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Dive into the research topics where Christopher T. Gibson is active.

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Featured researches published by Christopher T. Gibson.


Advanced Materials | 2013

N‐Doped Graphene Natively Grown on Hierarchical Ordered Porous Carbon for Enhanced Oxygen Reduction

Ji Liang; Xin Du; Christopher T. Gibson; Xi-Wen Du; Shi Zhang Qiao

A novel nitrogen doped hybrid material composed of in situ-formed graphene natively grown on hierarchical ordered porous carbon is prepared, which successfully combines the advantages of both materials, such as high surface area, high mass transfer, and high conductivity. The outstanding structural properties of the resultant material render it an excellent metal-free catalyst for electrochemical oxygen reduction.


Nanotechnology | 2005

Calibration of silicon atomic force microscope cantilevers

Christopher T. Gibson; D. Alastair Smith; Clive J. Roberts

We present a comparison of three different methods to calibrate the spring constant of two different types of silicon beam shaped atomic force microscope (AFM) cantilevers to determine each methods accuracy, ease of use and potential destructiveness. The majority of research in calibrating AFM cantilevers has been concerned with contact mode levers. The two types of levers we have studied are used in force modulation and tapping mode in air. Not only can these types of cantilevers have spring constants an order of magnitude greater than contact mode levers, but also their geometries can be quite different from the standard V-shape contact lever. In this work we experimentally determine the correction factors for two of the calibration methods when applied to the tapping mode cantilevers and also demonstrate that the force modulation levers can be calibrated easily and accurately using these same techniques.


Nanotechnology | 2016

Accurate thickness measurement of graphene

Cameron J. Shearer; Ashley D. Slattery; Andrew J. Stapleton; Joseph G. Shapter; Christopher T. Gibson

Graphene has emerged as a material with a vast variety of applications. The electronic, optical and mechanical properties of graphene are strongly influenced by the number of layers present in a sample. As a result, the dimensional characterization of graphene films is crucial, especially with the continued development of new synthesis methods and applications. A number of techniques exist to determine the thickness of graphene films including optical contrast, Raman scattering and scanning probe microscopy techniques. Atomic force microscopy (AFM), in particular, is used extensively since it provides three-dimensional images that enable the measurement of the lateral dimensions of graphene films as well as the thickness, and by extension the number of layers present. However, in the literature AFM has proven to be inaccurate with a wide range of measured values for single layer graphene thickness reported (between 0.4 and 1.7 nm). This discrepancy has been attributed to tip-surface interactions, image feedback settings and surface chemistry. In this work, we use standard and carbon nanotube modified AFM probes and a relatively new AFM imaging mode known as PeakForce tapping mode to establish a protocol that will allow users to accurately determine the thickness of graphene films. In particular, the error in measuring the first layer is reduced from 0.1-1.3 nm to 0.1-0.3 nm. Furthermore, in the process we establish that the graphene-substrate adsorbate layer and imaging force, in particular the pressure the tip exerts on the surface, are crucial components in the accurate measurement of graphene using AFM. These findings can be applied to other 2D materials.


Fuel | 1983

Evaporative analyser as a mass detector in the size-exclusion chromatography of coal extracts

Keith D. Bartle; Norman Taylor; Michael J. Mulligan; Derek G. Mills; Christopher T. Gibson

Abstract The applicability of the evaporative analyser in the size-exclusion chromatography (SEC) of coal derivatives has been explored. The detector, in which the intensity is measured for the light scattered from the finely divided solute particles resulting from evaporation of droplets of chromatographic eluate, is mass responsive, sensitive, and linear for both narrow and gross coal-extract fractions. For molecular masses above 300 the mass response is almost uniform, and there are considerable advantages over the detectors commonly used in SEC. Application to lower molecular mass coal materials is limited by the evaporation of solute along with solvent in the detector.


Angewandte Chemie | 2016

Sulfur-Limonene Polysulfide: A Material Synthesized Entirely from Industrial By-Products and Its Use in Removing Toxic Metals from Water and Soil.

Michael P. Crockett; Austin M. Evans; Max J. H. Worthington; Inês S. Albuquerque; Ashley D. Slattery; Christopher T. Gibson; Jonathan A. Campbell; David A. Lewis; Gonçalo J. L. Bernardes; Justin M. Chalker

Abstract A polysulfide material was synthesized by the direct reaction of sulfur and d‐limonene, by‐products of the petroleum and citrus industries, respectively. The resulting material was processed into functional coatings or molded into solid devices for the removal of palladium and mercury salts from water and soil. The binding of mercury(II) to the sulfur‐limonene polysulfide resulted in a color change. These properties motivate application in next‐generation environmental remediation and mercury sensing.


Ultramicroscopy | 2003

Calibration of AFM cantilever spring constants

Christopher T. Gibson; Brandon L. Weeks; Chris Abell; Trevor Rayment; Sverre Myhra

In this paper we present two simple, reliable and readily applicable methods for calibrating cantilevers and measuring the thickness of thin gold films. The spring constant calibration requires knowledge of the Youngs modulus, density of the cantilever and resonant frequency. The thickness of thin gold layers was determined by measuring changes in the resonant frequency and Q-factor of beam shaped AFM cantilevers before and after coating. The techniques for measuring the spring constant and thin film thickness provide accuracy on the order of 10-15%.


Ultramicroscopy | 2013

Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibration

Ashley D. Slattery; Adam J. Blanch; Jamie Scott Quinton; Christopher T. Gibson

Considerable attention has been given to the calibration of AFM cantilever spring constants in the last 20 years. Techniques that do not require tip-sample contact are considered advantageous since the imaging tip is not at risk of being damaged. Far less attention has been directed toward measuring the cantilever deflection or sensitivity, despite the fact that the primary means of determining this factor relies on the AFM tip being pressed against a hard surface, such as silicon or sapphire; which has the potential to significantly damage the tip. A recent method developed by Tourek et al. in 2010 involves deflecting the AFM cantilever a known distance from the imaging tip by pressing the cantilever against a sharpened tungsten wire. In this work a similar yet more precise method is described, whereby the deflection of the cantilever is achieved using an AFM probe with a spring constant much larger than the test cantilever, essentially a rigid cantilever. The exact position of loading on the test cantilever was determined by reverse AFM imaging small spatial markers that are milled into the test cantilever using a focussed ion beam. For V shaped cantilevers it is possible to reverse image the arm intersection in order to determine the exact loading point without necessarily requiring FIB milled spatial markers, albeit at the potential cost of additional uncertainty. The technique is applied to tip-less, beam shaped and V shaped cantilevers and compared to the hard surface contact technique with very good agreement (on average less than 5% difference). While the agreement with the hard surface contact technique was very good the error on the technique is dependent upon the assumptions inherent in the method, such as cantilever shape, loading point distance and ratio of test to rigid cantilever spring constants. The average error ranged between 2 to 5% for the majority of test cantilevers studied. The sensitivity derived with this technique can then be used to calibrate the cantilever spring constant using the thermal noise method, allowing complete force calibration to be accurately performed without tip-sample contact.


Nanotechnology | 2013

Calibration of atomic force microscope cantilevers using standard and inverted static methods assisted by FIB-milled spatial markers.

Ashley D. Slattery; Adam J. Blanch; Jamie Scott Quinton; Christopher T. Gibson

Static methods to determine the spring constant of AFM cantilevers have been widely used in the scientific community since the importance of such calibration techniques was established nearly 20 years ago. The most commonly used static techniques involve loading a trial cantilever with a known force by pressing it against a pre-calibrated standard or reference cantilever. These reference cantilever methods have a number of sources of uncertainty, which include the uncertainty in the measured spring constant of the standard cantilever, the exact position of the loading point on the reference cantilever and how closely the spring constant of the trial and reference cantilever match. We present a technique that enables users to minimize these uncertainties by creating spatial markers on reference cantilevers using a focused ion beam (FIB). We demonstrate that by combining FIB spatial markers with an inverted reference cantilever method, AFM cantilevers can be accurately calibrated without the tip of the test cantilever contacting a surface. This work also demonstrates that for V-shaped cantilevers it is possible to determine the precise loading position by AFM imaging the section of the cantilever where the two arms join. Removing tip-to-surface contact in both the reference cantilever method and sensitivity calibration is a significant improvement, since this is an important consideration for AFM users that require the imaging tip to remain in pristine condition before commencing measurements. Uncertainties of between 5 and 10% are routinely achievable with these methods.


Chemsuschem | 2015

A TiO2 Nanofiber-Carbon Nanotube-Composite Photoanode for Improved Efficiency in Dye-Sensitized Solar Cells.

Thomas J. Macdonald; Daniel D. Tune; Melissa R. Dewi; Christopher T. Gibson; Joseph G. Shapter; Thomas Nann

A light-scattering layer fabricated from electrospun titanium dioxide nanofibers (TiO2 -NFs) and single-walled carbon nanotubes (SWCNTs) formed a fiber-based photoanode. The nanocomposite scattering layer had a lawn-like structure and integration of carbon nanotubes into the NF photoanodes increased the power conversion efficiency from 2.9 % to 4.8 % under 1 Sun illumination. Under reduced light intensity (0.25 Sun), TiO2 -NF and TiO2 -NF/SWCNT-based DSSCs reached PCE values of up to 3.7 % and 6.6 %, respectively.


Ultramicroscopy | 2011

Atomic force microscopy-based antibody recognition imaging of proteins in the pathological deposits in Pseudoexfoliation Syndrome

Rhiannon Creasey; Shiwani Sharma; Christopher T. Gibson; Jamie E. Craig; Andreas Ebner; Thomas Becker; Peter Hinterdorfer; Nicolas H. Voelcker

The phenomenon of protein aggregation is of considerable interest to various disciplines, including the field of medicine. A range of disease pathologies are associated with this phenomenon. One of the ocular diseases hallmarked by protein aggregation is the Pseudoexfoliation (PEX) Syndrome. This condition is characterized by the deposition of insoluble proteinaceous material on the anterior human lens capsule. Genomic and proteomic analyses have revealed an association of specific genetic markers and various proteins, respectively, with PEX syndrome. However, the ultrastructure of the protein aggregates is poorly characterized. This study seeks to build capacity to determine the molecular nature of PEX aggregates on human lens capsules in their native state by AFM-based antibody recognition imaging. Lysyl oxidase-Like 1 (LOXL1), a protein identified as a component of PEX aggregates, is detected by an antibody-modified AFM probe. Topographical AFM images and antibody recognition images are obtained using three AFM-based techniques: TREC, phase and force-volume imaging. LOXL1 is found to be present on the lens capsule surface, and is localized around fibrous protein aggregates. Our evaluation shows that TREC imaging is best suited for human tissue imaging and holds significant potential for imaging of human disease tissues in their native state.

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