D. Klinger

Spot size characterization of focused non-Gaussian X-ray laser beams

We present a new technique for the characterization of non-Gaussian laser beams which cannot be described by an analytical formula. As a generalization of the beam spot area we apply and refine the definition of so called effective area (A(eff)) [1] in order to avoid using the full-width at half maximum (FWHM) parameter which is inappropriate for non-Gaussian beams. Furthermore, we demonstrate a practical utilization of our technique for a femtosecond soft X-ray free-electron laser. The ablative imprints in poly(methyl methacrylate) - PMMA and amorphous carbon (a-C) are used to characterize the spatial beam profile and to determine the effective area. Two procedures of the effective area determination are presented in this work. An F-scan method, newly developed in this paper, appears to be a good candidate for the spatial beam diagnostics applicable to lasers of various kinds.

Ablation of various materials with intense XUV radiation

Ablation behavior of organic polymer (polymethylmethacrylate) and elemental solid (silicon) irradiated by single pulses of XUV radiation emitted from Z-pinch, plasma-focus, and laser-produced plasmas was investigated. The ablation characteristics measured for these plasma-based sources will be compared with those obtained for irradiation of samples with XUV radiation generated by a free-electron laser.

Soft x-ray free electron laser microfocus for exploring matter under extreme conditions

We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg: lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 microJ, 5 Hz) using a fine polished off-axis parabola having a focal length of 270 mm and coated with a Mo/Si multilayer with an initial reflectivity of 67% at 13.5 nm. The OAP was mounted and aligned with a picomotor controlled six-axis gimbal. Beam imprints on poly(methyl methacrylate) - PMMA were used to measure focus and the focused beam was used to create isochoric heating of various slab targets. Results show the focal spot has a diameter of < or =1 microm. Observations were correlated with simulations of best focus to provide further relevant information.

Experimental station to study the interaction of intense femtosecond vacuum ultraviolet pulses with matter at TTF1 free electron laser

An experimental station to study the interaction of intense femtosecond vacuum ultraviolet pulses generated by the TTF1 free electron laser (FEL) (DESY, Germany) with solids was developed. The vacuum chamber, the sample holder and the detectors had been designed to fulfill strong constraints caused both by the unique properties of the interacting radiation and by TTF1 FEL innovative design. The applied mounting system allowed one to move and rotate the samples precisely with 4degrees of freedom and to heat them up to the maximal temperature of 1000K. In order to accomplish the in situ growth of thin metallic layers on the sample surfaces, evaporation cells had been installed in the vacuum chamber. A time-of-flight apparatus capable of recording both electrons and ions excited on the solid surfaces by the laser pulses had been included in the chamber design. A pulse energy monitor had been placed in the laser beam outside the experimental chamber. A second energy detector had been mounted inside the chambe...

X-ray laser-induced ablation of lead compounds

The recent commissioning of a X-ray free-electron laser triggered an extensive research in the area of X-ray ablation of high-Z, high-density materials. Such compounds should be used to shorten an effective attenuation length for obtaining clean ablation imprints required for the focused beam analysis. Compounds of lead (Z=82) represent the materials of first choice. In this contribution, single-shot ablation thresholds are reported for PbWO4 and PbI2 exposed to ultra-short pulses of extreme ultraviolet radiation and X-rays at FLASH and LCLS facilities, respectively. Interestingly, the threshold reaches only 0.11 mJ/cm2 at 1.55 nm in lead tungstate although a value of 0.4 J/cm2 is expected according to the wavelength dependence of an attenuation length and the threshold value determined in the XUV spectral region, i.e., 79 mJ/cm2 at a FEL wavelength of 13.5 nm. Mechanisms of ablation processes are discussed to explain this discrepancy. Lead iodide shows at 1.55 nm significantly lower ablation threshold than tungstate although an attenuation length of the radiation is in both materials quite the same. Lower thermal and radiation stability of PbI2 is responsible for this finding.

Ablation of Organic Polymers and Elemental Solids Induced by Intense XUV Radiation

The ablation efficiency of organic polymers (polymethylmethacrylate ‐ PMMA, polytetrafluoroethylene ‐ PTFE, polyethyleneterephtalate ‐ PET, and polyimide ‐ PI) and elemental solids (aluminum and silicon) by single pulses of extreme ultraviolet (XUV) radiation emitted from Z‐pinch, plasma‐focus, and laser‐produced plasmas was investigated. The ablation characteristics measured for these plasma‐based sources will be compared with those obtained for irradiation of samples with XUV radiation generated by a free‐electron laser (FEL). The Z‐pinch was driven by the S‐300 pulsed‐power machine (Kurchatov Institute, Moscow) and the plasma focus was realized in the PF‐1000 machine (Institute of Plasma Physics and Laser Microfusion, Warsaw). Higher temperature plasma than with the discharge plasmas was obtained by focusing the near‐infrared (fundamental frequency) beam from the PALS high‐power iodine laser system (Czech Academy of Sciences, Prague) on the surface of a metallic slab target or into single‐ and double‐g...

X-ray diffraction and Raman scattering study of near-surface structure perfection of GaAs single crystals after anisotropic etching

Microrelief was developed on the surface of high quality GaAs single crystals by means of wet anisotropic etching. The surface relief characteristics and structure perfection of subsurface layer were studied by profilometric, optical reflection, Raman scattering, X-ray, and reflection high-energy electron diffraction methods.

Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids

In this article, we describe the experimental station and procedures for investigating the interaction of short-wavelength free-electron lasers (FELs) pulses with solids. With the advent of these sources, a unique combination of radiation properties (including wavelength range from tens of nanometers down to sub-Angstroms, femtosecond pulse duration, and high pulse energy reaching milli-Joules level) creates new research possibilities for the systematic studies of radiation-induced structural changes in solids. However, the properties of the intense FEL radiation generate, apart from the new experimental opportunities, extreme demands on the experimental set-up (mostly in terms of radiation hardness of detectors and their saturation levels). Thus, radiation-induced phase transitions in solids, beyond the fundamental scientific interest, are of importance for the design of FEL beamlines and instruments which interact with the direct beam. In this report, we focus on the instrumentation and experimental techniques used in the recent studies performed at the FLASH facility in Hamburg.

Study of Extended Defect Structure Induced by Pulsed Laser Annealing in Implanted Silicon Crystals

(a) Institute of Physics, Polish Academy of Sciences, Al. Lotniko´w 32/46,PL-02-668 Warsaw, Poland(b) Institute of Experimental Physics, Warsaw University, Ul. Hoz˙a 69,PL-00-681 Warsaw, Poland(c) Institute of Electron Technology, Al. Lotniko´w 32/46, PL-02-668 Warsaw, Poland(Received October 1, 1998)An analysis of extended defects generated during annealing by pulsed excimer laser radiation in sili-con crystals implanted with Ge ions is presented. The investigation was performed by means of twocomplementary methods: the interference-polarizing microscopy and the Lang X-ray transmissiontopography. The existence of extended defects was revealed. It has been stated that the distributionof these defects depends on the distribution of the power density in the laser beam cross-section.

Modification of magnetic properties of Pt/Co/Pt trilayers driven by nanosecond pulses of extreme ultraviolet irradiation

An irreversible rotation of magnetization from in-plane to an out-of-plane direction was induced in Pt/Co/Pt epitaxial trilayers by single and multiple pulses of extreme ultraviolet (EUV) irradiations. The radial dependence of remanence, coercivity and saturation fields across the irradiated spots was studied with the help of magneto-optical techniques for the samples with various Co and Pt buffer layer thicknesses. The sample surface and magnetic ordering were investigated using atomic force and magnetic force microscopies. Based on magnetic and morphological changes, the residual stress after thermoplastic deformation in the spot area is discussed as a reason for the observed transformation.