Chang-Won Park
Samsung
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Publication
Featured researches published by Chang-Won Park.
Japanese Journal of Applied Physics | 2003
Jaeho Lee; Kyoung-Yoon Bang; Ok-Kyung Kim; Hye-Keun Oh; Ilsin An; Chaun-gi Choi; Chang-Won Park
Spectroscopic ellipsometry (SE) and X-ray photoelectron spectroscopy (XPS) were employed to study the composite thin films of SiO and cobalt (Co) prepared by sputtering technique. The optical properties of these films could be expressed as mixtures of SiO and Co using effective medium approximation (EMA) by Bruggeman. When the compositional properties of films analyzed by EMA and XPS were compared, the optical volume of SiO was found to be 5.47 times greater than that of Co.
Archive | 2001
Chaun-gi Choi; Young-Rag Do; Joon-Bae Lee; Chang-Won Park
Archive | 1997
Young-Rag Do; Chang-Won Park; Joon-Bae Lee; Won-ho Yoon
Archive | 2001
Young-Rag Do; Chang-Won Park; Joon-Bae Lee; Chaun-gi Choi
Archive | 2000
Z Ivan Indutnyy; E Petro Shepeliavyi; V Kateryna Michailovskaya; Chang-Won Park; Joon-Bae Lee; Yong Han
Archive | 2001
Chaun-gi Choi; Young-Rag Do; Joon-Bae Lee; Chang-Won Park
Archive | 1993
Jwa-young Jeong; Won-ho Yun; Jun-bae Lee; Chang-Won Park
Archive | 2003
Chang-Won Park
Archive | 2001
Chaun-gi Choi; Young-Rag Do; Joon-Bae Lee; Chang-Won Park
Archive | 1999
Chang-Won Park; Chang-kyu Beck
