Chien Hung Liu
National Formosa University
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Featured researches published by Chien Hung Liu.
Review of Scientific Instruments | 2011
Hau Wei Lee; Chieh-Li Chen; Chien Hung Liu
Laser trackers are widely used in industry for tasks such as the assembly of airplanes and automobiles, contour measurement, and robot calibration. However, laser trackers are expensive, and the corresponding solution procedure is very complex. The influence of measurement uncertainties is also significant. This study proposes a three-dimensional space position measurement system which consists of two tracking modules, a zero tracking angle return subsystem, and a target quadrant photodiode (QPD). The target QPD is placed on the object being tracked. The origin locking method is used to keep the rays on the origin of the target QPD. The position of the target QPD is determined using triangulation since the two laser rays are projected onto one QPD. Modulation and demodulation are utilized to separate the coupled positional values. The experiment results show that measurement errors in the X, Y, and Z directions are less than ±0.05% when the measured object was moved by 300, 300, and 200 mm in the X, Y, and Z axes, respectively. The theoretical measurement error estimated from the measurement model is between ±0.02% and ±0.07% within the defined measurable range. The proposed system can be applied to the measurements of machine tools and robot arms.
Proceedings of the Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture | 2006
Wen-Yuh Jywe; Chien Hung Liu; Bor Jeng Lin; Tung Hui Hsu
Abstract The accuracy of machine tools restricts the dimensional accuracy of parts processed thereon. It is, therefore, necessary to monitor the errors of machine tools constantly. Normally, it takes a long set-up time before one can observe the machine tool and monitor its errors. The cost of such delays is inevitably high. As for CNC, the conventional measurement system is capable of measuring one-dimensional signals, as a laser interferometer does, and two-dimensional signals, as a grid encoder does. Three-dimensional measurement techniques, however, are far from being well developed and are not yet well known. This paper proposes a triangulation method incorporating three built-in linear-scale ball bars that requires less set-up time and lower costs than the laser ball bar system, and is capable of acquiring three-dimensional signals with greater accuracy with the extension bars, so that large volumes can be checked.
Review of Scientific Instruments | 2011
Tung Hsien Hsieh; Wen-Yuh Jywe; Shang Liang Chen; Chien Hung Liu; Hsueh Liang Huang
A high resolution six degrees of freedom (6-DOF) optical vibrometer is proposed. 6-DOF vibrations can be simultaneously measured using the proposed optical vibrometer, which reduces measurement time and number. The performance of the proposed vibrometer is verified by experiments. The results show that the accuracy of the proposed optical vibrometer is ±30 nm∕200 nm and ±0.04 arcsec∕0.1 arcsec at 1000 Hz.
Journal of The Chinese Institute of Engineers | 2010
Shang Liang Chen; Wen-Yuh Jywe; Tung Hsien Hsieh; Chien Hung Liu; Hsueh Liang Huang; Tung Hui Hsu; Yeau-Ren Jeng; Ming Shi Wang
Abstract In this paper, a new optical 3‐dimensional vibrometer is presented. This system is composed of two orthogonally set up corner cubes (CC), a collimated laser source, two quadrant detectors (QD) and three beam‐splitters (BS). The corner cubes are designed to be fixed to the vibrating object and reflect the laser source onto the quadrant detectors. Due to the optical characteristics of the corner cubes, the measuring results of the QD can be magnified twice and it is not affected by micrometer‐angle. So, the three‐dimensional vibration amplitude can be obtained. The resolution is about 50 nm. This system is characterized by three‐dimensional measurement, high resolution, low cost, simple set up and wide bandwidth.
international symposium on computer communication control and automation | 2010
L. W. Ji; Cheng-Zhi Wu; Sheng-Joue Young; K. T. Lam; Walter Water; Y. F. Chen; Chien Hung Liu; Teen-Hang Meen; Te-Hua Fang; Chih-Ming Lin
In this work, both of ZnO based metal-semiconductor-metal photodetectors with and without ZnO cap layer were fabricated on flexible substrates (polyethylene terephthalate, PET) for comparative analysis. The ZnO films were prepared by a low temperature sputtering process. The photodetector with ZnO cap layer (stack structure: ZnO/Ag/ZnO/PET) shows a much higher UV-to-visible rejection ratio of 1.56×103 than one without. It can be attributed to the photocurrents significantly enhanced under UV light illumination in such a novel structure. With an incident wavelength of 370 nm and 3 V applied bias, the responsivities of both photodetectors with and without ZnO cap layer are 3.80×10−2 and 2.36×10−3 A/W, respectively, which correspond to quantum efficiencies of 1.13 % and 0.07 %. The Schottky barrier height on Ag/ZnO interfaces is also obtained to be 0.782 eV.
conference of the industrial electronics society | 2007
Chien Hung Liu; Wen-Yuh Jywe; Ming Shi Wang; Hsueh Liang Huang
The laser linear encoders are widely used as positioning sensor for a precision linear moving stage. In this paper, a Three-Degrees-Of-Freedom Laser Linear Encoder based on diffraction and interference was developed. It can simultaneously measure the linear displacement and two angular errors of a linear moving stage. The displacement is measured using a polarization interference technique and the two angular errors is also measured based on the near-axis optical theorem. This paper has describes a laser linear encoder that can detect displacements relative to an external grating scale with accuracy about 150 nm for a measuring range plusmn1000 mum and can detect angular errors with accuracy about 1 arsec for a measuring range plusmn100 arsecs.
Volume 2: Automotive Systems, Bioengineering and Biomedical Technology, Fluids Engineering, Maintenance Engineering and Non-Destructive Evaluation, and Nanotechnology | 2006
Wen-Yuh Jywe; Chien Hung Liu; Yun-Feng Teng; Chun-Jen Chen; Jing-Chung Shen; Wen-Hsiang Hsieh; Yung-Cheng Wang
This paper presents a new precision multi-DOF measurement system which has been developed and implemented for the simultaneous measurement of 5DOF motion errors (two linear positions, as well as pitch, roll and yaw) of an X-Y stage. In this paper, the 3DOF laser interferometer was produced by designing the optical path from the one-degrees-of-freedom laser interferometer. The system employs two three-degree-of-freedom interferometers to detect two position errors and three angular errors of the X-Y stage. The experimental setups and measuring procedure and a systematic calculated method for the error verification are presented in the paper. The resolution of measuring the angular errors component is about 0.055 arcsec.Copyright
International Journal of Machine Tools & Manufacture | 2004
Chien Hung Liu; Wen-Yuh Jywe
Optics and Lasers in Engineering | 2010
Hsueh Liang Huang; Wen-Yuh Jywe; Chien Hung Liu; Lili Duan; Ming Shi Wang
Journal of Crystal Growth | 2008
L. W. Ji; Sheng-Joue Young; Chien Hung Liu; Walter Water; Teen-Hang Meen; Wen-Yuh Jywe