Choi Jung-Hwan | Researchain

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Featured researches published by Choi Jung-Hwan.

Archive | 2001

Socket and printed circuit board for semiconductor device, and method of testing semiconductor device

Choi Jung-Hwan

Archive | 2011

DELAY-LOCKED-LOOP CIRCUIT, SEMICONDUCTOR DEVICE AND MEMORY SYSTEM HAVING THE DELAY-LOCKED-LOOP CIRCUIT

Choi Jung-Hwan

Archive | 2014

MEMORY SYSTEM HAVING DELAY-LOCKED-LOOP CIRCUIT

Choi Jung-Hwan

Archive | 2007

Semiconductor device with improved signal transmission characteristics

Choi Jung-Hwan

Archive | 2000

Data input-output circuit for integrated circuit devices e.g. memory devices has a number of output units and a control unit

Choi Jung-Hwan

IEEE Journal of Solid-state Circuits | 2017

温度分布を考慮した高速ウエハレベルIO実験計画と適応リフレッシュを備えた1.2V,20nmの307GB/s HBM DRAM【Powered by NICT】

Sohn Kyomin; Yun Won-Joo; Oh Reum; Oh Chi-Sung; Seo Seong-Young; Park Min-Sang; Shin Dong-Hak; Jung Won-Chang; Shin Sang-Hoon; Ryu Je-Min; Yu Hye-Seung; Jung Jae-Hun; Lee Hyunui; Kang Seok-Yong; Sohn Young-Soo; Choi Jung-Hwan; Bae Yong-Cheol; Jang Seong-Jin; Jin Gyo-Young

IEEE Conference Proceedings | 2017

ウェアラブルデバイスのための23.4超低待機電力3.733ピン2Gb LPDDR4SDRAM【Powered by NICT】

Kwon Hye-Jung; Seo Eunsung; Lee Chan-Yong; Seo Young-Hun; Han Gong-Heum; Kim Hye-Ran; Lee Jong-Ho; Jang Min-Su; Do Sung-Geun; Cho Seung-Hyun; Park Jae-Koo; Doo Su-Yeon; Shin Jung-Bum; Jung Sang-Hoon; Kim Hyoung-Ju; Im In-Ho; Cho Beob-Rae; Lee Jae-Woong; Lee Jae-Youl; Yu Ki-Hun; Kim Hyung-Kyu; Jeon Chul-Hee; Park Hyun-Soo; Kim Sang-Sun; Lee Seok-Ho; Park Jong-Wook; Lee Seung-Sub; Lim Bo-Tak; Park Jun-young; Park Yoon-Sik

IEEE Conference Proceedings | 2017

0.8V,65nm CMOSによるモバイルDRAMインタフェースの12Gb/s/pinシングルエンド送受信機のためのタップDFEを有する23.7A時間ベース受信機【Powered by NICT】

Yi Il-Min; Chae Min-Kyun; Hyun Seok-Hun; Bae Seung-Jun; Choi Jung-Hwan; Jang Seong-Jin; Kim Byungsub; Sim Jae-Yoon; Park Hong-June

IEEE Conference Proceedings | 2017

II金型ZQキャリブレーション法を用いた電力単離したLVSTLおよび分割型アーキテクチャを用いた23.2A5Gb/s/pin8Gb LPDDR4X SDRAM【Powered by NICT】

Lee Chang-Kyo; Eom Yoon-Joo; Park Jin-Hee; Lee Junha; Kim Hye-Ran; Kim Kihan; Choi Young; Chang Ho-Jun; Kim Jonghyuk; Bang Jong-Min; Shin Seungjun; Park Hanna; Park Sujin; Choi Young‐Ryeol; Lee Hoon; Jeon Kyong-Ho; Lee Jae-Young; Ahn Hyo-Joo; Kim Kyoung-Ho; Kim Jung-Sik; Chang Soobong; Hwang Hyong-Ryol; Kim Duyeul; Yoon Yoon-Hwan; Hyun Seok-Hun; Park Joon-Young; Song Yoon-Gyu; Park Youn-Sik; Kwon Hyuck-Joon; Bae Seung-Jun

IEEE Conference Proceedings | 2016

高帯域幅メモリ(HBM)のための非接触2Gb/s I/O試験法の設計【Powered by NICT】

Lee Hyunui; Kang Sukyong; Yu Hye-Seung; Yun Won-Joo; Jung Jae-Hun; Ahn Sungoh; Kim Wang-Soo; Kil Beomyong; Sung Yoo-Chang; Shin Sang-Hoon; Park Yong-Sik; Kim Yong-Hwan; Nam Kyung-Woo; Song Indal; Sohn Kyomin; Bae Yong-Cheol; Choi Jung-Hwan; Jang Seong-Jin; Jin Gyo-Young

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