David Payne

Rapid Stabilization of High-Performance Multicrystalline P-type Silicon PERC Cells

Light-induced or, more broadly, carrier-induced degradation (CID) in high-performance multicrystalline silicon (TIP mc-Si) solar cells remains a serious issue for many manufacturers, and the root cause of the degradation is still unknown. In this paper, the impact of firing temperature on the stability of lifetime test structures is investigated, and it is found that substantial CID can be triggered if peak temperatures exceed approximately 700 °C. We then investigate two pathways to stabilize the performance of industrially produced TIP mc-Si passivated emitter rear contact cells which have been fired at CID-activating temperatures (~740 °C-800 °C) currently required for silver contact formation. The first is a fast-firing approach, whereby it is demonstrated that an additional firing step at a reduced temperature after cell metallization can suppress the extent of Voc degradation by up to 80%. The second approach is the accelerated degradation and subsequent recovery of carrier lifetime through the use of high-intensity illumination during annealing at elevated temperatures. A 30 s process is found to suppress the maximum extent of degradation in Voc by up to 60% and up to 80% for longer processes. Ultimately, the results suggest that a combined approach of fast-firing and a high-intensity-illuminated anneal could achieve the best results in terms of Voc, stability.

Recombination parameters of lifetime-limiting carrier-induced defects in multicrystalline silicon for solar cells

In p-type multicrystalline silicon solar cells, carrier-induced degradation (CID) can cause up to 10% relative reduction in conversion efficiency. Although, a great concern has been drawn on this degradation in the photovoltaic community, the nature of this degradation is still yet unknown. In this contribution, the recombination parameters of the responsible defect causing this degradation are extracted via temperature and injection dependent lifetime spectroscopy. Three wafers from three different ingots were processed into cell precursor and lifetime structures for the study. Similar defect recombination parameters were obtained for all samples. Two candidates for the defect energy level were identified: Et − Ei = −(0.32 ± 0.05) eV or Et − Ei = (0.21 ± 0.05) eV in the lower and upper bandgap halves, respectively. The capture cross section ratios were found to be k = 56 ± 23 or k = 49 ± 21 for the lower and upper bandgap halves, respectively. Contrary to previous studies, these parameters have been extr...

Carrier-Induced Degradation in Multicrystalline Silicon: Dependence on the Silicon Nitride Passivation Layer and Hydrogen Released During Firing

Carrier-induced degradation (CID) of multicrystalline silicon (mc-Si) solar cells has been receiving significant attention; however, despite this increasing interest, the defect (or defects) responsible for this degradation has not been determined yet. Previous studies have shown that the surface passivation layer and the firing temperature have a significant impact on the rate and extent of this degradation. In this paper, we further study this impact through an investigation of the CID behavior of the mc-Si wafers passivated with six different silicon nitride layers, each fired at four different peak temperatures. At low firing temperatures, no significant difference in the CID was identified between the samples with different passivation layers; however, a large range of degradation extents was observed at higher firing temperatures. Using Fourier transform infrared spectroscopy, a correlation was found between the degradation extent and the amount of hydrogen released from the dielectric during firing. We verified that no degradation of the surface passivation quality occurred, indicating that the degradation is primarily associated with a bulk defect.

An advanced software suite for the processing and analysis of silicon luminescence images

Abstract Luminescence imaging is a versatile characterisation technique used for a broad range of research and industrial applications, particularly for the field of photovoltaics where photoluminescence and electroluminescence imaging is routinely carried out for materials analysis and quality control. Luminescence imaging can reveal a wealth of material information, as detailed in extensive literature, yet these techniques are often only used qualitatively instead of being utilised to their full potential. Part of the reason for this is the time and effort required for image processing and analysis in order to convert image data to more meaningful results. In this work, a custom built, Matlab based software suite is presented which aims to dramatically simplify luminescence image processing and analysis. The suite includes four individual programs which can be used in isolation or in conjunction to achieve a broad array of functionality, including but not limited to, point spread function determination and deconvolution, automated sample extraction, image alignment and comparison, minority carrier lifetime calibration and iron impurity concentration mapping. Program summary Program title: LumiTools Program Files doi: http://dx.doi.org/10.17632/7nd34fbwfg.1 Licensing provisions: Creative Commons by 4.0 (CC by 4.0) Programming language: Matlab Nature of problem: Data acquired using the technique of luminescence imaging require unique corrections and processing in order to convert the qualitative image into more meaningful, quantitative results. Such processing is often non-trivial and can present a barrier to research. Solution method: The LumiTools package provides a broad array of common functionality required for the processing and analysis of luminescence images. Several tools are available to allow processing for various applications and each tool has been developed with a simple to use graphical user interface.

Rapid mitigation of carrier-induced degradation in commercial silicon solar cells

We report on the progress for the understanding of carrier-induced degradation (CID) in p-type mono and multi-crystalline silicon (mc-Si) solar cells, and methods of mitigation. Defect formation is a key aspect to mitigating CID. Illuminated annealing can be used for both mono and mc-Si solar cells to reduce CID. The latest results of an 8-s UNSW advanced hydrogenation process applied to industrial p-type Czochralski PERC solar cells are shown with average efficiency enhancements of 1.1% absolute from eight different solar cell manufacturers. Results from three new industrial CID mitigation tools are presented, reducing CID to 0.8–1.1% relative, compared to 4.2% relative on control cells. Similar advanced hydrogenation processes can also be applied to multi-crystalline silicon passivated emitter with rear local contact (PERC) cells, however to date, the processes take longer and are less effective. Modifications to the firing processes can also suppress CID in multi-crystalline cells during subsequent illumination. The most stable results are achieved with a multi-stage process consisting of a second firing process at a reduced firing temperature, followed by extended illuminated annealing.

Evaluating the accuracy of point spread function deconvolutions applied to luminescence images

Luminescence imaging is a widely used characterization technique for silicon photovoltaics. However, the tools used to acquire images typically utilize a silicon CCD array for detection, which is a poor absorber at silicon luminescence wavelengths. This leads to a smearing effect in the measured image which can be characterized by a point spread function (PSF). If the true PSF is known then the measured image can be restored through deconvolution. Several methods exist for determining a PSF for a particular imaging system and different extraction techniques can lead to variations in the PSF result, yet no studies have provided comprehensive analysis of PSF deconvolution accuracy when applied to luminescence imaging. In this work, several new techniques have been designed and investigated in order to test PSF deconvolution results, with a view to quantifying improvement or errors generated and potentially leading towards improved image restoration.

Understanding the optics of industrial black silicon

Industrial scale black silicon texturing has become a topic of increasing importance as a method for enabling lower cost multicrystalline silicon wafers through diamond wire sawing, as well as for its potential to provide improved efficiencies through enhanced optical characteristics. Two different texturing processes have emerged as candidates for mainstream industrial uptake, metal catalyzed chemical etching (MCCE) and reactive ion etching (RIE). However, these techniques can produce substantially different textures and both provide a wide parameter space allowing for various feature shapes and sizes to be produced. The surface texture not only determines the total reflectance of a solar cell, but also impacts the light trapping and subsequent absorption through scattering. Here, we carry out a detailed analysis on a representative range of both MCCE and RIE textures on multiple substrate types in order to further develop the fundamental understanding of how these specific surface morphologies impact the optical characteristics. This will better enable integration with other process conditions as well as optimization between optical and electrical requirements.Industrial scale black silicon texturing has become a topic of increasing importance as a method for enabling lower cost multicrystalline silicon wafers through diamond wire sawing, as well as for its potential to provide improved efficiencies through enhanced optical characteristics. Two different texturing processes have emerged as candidates for mainstream industrial uptake, metal catalyzed chemical etching (MCCE) and reactive ion etching (RIE). However, these techniques can produce substantially different textures and both provide a wide parameter space allowing for various feature shapes and sizes to be produced. The surface texture not only determines the total reflectance of a solar cell, but also impacts the light trapping and subsequent absorption through scattering. Here, we carry out a detailed analysis on a representative range of both MCCE and RIE textures on multiple substrate types in order to further develop the fundamental understanding of how these specific surface morphologies impact th...

Nanosphere lithography for improved absorption in thin crystalline silicon solar cells

Over the last decade, plasmonic nanoparticle arrays have been extensively studied for their light trapping potential in thin film solar cells. However, the commercial use of such arrays has been limited by complex and expensive fabrication techniques such as e-beam lithography. Nanosphere lithography (NSL) is a promising low-cost alternative for forming regular arrays of nanoscale features. Here, we use finite-difference time-domain (FDTD) simulations to determine the optical enhancement due to nanosphere arrays embedded at the rear of a complete thin film device. Array parameters including the nanosphere pitch and diameter are explored, with the FDTD model itself first validated by comparing simulations of Ag nanodisc arrays with optical measurements of pre-existing e-beam fabricated test structures. These results are used to guide the development of a nanosphere back-reflector for 20 μm thin crystalline silicon cells. The deposition of polystyrene nanosphere monolayers is optimized to provide uniform arrays, which are subsequently incorporated into preliminary, proof of concept device structures. Absorption and photoluminescence measurements clearly demonstrate the potential of nanosphere arrays for improving the optical response of a solar cell using economical and scalable methods.