and Water Molecules

Thomas Heisig; Christoph Baeumer; Ute N. Gries; Michael Mueller; Camilla La Torre; Michael Luebben; Nicolas Raab; Hongchu Du; Stephan Menzel; David N. Mueller; Chun-Lin Jia; Joachim Mayer; Rainer Waser; Ilia Valov; Roger A. De Souza; Regina Dittmann

Resistive switching based on transition metal oxide memristive devices is suspected to be caused by the electric-field-driven motion and internal redistribution of oxygen vacancies. Deriving the detailed mechanistic picture of the switching process is complicated, however, by the frequently observed influence of the surrounding atmosphere. Specifically, the presence or absence of water vapor in the atmosphere has a strong impact on the switching properties, but the redox reactions between water and the active layer have yet to be clarified. To investigate the role of oxygen and water species during resistive switching in greater detail, isotope labeling experiments in a N2 /H218 O tracer gas atmosphere combined with time-of-flight secondary-ion mass spectrometry are used. It is explicitly demonstrated that during the RESET operation in resistive switching SrTiO3 -based memristive devices, oxygen is incorporated directly from water molecules or oxygen molecules into the active layer. In humid atmospheres, the reaction pathway via water molecules predominates. These findings clearly resolve the role of humidity as both oxidizing agent and source of protonic defects during the RESET operation.


international memory workshop | 2016

Internal Cell Resistance as the Origin of Abrupt Reset Behavior in HfO2-Based Devices Determined from Current Compliance Series

Alexander Hardtdegen; Camilla La Torre; Hehe Zhang; Carsten Funck; Stephan Menzel; Rainer Waser; Susanne Hoffmann-Eifert

The resistive switching behavior in different HfO2/TiO2 nano crossbar structures of 100 x 100 nm2 size is analyzed by means of DC voltage sweeps. The devices fabricated from 3 nm thin ALD layers of HfO2 and TiO2 sandwiched between Pt and Hf or Ti electrodes show VCM-type bipolar resistive switching after electroforming. For increased compliance current (cc) during set from 50 μA to 800 μA, the set current runs into self- limitation while the reset behavior changes from gradual to abrupt. A model is defined with an internal resistance being in series with the local resistive switch. A recursive algorithm is applied to the cc series for calculation of the series resistor and evaluation of the intrinsic switching characteristic of HfO2-based cells. The intrinsic LRS turns out to be current compliance controlled and to follow the universal switching rule. Supported by compact modelling, we show that an abrupt reset behavior might arise even for materials with a gradual intrinsic reset characteristic in consequence of an internal series resistor.


Small | 2015

Resistive Switching: Resistive Switching of Individual, Chemically Synthesized TiO2 Nanoparticles (Small 48/2015)

Dirk Oliver Schmidt; Susanne Hoffmann-Eifert; Hehe Zhang; Camilla La Torre; Astrid Besmehn; Michael Noyong; Rainer Waser; Ulrich Simon

Resistive switching of individual, spherical TiO2 nanoparticles is studied by U. Simon and co-workers. Bottom-up synthesized TiO2 particles are immobilized on a conducting substrate and individually electrically addressed by an electrode tip in an in-situ scanning electron microscope, as shown in this image by T. Pössinger. On page 6444, two switching behaviors are described, bipolar and complementary, which are associated with the inner structure of the individual particles. This opens up new opportunities for materials design.


Small | 2015

Resistive Switching of Individual, Chemically Synthesized TiO2 Nanoparticles

Dirk Oliver Schmidt; Susanne Hoffmann-Eifert; Hehe Zhang; Camilla La Torre; Astrid Besmehn; Michael Noyong; Rainer Waser; Ulrich Simon


Physical review applied | 2016

Uniting Gradual and Abrupt set Processes in Resistive Switching Oxides

Karsten Fleck; Camilla La Torre; Nabeel Aslam; Susanne Hoffmann-Eifert; Ulrich Böttger; Stephan Menzel


Physica Status Solidi (a) | 2016

Dependence of the SET switching variability on the initial state in HfOx-based ReRAM

Camilla La Torre; Karsten Fleck; S. Starschich; Eike Linn; Rainer Waser; Stephan Menzel


IEEE Transactions on Electron Devices | 2018

Improved Switching Stability and the Effect of an Internal Series Resistor in HfO 2 /TiO x Bilayer ReRAM Cells

Alexander Hardtdegen; Camilla La Torre; Felix Cüppers; Stephan Menzel; Rainer Waser; Susanne Hoffmann-Eifert


international memory workshop | 2017

Overcoming the RESET Limitation in Tantalum Oxide-Based ReRAM Using an Oxygen-Blocking Layer

Alexander Schönhals; Andreas Kindsmüller; Camilla La Torre; Hehe Zhang; Susanne Hoffmann-Eifert; Stephan Menzel; Rainer Waser; Dirk Wouters


Nanoscale | 2017

Volatile HRS asymmetry and subloops in resistive switching oxides

Camilla La Torre; Andreas Kindsmüller; Dirk J. Wouters; Catherine Graves; Gary Gibson; John Paul Strachan; R. Stanley Williams; Rainer Waser; Stephan Menzel

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Stephan Menzel

Forschungszentrum Jülich

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Hehe Zhang

Forschungszentrum Jülich

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Astrid Besmehn

Forschungszentrum Jülich

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