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Dive into the research topics where David Martrou is active.

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Featured researches published by David Martrou.


Angewandte Chemie | 2009

Self-Assembly of Fivefold-Symmetric Molecules on a Threefold-Symmetric Surface†

Olivier Guillermet; Eeva Niemi; Samuthira Nagarajan; Xavier Bouju; David Martrou; André Gourdon; Sébastien Gauthier

Buckybowls: The adsorption of penta-tert-butylcorannulene, a molecule with fivefold symmetry, on Cu(111), a surface with threefold symmetry, is investigated by scanning tunneling microscopy complemented by structure calculations. The symmetry mismatch is resolved by the formation of threefold-symmetric subunits consisting of three molecules, which combine with single molecules to form a nearly perfect filling of the plane (see picture).


Beilstein Journal of Nanotechnology | 2012

An NC-AFM and KPFM study of the adsorption of a triphenylene derivative on KBr(001)

Antoine Hinaut; Adeline R. Pujol; Florian Chaumeton; David Martrou; André Gourdon; Sébastien Gauthier

Summary The adsorption on KBr(001) of a specially designed molecule, consisting of a flat aromatic triphenylene core equipped with six flexible propyl chains ending with polar cyano groups, is investigated by using atomic force microscopy in the noncontact mode (NC-AFM) coupled to Kelvin probe force microscopy (KPFM) in ultrahigh vacuum at room temperature. Two types of monolayers are identified, one in which the molecules lie flat on the surface (MLh) and another in which they stand approximately upright (MLv). The Kelvin voltage on these two structures is negatively shifted relative to that of the clean KBr surface, revealing the presence of surface dipoles with a component pointing along the normal to the surface. These findings are interpreted with the help of numerical simulations. It is shown that the surface–molecule interaction is dominated by the electrostatic interaction of the cyano groups with the K+ ions of the substrate. The molecule is strongly adsorbed in the MLh structure with an adsorption energy of 1.8 eV. In the MLv layer, the molecules form π-stacked rows aligned along the polar directions of the KBr surface. In these rows, the molecules are less strongly bound to the substrate, but the structure is stabilized by the strong intermolecular interaction due to π-stacking.


Applied Physics Letters | 2007

Fast radiative quantum dots: From single to multiple photon emission

E. Peter; S. Laurent; J. Bloch; J. Hours; S. Varoutsis; Isabelle Robert-Philip; Alexios Beveratos; A. Lemaître; A. Cavanna; G. Patriarche; P. Senellart; David Martrou

Photon correlation measurements are performed on single GaAs quantum dots with various excitonic radiative lifetimes. A continuous increase of the probability that the quantum dot emits more than one photon per excitation pulse is observed when decreasing the exciton radiative lifetime. The authors show that this increase is due to recapture processes into the quantum dot. A model for the second-order autocorrelation function including relaxation processes is developed and gives good description of the experimental observations.


Applied Physics Letters | 2007

Nanostenciling for fabrication and interconnection of nanopatterns and microelectrodes

Haiming Guo; David Martrou; Tomaso Zambelli; Jérôme Polesel-Maris; Agnès Piednoir; Erik Dujardin; Sébastien Gauthier; Marc A. F. van den Boogaart; L M Doeswijk; Jürgen Brugger

Stencil lithography is used for patterning and connecting nanostructures with metallic microelectrodes in ultrahigh vacuum. Microelectrodes are fabricated by static stencil deposition through a thin silicon nitride membrane. Arbitrary nanoscale patterns are then deposited at a predefined position relative to the microelectrodes, using as a movable stencil mask an atomic force microscopy (AFM) cantilever in which apertures have been drilled by focused ion beam. Large scale AFM imaging, combined with the use of a high precision positioning table, allows inspecting the microelectrodes and positioning the nanoscale pattern with accuracy better than 100nm.


Applied Physics Letters | 2007

Highly directional radiation pattern of microdisk cavities

E. Peter; Adrien Dousse; P. Voisin; A. Lemaître; David Martrou; A. Cavanna; J. Bloch; P. Senellart

The far field radiation pattern of microdisk cavities embedding a quantum well is measured through angle resolved microphotoluminescence. The radiation pattern presents two narrow lobes slightly off the disk plane, in apparent contradiction with previous theoretical predictions. The observed radiation pattern is shown to result from interferences with light reflected by the sample substrate. It can be fully reproduced given the microdisk precise geometry as well as the whispering gallery mode azimuthal number.


Nanotechnology | 2008

Step-induced tip polarity reversal investigated by dynamic force microscopy on KBr(001)

M A Venegas de la Cerda; José Abad; A Madgavkar; David Martrou; Sébastien Gauthier

We present atomic resolution images of monatomic step edges on the KBr(001) surface imaged by dynamic force microscopy operated in the non-contact mode. Under certain experimental conditions, we observe a systematic and reversible change of the atomic contrast when the tip crosses the step. This change is attributed to the reversal of the polarity of the ionic tip under the influence of the tip-substrate interaction in the immediate vicinity of the step edge. This polarity reversal is attributed to a change in the atomic structure of the tip and is described by a transition between the two potential wells of a two-level system localized near the tip apex. The case of two monatomic steps imaged in succession is also investigated in detail. The results indicate that the two-level system associated with the reversal of the tip polarity involves the movement of a very limited number of ions on the tip.


Journal of Applied Physics | 2014

Electrothermally driven high-frequency piezoresistive SiC cantilevers for dynamic atomic force microscopy

R. Boubekri; E. Cambril; Laurent Couraud; L. Bernardi; Ali Madouri; Marc Portail; Thierry Chassagne; Catherine Moisson; Marcin Zielinski; S. Jiao; Jean-François Michaud; Daniel Alquier; J. Bouloc; Laurent Nony; F. Bocquet; Christian Loppacher; David Martrou; Sébastien Gauthier

Cantilevers with resonance frequency ranging from 1 MHz to 100 MHz have been developed for dynamic atomic force microscopy. These sensors are fabricated from 3C-SiC epilayers grown on Si(100) substrates by low pressure chemical vapor deposition. They use an on-chip method both for driving and sensing the displacement of the cantilever. A first gold metallic loop deposited on top of the cantilever is used to drive its oscillation by electrothermal actuation. The sensing of this oscillation is performed by monitoring the resistance of a second Au loop. This metallic piezoresistive detection method has distinct advantages relative to more common semiconductor-based schemes. The optimization, design, fabrication, and characteristics of these cantilevers are discussed.


Review of Scientific Instruments | 2008

Development of UHV dynamic nanostencil for surface patterning

Haiming Guo; David Martrou; Tomaso Zambelli; Erik Dujardin; Sébastien Gauthier

A dynamic nanostencil system based on a movable atomic force microscopy (AFM) cantilever-borne mask has been developed in ultrahigh vacuum environment. This system is conceived to offer an outstanding nanopatterning capability of nanometer precision as well as in situ AFM characterization with a large scanning range. Evaporation experiments in both static and dynamic mode have been performed successfully on this system, and some crucial technical problems of stencilling technique such as resolution and clogging are investigated. As an important application of molecular electronics, a method to fabricate and connect nanoscale structures with microelectrodes by accurately combining it with static stenciling is presented.


Review of Scientific Instruments | 2013

An energy-filtering device coupled to a quadrupole mass spectrometer for soft-landing molecular ions on surfaces with controlled energy

A. Bodin; R. Laloo; P. Abeilhou; L. Guiraud; Sébastien Gauthier; David Martrou

We have developed an energy-filtering device coupled to a quadrupole mass spectrometer to deposit ionized molecules on surfaces with controlled energy in ultra high vacuum environment. Extensive numerical simulations as well as direct measurements show that the ion beam flying out of a quadrupole exhibits a high-energy tail decreasing slowly up to several hundred eV. This energy distribution renders impossible any direct soft-landing deposition of molecular ions. To remove this high-energy tail by energy filtering, a 127° electrostatic sector and a specific triplet lenses were designed and added after the last quadrupole of a triple quadrupole mass spectrometer. The results obtained with this energy-filtering device show clearly the elimination of the high-energy tail. The ion beam that impinges on the sample surface satisfies now the soft-landing criterion for molecular ions, opening new research opportunities in the numerous scientific domains involving charges adsorbed on insulating surfaces.


Materials Science Forum | 2012

High Frequency 3C-SiC AFM Cantilever Using Thermal Actuation and Metallic Piezoresistive Detection

Rachida Boubekri; E. Cambril; Laurent Couraud; Lorenzo Bernardi; Ali Madouri; David Martrou; Sébastien Gauthier

One way to improve the force sensitivity of Atomic Force Microscopy (AFM) cantilevers is to increase their resonance frequency. SiC is an excellent material for that purpose due to its high Young’s modulus and low mass density. This size reduction makes conventional optical motion detection methods inappropriate. Here, we introduce self-sensing, self-excited high frequency AFM cantilevers. The motion detection is based on the measurement of a metallic piezoresistor incorporated in the cantilever. The motion excitation is performed by electrothermal actuation using another metallic circuit. Cantilevers with sizes as low as 4 μm in length, 1.2 μm in width and 0.5 μm in thickness were realized by using different steps of e-beam lithography, deposition of thin gold films to pattern the piezoresistor and the electrothermal actuation electrode. Dry etching SF6 plasma was used for etching the SiC cantilever and TMAH solution heated to 80°C to release the cantilever. In this case, a thigh control of underetching, which reduces the cantilever resonance frequency was required.

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Sébastien Gauthier

Centre national de la recherche scientifique

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A. Cavanna

Centre national de la recherche scientifique

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Florian Chaumeton

Centre national de la recherche scientifique

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Erik Dujardin

Centre national de la recherche scientifique

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Xavier Bouju

Centre national de la recherche scientifique

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E. Peter

Centre national de la recherche scientifique

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J. Bloch

Centre national de la recherche scientifique

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A. Lemaître

Université Paris-Saclay

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P. Senellart

Université Paris-Saclay

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Haiming Guo

Chinese Academy of Sciences

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