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Cristina Alvarez Diez

Carl Zeiss AG

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Publication

Featured researches published by Cristina Alvarez Diez.

Archive | 2010

DEVICES AND METHODS FOR POSITION DETERMINATION AND SURFACE MEASUREMENT

Bernd Spruck; Cristina Alvarez Diez; Simon Brattke; Lars-Christian Wittig; Stefan Richter; Enrico Geissler; Christian Koos; Oliver Schmidt; Frank Hoeller

Archive | 2009

Device and method for measuring a surface

Cristina Alvarez Diez; Frank Hoeller; Bernd Spruck; Marc Dr. Tremont

Archive | 2009

METHOD AND DEVICE FOR DETERMINING A POSITION OF AN OBJECT

Cristina Alvarez Diez; Frank Hoeller; Bernd Spruck; Marc Dr. Tremont

Archive | 2010

EVALUATION DEVICE, MEASURING ARRANGEMENT AND METHOD FOR PATH LENGTH MEASUREMENT

Bernd Spruck; Frank Hoeller; Cristina Alvarez Diez

Archive | 2010

Evaluation device, measuring arrangement and method for path length measurement and measuring system and method for a coordinate measuring device and coordinate measuring device

Bernd Spruck; Frank Hoeller; Cristina Alvarez Diez

Archive | 2013

Vorrichtung und Verfahren zum Ermitteln einer Blickrichtung, elektronische Brille und Verfahren zum Steuern einer elektronischen Brille

Bernd Spruck; Cristina Alvarez Diez

Archive | 2013

Vorrichtung und Verfahren zum Ermitteln einer Blickrichtung, elektronische Brille und Verfahren zum Steuern einer elektronischen Brille Apparatus and method for determining a viewing direction, electronic glasses and method for controlling an electronic eyewear

Bernd Spruck; Cristina Alvarez Diez

Archive | 2013

Apparatus and method for determining a viewing direction, electronic glasses and method for controlling an electronic spectacles

Bernd Spruck; Cristina Alvarez Diez

Archive | 2012

Dreidimensionale Darstellung von Objekten Three-dimensional representation of objects

Bernd Spruck; Cristina Alvarez Diez; Christian Wojek; Jochen Fuchs

Archive | 2012

Optical element e.g. lens of microlithographic projection exposure system used in manufacture of integrated circuit, has excitation light mirror that is arranged to irradiate excitation light with respect to region of optical material

Cristina Alvarez Diez; Michael Totzeck

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Collaboration

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Bernd Spruck

Carl Zeiss AG

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Frank Hoeller

Carl Zeiss AG

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Marc Dr. Tremont

Carl Zeiss AG

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Christian Koos

Carl Zeiss AG

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Enrico Geissler

Carl Zeiss AG

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Lars-Christian Wittig

Carl Zeiss AG

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Michael Totzeck

Carl Zeiss AG

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Oliver Schmidt

Carl Zeiss AG

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Simon Brattke

Carl Zeiss AG

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Stefan Richter

Carl Zeiss AG

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