Network


Latest external collaboration on country level. Dive into details by clicking on the dots.

Hotspot


Dive into the research topics where David J. Reed is active.

Publication


Featured researches published by David J. Reed.


Archive | 2012

Systems and methods for measuring high frequency resistance in a fuel cell system

David J. Reed; Angelo T. Caruso; Richard P. Corey; Kenneth L. Kaye


Archive | 2011

FRAME SEQUENCE FOR A CELL VOLTAGE MEASUREMENT SYSTEM WITH A LOW PROBABILITY OF NATURAL OCCURRENCE

David J. Reed; Kenneth L. Kaye; Derek R. Lebzelter; Kevin Sampson


Archive | 2013

Systems and method for measuring a high frequency resistance in a fuel cell system

David J. Reed; Angelo T. Caruso; Richard P. Corey; Kenneth L. Kaye


Archive | 2013

Redundanz für eine verbesserte zuverlässigkeit der überwachung einer stapelfunktionsfähigkeit Redundancy for improved reliability of monitoring a stack functional ability

Jeffrey A. Rock; David J. Reed; Kenneth L. Kaye


Archive | 2013

METHOD OF PROVIDING A CALIBRATING REFERENCE VOLTAGE AND INDEX SYNCHRONIZATION SEQUENCE FOR A CELL VOLTAGE MEASUREMENT SYSTEM

David J. Reed; Kenneth L. Kaye; Derek R. Lebzelter


Archive | 2013

REDUNDANZ FÜR EINE VERBESSERTE ZUVERLÄSSIGKEIT DER ÜBERWACHUNG EINER STAPELFUNKTIONSFÄHIGKEIT

Jeffrey A. Rock; David J. Reed; Kenneth L. Kaye


Archive | 2013

Systeme und verfahren zum messen eines hochfrequenzwiderstands in einem brennstoffzellensystem Systems and methods for measuring a high frequency resistor in a fuel cell system

David J. Reed; Angelo T. Caruso; Richard P. Corey; Kenneth L. Kaye


Archive | 2013

Redundancy for improved reliability of control of a stack functionality

Jeffrey A. Rock; David J. Reed; Kenneth L. Kaye


Archive | 2012

Redundancy For Improved Stack Health Monitoring Reliability

Jeffrey A. Rock; David J. Reed; Kenneth L. Kaye


Archive | 2012

Rasterfolge für ein Zellspannungsmess-System mit einer niedrigen Wahrscheinlichkeit für ein natürliches Auftreten Raster sequence for a cell voltage measurement system with a low probability of occurrence of a natural

David J. Reed; Kenneth L. Kaye; Derek R. Lebzelter; Kevin Sampson

Collaboration


Dive into the David J. Reed's collaboration.

Researchain Logo
Decentralizing Knowledge