Clemens Ottermann
Schott AG
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Featured researches published by Clemens Ottermann.
Archive | 2003
Klaus Bange; Clemens Ottermann; Olaf Anderson
The properties of thin films are strongly influenced by the deposition parameters and conditions, i.e., they are strongly related to the coating technologies described in Chap. 3. Variations are possible, for example in mechanical characteristics, in colour, in film thickness, etc. To efficiently produce coatings for a certain application it is necessary to know the parameters that influence a desired film property during the deposition process. For reactive evaporation, as described in Sect. 3.1.2, these are: substrate temperature, deposition rate, oxygen partial pressure and total pressure. For films produced by the sol—gel technique, as described in Sect. 3.3, the relevant parameters are: composition of solution, drawing speed, interaction with the surrounding atmosphere during drawing and with the substrate during densification.
Archive | 2004
Bernd Schultheis; Harry Engelmann; Clemens Ottermann
Archive | 2002
Clemens Ottermann; Oliver Fritz; Dipl. Phys Dietrich Mund; Jörn Dr. Pommerehne
Archive | 2004
Clemens Ottermann; Bernd Schultheis; Holger Köbrich; Dirk Dr. Hertel; Ruth Effenberger; Klaus Michael Hammerl
Archive | 2005
Clemens Ottermann; Thomas Dr. Däubler; Steffen Reichel; Edgar Pawlowski
Archive | 2008
Clemens Ottermann
Archive | 2004
Clemens Ottermann; Georg Sparschuh
Archive | 2005
Ingo Köhler; Clemens Ottermann; Jörn Dr. Pommerehne
Archive | 2003
Ruth Effenberger; Klaus Michael Hammerl; Dirk Dr. Hertel; Holger Köbrich; Clemens Ottermann; Bernd Schultheis
Archive | 2003
Dirk Dr. Hertel; Gerold Ohl; Clemens Ottermann; Thomas Zenker