Carl A. Zanoni

An Automatic Interference Pattern Processor With Interactive Capability

An automatic interference pattern processor has been developed for the purpose of rapidly and accurately evaluating either real time interference patterns or interferograms. The system has been designed to provide quick and easily interpretable feedback so that the operator can monitor the systems measurements. The system includes: (1) a semiautomatic mode to facilitate the measurement of difficult interference patterns and (2) an integral, easily used calibration mode. The results of the least squares evaluation are available in a variety of formats.

Dimensional Gauging Using A Scanning Laser Beam

There is increasing interest in non-contacting sensors to perform dynamic, in-process gauging to achieve closed-loop adaptive control of manufacturing processes. After a brief review of current instrumentation, a detailed description will be given of those engineering principles and design features which must be considered to achieve stable, reliable measurements with an optical sensor using a scanning laser beam. Several applications will also be discussed.