David A. Ramirez

Single bump, two-color quantum dot camera

The authors report a two-color, colocated quantum dot based imaging system used to take multicolor images using a single focal plane array (FPA). The dots-in-a-well (DWELL) detectors consist of an active region composed of InAs quantum dots embedded in In.15Ga.85As quantum wells. DWELL samples were grown using molecular beam epitaxy and fabricated into 320×256 focal plane arrays with indium bumps. The FPA was then hybridized to an Indigo ISC9705 readout circuit and tested. Calibrated blackbody measurements at a device temperature of 77K yield midwave infrared and long wave infrared noise equivalent difference in temperature of ∼55 and 70mK.

Detection efficiencies and generalized breakdown probabilities for nanosecond-gated near infrared single-photon avalanche photodiodes

A rigorous model is developed for determining single-photon quantum efficiency (SPQE) of single-photon avalanche photodiodes (SPADs) with simple or heterojunction multiplication regions. The analysis assumes nanosecond gated-mode operation of the SPADs and that band-to-band tunneling of carriers is the dominant source of dark current in the multiplication region. The model is then utilized to optimize the SPQE as a function of the applied voltage, for a given operating temperature and multiplication-region structure and material. The model can be applied to SPADs with In/sub 0.52/Al/sub 0.48/As or InP multiplication regions as well as In/sub 0.52/Al/sub 0.48/As--InP heterojunction multiplication regions for wavelengths of 1.3 and 1.55 /spl mu/m. The predictions show that the SPQE generally decreases with decreasing the multiplication-region thickness. Moreover, an InP multiplication region requires a lower breakdown electric field (and, hence, offers a higher SPQE) than that required by an In/sub 0.52/Al/sub 0.48/As layer of the same width. The model also shows that the fractional width of the In/sub 0.52/Al/sub 0.48/As layer in an In/sub 0.52/Al/sub 0.48/As--InP heterojunction multiplication region can be optimized to attain a maximum SPQE that is greater than that offered by an InP multiplication region. This effect becomes more pronounced in thin multiplication regions as a result of the increased significance of dead space.

Quantum Dots-in-a-Well Focal Plane Arrays

In this paper, the basics and some of the recent developments in quantum dots-in-a-well (DWELL) focal plane arrays (FPAs) are reviewed. Fundamentally, these detectors represent a hybrid between a conventional quantum well infrared photodetector (QWIP) and a quantum dot infrared photodetector (QDIP), in which the active region consists of quantum dots (QDs) embedded in a quantum well (QW). This hybridization grants DWELLs many of the advantages of its components. These advantages include normally incident photon sensitivity without gratings or optocoupers, like QDIPs, and reproducible control over operating wavelength through ldquodial-in recipesrdquo as seen in QWIPs. Recently reported high-temperature operation results for DWELL FPAs now back up the conclusions drawn by the long carrier lifetimes observed in DWELL heterostructures using femtosecond spectroscopy. This paper will conclude with a preview of some upcoming advances in the field of DWELL FPAs.

Dependence of the Performance of Single Photon Avalanche Diodes on the Multiplication Region Width

The dependence of the performance of separate-absorption-multiplication (SAM) single-photon avalanche diodes (SPADs) on the width of the multiplication region is theoretically investigated. The theory is applied to SAM SPADs with InP homojunction multiplication regions and InAlAs-InP heterojunction multiplication regions. In both cases the absorber layer is InGaAs. Two scenarios for the dark counts are considered: (i) low-temperature operation, when the number of dark carriers is dominated by field-assisted mechanisms of band-to-band tunneling and tunneling through defects; and (ii) room-temperature operation, when the number of dark carriers in the multiplication region is dominated by the generation/recombination mechanism. The analysis utilizes a generalized theory for breakdown probability, which takes into account the random locations where dark and photogenerated carriers are produced in each layer. Depending upon the detector temperature, as the width of the multiplication region is increased the effects from the reduction in the number of dark carriers due to field-assisted generation mechanisms are counteracted by the effects from the elevation in the number of generation/recombination dark carriers. Thus, there exists an optimal width of the multiplication region that achieves the best performance of the SPAD.

Plasmon assisted photonic crystal quantum dot sensors

We report Quantum Dot Infrared Detectors (QDIP) where light coupling to the self assembled quantum dots is achieved through plasmons occurring at the metal-semiconductor interface. The detector structure consists of an asymmetric InAs/InGaAs/GaAs dots-in-a-well (DWELL) structure and a thick layer of GaAs sandwiched between two highly doped n-GaAs contact layers, grown on a semi-insulating GaAs substrate. The aperture of the detector is covered with a thin metallic layer which along with the dielectric layer confines light in the vertical direction. Sub-wavelength two-dimensional periodic patterns etched in the metallic layer covering the aperture of the detector and the active region creates a micro-cavity that concentrate light in the active region leading to intersubband transitions between states in the dot and the ones in the well. The sidewalls of the detector were also covered with metal to ensure that there is no leakage of light into the active region other than through the metal covered aperture. An enhanced spectral response when compared to the normal DWELL detector is obtained despite the absence of any aperture in the detector. The spectral response measurements show that the Long Wave InfraRed (LWIR) region is enhanced when compared to the Mid Wave InfraRed (MWIR) region. This may be due to coupling of light into the active region by plasmons that are excited at the metal-semiconductor interface. The patterned metal-dielectric layers act as an optical resonator thereby enhancing the coupling efficiency of light into the active region at the specified frequency. The concept of plasmon-assisted coupling is in principle technology agnostic and can be easily integrated into present day infrared sensors.

Thin 3D Multiplication Regions in Plasmonically Enhanced Nanopillar Avalanche Detectors

We demonstrate a nanopillar (NP) device structure for implementing plasmonically enhanced avalanche photodetector arrays with thin avalanche volumes (∼ 310 nm × 150 nm × 150 nm). A localized 3D electric field due to a core-shell PN junction in a NP acts as a multiplication region, while efficient light absorption takes place via surface plasmon polariton Bloch wave (SPP-BW) modes due to a self-aligned metal nanohole lattice. Avalanche gains of ∼216 at 730 nm at -12 V are obtained. We show through capacitance-voltage characterization, temperature-dependent breakdown measurements, and detailed device modeling that the avalanche region is on the order of the ionization path length, such that dead-space effects become significant. This work presents a clear path toward engineering dead space effects in thin 3D-confined multiplication regions for high performance avalanche detectors for applications in telecommunications, sensing and single photon detection.

Multi-Gain-Stage InGaAs Avalanche Photodiode With Enhanced Gain and Reduced Excess Noise

We report the design, fabrication, and test of an InGaAs avalanche photodiode (APD) for 950-1650 nm wavelength sensing applications. The APD is grown by molecular beam epitaxy on InP substrates from lattice-matched InGaAs and InAlAs alloys. Avalanche multiplication inside the APD occurs in a series of asymmetric gain stages whose layer ordering acts to enhance the rate of electron-initiated impact ionization and to suppress the rate of hole-initiated ionization when operated at low gain. The multiplication stages are cascaded in series, interposed with carrier relaxation layers in which the electric field is low, preventing avalanche feedback between stages. These measures result in much lower excess multiplication noise and stable linear-mode operation at much higher avalanche gain than is characteristic of APDs fabricated from the same semiconductor alloys in bulk. The noise suppression mechanism is analyzed by simulations of impact ionization spatial distribution and gain statistics, and measurements on APDs implementing the design are presented. The devices employing this design are demonstrated to operate at linear-mode gain in excess of 6000 without avalanche breakdown. Excess noise characterized by an effective impact ionization rate ratio below 0.04 were measured at gains over 1000.

Time resolved gain and excess noise properties of InGaAs/InAlAs avalanche photodiodes with cascaded discrete gain layer multiplication regions

To predict pulse detection performance when implemented in high speed photoreceivers, temporally resolved measurements of a 10-stage InAlAs/InGaAs single carrier multiplication (SCM) avalanche photodiode (APD)s avalanche response to short multi-photon laser pulses were explained using instantaneous (time resolved) pulse height statistics of the devices impulse response. Numeric models of the junction carrier populations as a function of the time following injection of a primary photo-electron were used to create the probability density functions (pdfs) of the instances of the avalanche buildup process. The numeric pdfs were used to generate low frequency gain and excess noise models, which were in good agreement with analytic models of multiple discrete low-gain-stage APDs and with measured excess noise data. The numeric models were then used to generate the instantaneous and cumulative instantaneous low order statistics of the instances of the impulse response. It is shown that during the early times o...

Model for passive quenching of SPADs

Infrared single-photon avalanche photodiodes (SPADs) are used in a number of sensing applications such as satellite laser ranging, deep-space laser communication, time-resolved photon counting, quantum key distribution and quantum cryptography. A passively quenched SPAD circuit consists of a DC source connected to the SPAD, to provide the reverse bias, and a series load resistor. Upon a photon-generated electron-hole pair triggering an avalanche breakdown, current through the diode and the load resistor rises quickly reaching a steady state value, after which it can collapse (quench) at a stochastic time. In this paper we review three recent analytical and Monte-Carlo based models for the quenching time. In the first model, the applied bias after the trigger of an avalanche is assumed to be constant at the breakdown bias while the avalanche current is allowed to be stochastic. In the second model, the dynamic negative feedback, which is due to the dynamic voltage drop across the load resistor, is taken into account, albeit without considering the stochastic fluctuations in the avalanche pulse. In the third model, Monte-Carlo simulation is used to generate impact ionizations with the inclusion of the effects of negative feedback. The latter model is based on simulating the impact ionizations inside the multiplication region according to a dynamic bias voltage that is a function of the avalanche current it indices. In particular, it uses the time evolution of the bias across the diode to set the coefficients for impact ionization. As such, this latter model includes both the negative feedback and the stochastic nature of the avalanche current.

Midwave infrared quantum dot avalanche photodiode

We report the first demonstration of a GaAs based avalanche photodiode (APD) operating in the midwave infrared region (3–5 μm). In the device, called the quantum dot avalanche photodiode, an intersubband quantum dots-in-a-well detector is coupled with an APD through a tunnel barrier. Using this approach, we have increased the photocurrent and reached a conversion efficiency of 12%, which is one of the highest reported conversion efficiencies for any quantum dot detector.