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Dive into the research topics where Daniel Grötzsch is active.

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Featured researches published by Daniel Grötzsch.


Journal of Analytical Atomic Spectrometry | 2010

A compact 3D micro X-ray fluorescence spectrometer with X-ray tube excitation for archaeometric applications

Ioanna Mantouvalou; Kathrin Lange; Timo de Wolff; Daniel Grötzsch; Lars Lühl; Michael Haschke; Oliver Hahn; Birgit Kanngießer

In this work, the applicability of a new 3D micro X-ray fluorescence (3D Micro-XRF) laboratory spectrometer for the investigation of historical glass objects is demonstrated. The non-destructiveness of the technique and the possibility to measure three-dimensionally resolved fluorescence renders this technique into a suitable tool for the analysis of cultural heritage objects. Although absorption and resolution effects complicate qualitative analysis of the data, layered structures can be distinguished from homogeneous samples without the need for full quantification. Different manufacturing techniques were studied in this work with the help of hand-made reference samples. With the gained knowledge it could be shown for the investigated historical glass object, that black enamel as a stained glass contour colour was used in a cold painting. The object was not fired after the application of the black enamel, but instead the adhesion of the paint was solely provided through organic binding agents and the backing with metal foils. Thus, for the manufacturing of the object, a mixture of cold painting technique with a stained glass color was used. Quantitative measurements with a 3D Micro-XRF setup at the Berlin synchrotron BESSY II confirm the assumptions drawn on the basis of the qualitative investigation with the 3D Micro-XRF spectrometer with X-ray tube excitation.


Review of Scientific Instruments | 2014

A novel von Hamos spectrometer for efficient X-ray emission spectroscopy in the laboratory

Lars Anklamm; Christopher Schlesiger; Wolfgang Malzer; Daniel Grötzsch; Michael Neitzel; Birgit Kanngießer

We present a novel, highly efficient von Hamos spectrometer for X-ray emission spectroscopy (XES) in the laboratory using highly annealed pyrolitic graphite crystals as the dispersive element. The spectrometer covers an energy range from 2.5 keV to 15 keV giving access to chemical speciation and information about the electronic configuration of 3d transition metals by means of the Kβ multiplet. XES spectra of Ti compounds are presented to demonstrate the speciation capabilities of the instrument. A spectral resolving power of E/ΔE = 2000 at 8 keV was achieved. Typical acquisition times range from 10 min for bulk material to hours for thin samples below 1 μm.


Review of Scientific Instruments | 2015

High average power, highly brilliant laser-produced plasma source for soft X-ray spectroscopy

Ioanna Mantouvalou; Katharina Witte; Daniel Grötzsch; Michael Neitzel; Sabrina Günther; Jonas Baumann; Robert Jung; Holger Stiel; Birgit Kanngießer; W. Sandner

In this work, a novel laser-produced plasma source is presented which delivers pulsed broadband soft X-radiation in the range between 100 and 1200 eV. The source was designed in view of long operating hours, high stability, and cost effectiveness. It relies on a rotating and translating metal target and achieves high stability through an on-line monitoring device using a four quadrant extreme ultraviolet diode in a pinhole camera arrangement. The source can be operated with three different laser pulse durations and various target materials and is equipped with two beamlines for simultaneous experiments. Characterization measurements are presented with special emphasis on the source position and emission stability of the source. As a first application, a near edge X-ray absorption fine structure measurement on a thin polyimide foil shows the potential of the source for soft X-ray spectroscopy.


Applied Physics Letters | 2016

Single shot near edge x-ray absorption fine structure spectroscopy in the laboratory

Ioanna Mantouvalou; Katharina Witte; W. Martyanov; A. Jonas; Daniel Grötzsch; Cornelia Streeck; H. Löchel; I. Rudolph; A. Erko; Holger Stiel; B. Kanngießer

With the help of adapted off-axis reflection zone plates, near edge X-ray absorption fine structure spectra at the C and N K-absorption edge have been recorded using a single 1.2 ns long soft X-ray pulse. The transmission experiments were performed with a laser-produced plasma source in the laboratory rendering time resolved measurements feasible independent on large scale facilities. A resolving power of E/ΔE ∼ 950 at the respective edges could be demonstrated. A comparison of single shot spectra with those collected with longer measuring time proves that all features of the used reference samples (silicon nitrate and polyimide) can be resolved in 1.2 ns. Hence, investigations of radiation sensitive biological specimen become possible due to the high efficiency of the optical elements enabling low dose experiments.


Review of Scientific Instruments | 2016

A flexible setup for angle-resolved X-ray fluorescence spectrometry with laboratory sources

M. Spanier; C. Herzog; Daniel Grötzsch; F. Kramer; Ioanna Mantouvalou; J. Lubeck; J. Weser; Cornelia Streeck; Wolfgang Malzer; Burkhard Beckhoff; B. Kanngießer

X-ray fluorescence (XRF) analysis is one of the standard tools for the analysis of stratified materials and is widely applied for the investigation of electronics and coatings. The composition and thickness of the layers can be determined quantitatively and non-destructively. Recent work showed that these capabilities can be extended towards retrieving stratigraphic information like concentration depth profiles using angle-resolved XRF (ARXRF). This paper introduces an experimental sample chamber which was developed as a multi-purpose tool enabling different measurement geometries suited for transmission measurements, conventional XRF, ARXRF, etc. The chamber was specifically designed for attaching all kinds of laboratory X-ray sources for the soft and hard X-ray ranges as well as various detection systems. In detail, a setup for ARXRF using an X-ray tube with a polycapillary X-ray lens as source is presented. For such a type of setup, both the spectral and lateral characterizations of the radiation field are crucial for quantitative ARXRF measurements. The characterization is validated with the help of a stratified validation sample.


Analytical Chemistry | 2017

Laboratory Setup for Scanning-Free Grazing Emission X-ray Fluorescence

J. Baumann; C. Herzog; M. Spanier; Daniel Grötzsch; L. Lühl; Katharina Witte; A. Jonas; S. Günther; F. Förste; R. Hartmann; M. Huth; D. Kalok; D. Steigenhöfer; M. Krämer; T. Holz; R. Dietsch; L. Strüder; B. Kanngießer; Ioanna Mantouvalou

Grazing incidence and grazing emission X-ray fluorescence spectroscopy (GI/GE-XRF) are techniques that enable nondestructive, quantitative analysis of elemental depth profiles with a resolution in the nanometer regime. A laboratory setup for soft X-ray GEXRF measurements is presented. Reasonable measurement times could be achieved by combining a highly brilliant laser produced plasma (LPP) source with a scanning-free GEXRF setup, providing a large solid angle of detection. The detector, a pnCCD, was operated in a single photon counting mode in order to utilize its energy dispersive properties. GEXRF profiles of the Ni-Lα,β line of a nickel-carbon multilayer sample, which displays a lateral (bi)layer thickness gradient, were recorded at several positions. Simulations of theoretical profiles predicted a prominent intensity minimum at grazing emission angles between 5° and 12°, depending strongly on the bilayer thickness of the sample. This information was used to retrieve the bilayer thickness gradient. The results are in good agreement with values obtained by X-ray reflectometry, conventional X-ray fluorescence and transmission electron microscopy measurements and serve as proof-of-principle for the realized GEXRF setup. The presented work demonstrates the potential of nanometer resolved elemental depth profiling in the soft X-ray range with a laboratory source, opening, for example, the possibility of in-line or even in situ process control in semiconductor industry.


Proceedings of SPIE | 2015

3D nanoscale imaging of biological samples with laboratory-based soft X-ray sources

Aurélie Dehlinger; Anne Blechschmidt; Daniel Grötzsch; Robert Jung; Birgit Kanngießer; Christian Seim; Holger Stiel

In microscopy, where the theoretical resolution limit depends on the wavelength of the probing light, radiation in the soft X-ray regime can be used to analyze samples that cannot be resolved with visible light microscopes. In the case of soft X-ray microscopy in the water-window, the energy range of the radiation lies between the absorption edges of carbon (at 284 eV, 4.36 nm) and oxygen (543 eV, 2.34 nm). As a result, carbon-based structures, such as biological samples, posses a strong absorption, whereas e.g. water is more transparent to this radiation. Microscopy in the water-window, therefore, allows the structural investigation of aqueous samples with resolutions of a few tens of nanometers and a penetration depth of up to 10μm. The development of highly brilliant laser-produced plasma-sources has enabled the transfer of Xray microscopy, that was formerly bound to synchrotron sources, to the laboratory, which opens the access of this method to a broader scientific community. The Laboratory Transmission X-ray Microscope at the Berlin Laboratory for innovative X-ray technologies (BLiX) runs with a laser produced nitrogen plasma that emits radiation in the soft X-ray regime. The mentioned high penetration depth can be exploited to analyze biological samples in their natural state and with several projection angles. The obtained tomogram is the key to a more precise and global analysis of samples originating from various fields of life science.


Review of Scientific Instruments | 2017

A sealable ultrathin window sample cell for the study of liquids by means of soft X-ray spectroscopy

Daniel Grötzsch; Cornelia Streeck; Carolin Nietzold; Wolfgang Malzer; Ioanna Mantouvalou; A. Nutsch; Paul M. Dietrich; Wolfgang E. S. Unger; Burkhard Beckhoff; B. Kanngießer

A new sample cell concept for the analysis of liquids or solid-liquid interfaces using soft X-ray spectroscopy is presented, which enables the complete sealing of the cell as well as the transport into vacuum via, for example, a load-lock system. The cell uses pressure monitoring and active as well as passive pressure regulation systems, thereby facilitating the full control over the pressure during filling, sealing, evacuation, and measurement. The cell design and sample preparation as well as the crucial sealing procedure are explained in detail. As a first proof-of-principle experiment, successful nitrogen K-edge fluorescence yield near-edge X-ray absorption fine structure experiments of a biomolecular solution are presented. For this purpose, it is shown that the careful evaluation of all involved parameters, such as window type or photon flux, is desirable for optimizing the experimental result.


Journal of Physical Chemistry B | 2016

Magnesium K-Edge NEXAFS Spectroscopy of Chlorophyll a in Solution.

Katharina Witte; Cornelia Streeck; Ioanna Mantouvalou; Svetlana A. Suchkova; Heiko Lokstein; Daniel Grötzsch; Wjatscheslav Martyanov; Jan Weser; Birgit Kanngießer; Burkhard Beckhoff; Holger Stiel


Journal of Analytical Atomic Spectrometry | 2018

Confocal micro-X-ray fluorescence spectroscopy with a liquid metal jet source

Leona Bauer; Malcolm Lindqvist; Frank Förste; Ulf Lundström; Björn Hansson; Markus Thiel; Semfira Bjeoumikhova; Daniel Grötzsch; Wolfgang Malzer; Birgit Kanngießer; Ioanna Mantouvalou

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Dive into the Daniel Grötzsch's collaboration.

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Ioanna Mantouvalou

Technical University of Berlin

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Birgit Kanngießer

Technical University of Berlin

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Wolfgang Malzer

Technical University of Berlin

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B. Kanngießer

Technical University of Berlin

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Holger Stiel

Technical University of Berlin

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Katharina Witte

Technical University of Berlin

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A. Jonas

Technical University of Berlin

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Michael Neitzel

Technical University of Berlin

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A. Erko

Helmholtz-Zentrum Berlin

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Andrea Hornemann

Technical University of Berlin

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