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Dive into the research topics where Canute Vaz is active.

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Featured researches published by Canute Vaz.


ACS Nano | 2014

Quantifying short-lived events in multistate ionic current measurements.

Arvind Balijepalli; Jessica Ettedgui; Andrew T. Cornio; Joseph W. F. Robertson; Kin P. Cheung; John J. Kasianowicz; Canute Vaz

We developed a generalized technique to characterize polymer–nanopore interactions via single channel ionic current measurements. Physical interactions between analytes, such as DNA, proteins, or synthetic polymers, and a nanopore cause multiple discrete states in the current. We modeled the transitions of the current to individual states with an equivalent electrical circuit, which allowed us to describe the system response. This enabled the estimation of short-lived states that are presently not characterized by existing analysis techniques. Our approach considerably improves the range and resolution of single-molecule characterization with nanopores. For example, we characterized the residence times of synthetic polymers that are three times shorter than those estimated with existing algorithms. Because the molecule’s residence time follows an exponential distribution, we recover nearly 20-fold more events per unit time that can be used for analysis. Furthermore, the measurement range was extended from 11 monomers to as few as 8. Finally, we applied this technique to recover a known sequence of single-stranded DNA from previously published ion channel recordings, identifying discrete current states with subpicoampere resolution.


IEEE Electron Device Letters | 2015

0.5 V Supply Voltage Operation of In 0.65 Ga 0.35 As/GaAs 0.4 Sb 0.6 Tunnel FET

Bijesh Rajamohanan; Rahul Pandey; Varistha Chobpattana; Canute Vaz; David J. Gundlach; Kin P. Cheung; John S. Suehle; Susanne Stemmer; Suman Datta

In this letter, we demonstrate using fast current-voltage measurements, low switching slope of 64 mV/decade over a drain current range between


Analytical Chemistry | 2015

Electron spin resonance scanning probe spectroscopy for ultrasensitive biochemical studies.

Jason P. Campbell; Jason T. Ryan; Pragya R. Shrestha; Zhanglong Liu; Canute Vaz; Jihong Kim; Vasileia Georgiou; Kin P. Cheung

10^{\mathrm {\mathbf {-3}}}


IEEE Transactions on Electron Devices | 2014

PBTI-Induced Random Timing Jitter in Circuit-Speed Random Logic

Jiwu Lu; Guangfan Jiao; Canute Vaz; Jason P. Campbell; Jason T. Ryan; Kin P. Cheung; Gennadi Bersuker; Chadwin D. Young

and


symposium on vlsi technology | 2014

Accurate RRAM transient currents during forming

Pragya R. Shrestha; David M. Nminibapiel; Jason P. Campbell; Jihong Kim; Canute Vaz; Kin P. Cheung; Helmut Baumgart

2 \times 10^{\mathrm {\mathbf {-2}}} \mu


symposium on vlsi technology | 2014

Device-level PBTI-induced timing jitter increase in circuit-speed random logic operation

Jiwu Lu; Canute Vaz; Jason P. Campbell; Jason T. Ryan; Kin P. Cheung; Guangfan Jiao; Gennadi Bersuker; Chadwin D. Young

A/


ACS Nano | 2015

Correction to Quantifying Short-Lived Events in Multistate Ionic Channel Measurements.

Arvind Balijepalli; Jessica Ettedgui; Andrew T. Cornio; Joseph W. F. Robertson; Kin P. Cheung; John J. Kasianowicz; Canute Vaz

\mu


AIP Advances | 2016

Observation of strong reflection of electron waves exiting a ballistic channel at low energy

Canute Vaz; Changze Liu; Jason P. Campbell; Jason T. Ryan; Richard G. Southwick; David J. Gundlach; Anthony S. Oates; Ru Huang; Kin P. Cheung

m in staggered-gap In0.65Ga0.35As/GaAs0.4Sb0.6 tunneling field-effect transistors (TFETs) at


ieee international conference on solid state and integrated circuit technology | 2014

Impact of BTI on random logic circuit critical timing

Kin P. Cheung; Jiwu Lu; Guangfan Jiao; Canute Vaz; Jason P. Campbell; Jason T. Ryan

\mathrm{V}_{\mathrm {\mathbf {DS}}}\,=\,0.5


Analytical Chemistry | 2016

MOSAIC: A Modular Single-Molecule Analysis Interface for Decoding Multistate Nanopore Data

Jacob H. Forstater; Kyle Briggs; Joseph W. F. Robertson; Jessica Ettedgui; Olivier Marie-Rose; Canute Vaz; John J. Kasianowicz; Vincent Tabard-Cossa; Arvind Balijepalli

V. This is achieved through a combination of low damage mesa sidewall etch and improvement in electrical quality of the high-

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Kin P. Cheung

National Institute of Standards and Technology

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Jason P. Campbell

National Institute of Standards and Technology

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Arvind Balijepalli

National Institute of Standards and Technology

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Jason T. Ryan

National Institute of Standards and Technology

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John J. Kasianowicz

National Institute of Standards and Technology

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Joseph W. F. Robertson

National Institute of Standards and Technology

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Jessica Ettedgui

National Institute of Standards and Technology

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Andrew T. Cornio

National Institute of Standards and Technology

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Guangfan Jiao

National Institute of Standards and Technology

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Jihong Kim

National Institute of Standards and Technology

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