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Dive into the research topics where David J. Poxson is active.

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Featured researches published by David J. Poxson.


Optics Letters | 2008

Realization of a near-perfect antireflection coating for silicon solar energy utilization

Mei-Ling Kuo; David J. Poxson; Yong Sung Kim; Frank W. Mont; Jong Kyu Kim; E. Fred Schubert; Shawn-Yu Lin

To harness the full spectrum of solar energy, Fresnel reflection at the surface of a solar cell must be eliminated over the entire solar spectrum and at all angles. Here, we show that a multilayer nanostructure having a graded-index profile, as predicted by theory [J. Opt. Soc. Am. 66, 515 (1976); Appl. Opt. 46, 6533 (2007)], can accomplish a near-perfect transmission of all-color of sunlight. An ultralow total reflectance of 1%-6% has been achieved over a broad spectrum, lambda = 400 to 1600 nm, and a wide range of angles of incidence, theta = 0 degrees-60 degrees . The measured angle- and wavelength-averaged total reflectance of 3.79% is the smallest ever reported in the literature, to our knowledge.


Optics Express | 2008

Design of multilayer antireflection coatings made from co-sputtered and low-refractive-index materials by genetic algorithm

Martin F. Schubert; Frank W. Mont; Sameer Chhajed; David J. Poxson; Jong Kyu Kim; E. Fred Schubert

Designs of multilayer antireflection coatings made from co-sputtered and low-refractive-index materials are optimized using a genetic algorithm. Co-sputtered and low-refractive-index materials allow the fine-tuning of refractive index, which is required to achieve optimum anti-reflection characteristics. The algorithm minimizes reflection over a wide range of wavelengths and incident angles, and includes material dispersion. Designs of antireflection coatings for silicon-based image sensors and solar cells, as well as triple-junction GaInP/GaAs/Ge solar cells are presented, and are shown to have significant performance advantages over conventional coatings. Nano-porous low-refractive-index layers are found to comprise generally half of the layers in an optimized antireflection coating, which underscores the importance of nano-porous layers for high-performance broadband and omnidirectional antireflection coatings.


Applied Physics Letters | 2008

Quantification of porosity and deposition rate of nanoporous films grown by oblique-angle deposition

David J. Poxson; Frank W. Mont; Martin F. Schubert; Jong Kyu Kim; E. F. Schubert

We propose an analytic model that accurately predicts the porosity and deposition rate of nanoporous films grown by oblique-angle deposition. The model employs a single fitting parameter and takes into account geometrical factors as well as surface diffusion. We have determined the porosity and deposition rate from the measured refractive index and thickness of SiO2 and indium tin oxide nanoporous films deposited at various incident angles. Comparison of experimental data with the model reveals excellent agreement. The theoretical model allows for the predictive control of refractive index, porosity, and deposition rate for a wide range of deposition angles and materials.


Optics Letters | 2009

Broadband omnidirectional antireflection coatings optimized by genetic algorithm.

David J. Poxson; Martin F. Schubert; Frank W. Mont; E. F. Schubert; Jong Kyu Kim

An optimized graded-refractive-index (GRIN) antireflection (AR) coating with broadband and omnidirectional characteristics--as desired for solar cell applications--designed by a genetic algorithm is presented. The optimized three-layer GRIN AR coating consists of a dense TiO2 and two nanoporous SiO2 layers fabricated using oblique-angle deposition. The normal incidence reflectance of the three-layer GRIN AR coating averaged between 400 and 700 nm is 3.9%, which is 37% lower than that of a conventional single-layer Si3N4 coating. Furthermore, measured reflection over the 410-740 nm range and wide incident angles 40 degrees -80 degrees is reduced by 73% in comparison with the single-layer Si3N4 coating, clearly showing enhanced omnidirectionality and broadband characteristics of the optimized three-layer GRIN AR coating.


Applied Physics Letters | 2008

Elimination of total internal reflection in GaInN light-emitting diodes by graded-refractive-index micropillars

Jong Kyu Kim; Ahmed N. Noemaun; Frank W. Mont; David S. Meyaard; E. Fred Schubert; David J. Poxson; Hyunsoo Kim; Cheolsoo Sone; Yongjo Park

A method for enhancing the light-extraction efficiency of GaInN light-emitting diodes (LEDs) by complete elimination of total internal reflection is reported. Analytical calculations show that GaInN LEDs with multilayer graded-refractive-index pillars, in which the thickness and refractive index of each layer are optimized, have no total internal reflection. This results in a remarkable improvement in light-extraction efficiency. GaInN LEDs with five-layer graded-refractive-index pillars, fabricated by cosputtering TiO2 and SiO2, show a light-output power enhanced by 73% and a strong side emission, consistent with analytical calculations and ray-tracing simulations.


Japanese Journal of Applied Physics | 2009

Refractive-Index-Matched Indium–Tin-Oxide Electrodes for Liquid Crystal Displays

Xing Yan; Frank W. Mont; David J. Poxson; Martin F. Schubert; Jong Kyu Kim; Jaehee Cho; E. Fred Schubert

Refractive-index-matched indium–tin-oxide (ITO) electrode for thin-film transistor liquid crystal displays is presented to reduce optical losses caused by Fresnel reflections. Simulations show a 24% improvement in optical transmittance when the conventional dense ITO is replaced with the refractive-index-matched ITO in a stack of glass/ITO/liquid crystal/ITO/glass. The refractive-index-matched ITO, fabricated by oblique-angle deposition technique, shows higher optical transmittance and smaller dependency on film thickness and wavelength than conventional dense ITO.


Applied Physics Express | 2011

Nanostructured Multilayer Tailored-Refractive-Index Antireflection Coating for Glass with Broadband and Omnidirectional Characteristics

Sameer Chhajed; David J. Poxson; Xing Yan; Jaehee Cho; E. Fred Schubert; Roger E. Welser; Ashok K. Sood; Jong Kyu Kim

The design, fabrication, and characterization of a broadband, omnidirectional, graded-index anti-reflection (AR) coating on a glass substrate, fabricated by using nanostructured low-refractive-index (n = 1.05–1.40) silica, is reported. The AR coating is designed by using a genetic algorithm and fabricated by using oblique angle deposition. The AR coating is designed for the wavelength range of 400 to 2500 nm and 0 to 40° angle of incidence. The measured average optical transmittance between 1000 and 2000 nm is improved from 92.6 to 99.3% at normal incidence by using a two-layer AR coating deposited on both surfaces of the glass substrate.


Applied Physics Express | 2010

Performance of Antireflection Coatings Consisting of Multiple Discrete Layers and Comparison with Continuously Graded Antireflection Coatings

Martin F. Schubert; David J. Poxson; Frank W. Mont; Jong Kyu Kim; E. Fred Schubert

The performance of discrete multilayer and continuously graded antireflection coatings for omnidirectional broadband applications are compared. It is shown that in practical cases where refractive index choices are constrained, discrete antireflection coatings can surpass the performance of continuously graded coatings by taking advantage of interference effects, which continuously graded coatings are expressly designed to avoid. A four-layer antireflection coating designed using a genetic algorithm is fabricated, and is experimentally shown to have reflectivity lower than what is achievable for continuously graded designs.


Optics Express | 2013

Enhanced broadband and omni-directional performance of polycrystalline Si solar cells by using discrete multilayer antireflection coatings

Seung Jae Oh; Sameer Chhajed; David J. Poxson; Jaehee Cho; E. Fred Schubert; Sung Ju Tark; Donghwan Kim; Jong Kyu Kim

The performance enhancement of polycrystalline Si solar cells by using an optimized discrete multilayer anti-reflection (AR) coating with broadband and omni-directional characteristics is presented. Discrete multilayer AR coatings are optimized by a genetic algorithm, and experimentally demonstrated by refractive-index tunable SiO₂ nano-helix arrays and co-sputtered (SiO₂)x(TiO₂)₁₋x thin film layers. The optimized multilayer AR coating shows a reduced total reflection, leading to the high incident-photon-to-electron conversion efficiency over a correspondingly wide range of wavelengths and incident angles, offering a very promising way to harvest more solar energy by virtually any type of solar cells for a longer time of a day.


Biomaterials | 2015

Stem cell behavior on tailored porous oxide surface coatings

Sandrine Lavenus; David J. Poxson; Nika Ogievetsky; Jonathan S. Dordick; Richard W. Siegel

Nanoscale surface topographies are known to have a profound influence on cell behavior, including cell guidance, migration, morphology, proliferation, and differentiation. In this study, we have observed the behavior of human mesenchymal stem cells cultured on a range of tailored porous SiO2 and TiO2 nanostructured surface coatings fabricated via glancing angle electron-beam deposition. By controlling the physical vapor deposition angle during fabrication, we could control systematically the deposited coating porosity, along with associated topographic features. Immunocytochemistry and image analysis quantitatively revealed the number of adherent cells, as well as their basic cellular morphology, on these surfaces. Signaling pathway studies showed that even with subtle changes in nanoscale surface structures, the behavior of mesenchymal stem cells was strongly influenced by the precise surface structures of these porous coatings.

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E. Fred Schubert

Sandia National Laboratories

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Frank W. Mont

Rensselaer Polytechnic Institute

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Jong Kyu Kim

Pohang University of Science and Technology

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Jaehee Cho

Chonbuk National University

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Martin F. Schubert

Rensselaer Polytechnic Institute

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Adam W. Sood

Rensselaer Polytechnic Institute

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Sameer Chhajed

Rensselaer Polytechnic Institute

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Xing Yan

Rensselaer Polytechnic Institute

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