Christof Bodner
Infineon Technologies
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Publication
Featured researches published by Christof Bodner.
international semiconductor conference | 2009
Mihai-Alexandru Ionescu; Christof Bodner; Stefan Dineci; Gheorghe Brezeanu
This paper presents a new way to test integrated Hall effect sensors, by converting the internal measured parameters into other parameters, which can be measured more easily, with less complex equipment and in a shorter time. A comparison between SPICE, and Simulink simulations and with an analytical model is achieved, in order to evaluate the precision of the method.
Archive | 2009
Mario Motz; Simon Hainz; Christof Bodner
Archive | 2009
Simon Hainz; Christof Bodner; Mario Motz; Tobias Werth; Dirk Hammerschmidt
Archive | 2009
Simon Hainz; Christof Bodner; Dirk Hammerschmidt; Mario Motz; Tobias Werth
Archive | 2016
Mario Motz; Wolfgang Scherr; Christof Bodner; Leneesh Raghavan
Archive | 2015
Christof Bodner; Theodor Kranz; Mario Motz; Wolfgang Scherr
Archive | 2015
Christof Bodner; Mario Motz; Leneesh Raghavan; Wolfgang Scherr
Archive | 2015
Christof Bodner; Simon Hainz; Christoph Schroers
Archive | 2015
Christof Bodner; Mario Motz; Leneesh Raghavan; Wolfgang Scherr
Archive | 2015
Christof Bodner; Mario Motz; Wolfgang Scherr
