Chiho Harayama

Effect of cavity-layer thicknesses on two-color emission in coupled multilayer cavities with InAs quantum dots

A GaAs/AlAs coupled multilayer cavity structure was grown on a (001) GaAs substrate. The top cavity contains self-assembled InAs quantum dots (QDs) as optical gain materials for two-color emission of cavity-mode light. The bottom cavity layer was grown with lateral thickness variation in the wafer to investigate the effects of the thickness difference between the two cavity layers quantitatively. The frequency difference was minimum, and the intensity ratio of the two-color emission was unity when the optical thicknesses of the two cavity layers were the same. The emission intensity ratio was explained in terms of the electric fields at the top cavity region containing the QDs.

Wafer-bonded coupled multilayer cavity with InAs quantum dots for two-color emission

A GaAs/AlAs coupled multilayer cavity structure with InAs quantum dots (QDs) was fabricated by wafer-bonding of two cavity structures grown individually. The wafer-bonding technique is important to control the spatial distribution of nonlinear polarization for strong terahertz emission by the differential frequency generation of the two cavity modes of the coupled cavity. Three layers of self-assembled InAs QDs were inserted in a cavity grown on a (001) GaAs substrate as optical gain materials for two-color emission of the cavity mode lights. The other cavity with a GaAs cavity layer was grown on a (113)B GaAs substrate. Two-color emissions with a 3.8 THz frequency difference were successfully observed from the wafer-bonded coupled cavity by cw optical pumping at room temperature.