David Sell
Arizona State University
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21st International Conference on Application of Accelerators in Research and Industry, CAARI 2010 | 2011
Qian Xing; Nicole Herbots; Murdock Hart; J. D. Bradley; B. J. Wilkens; David Sell; Clive H. Sell; Henry Mark Kwong; Robert J. Culbertson; Shawn Whaley
The water affinity of Si‐based surfaces is quantified by contact angle measurement and surface free energy to explain hydrophobic or hydrophilic behavior of silicone, silicates, and silicon surfaces. Surface defects such as dangling bonds, surface free energy including Lewis acid‐base and Lifshitz‐van der Waals components are discussed. Water nucleation and condensation is further explained by surface topography. Tapping mode atomic force microscopy (TMAFM) provides statistical analysis of the topography of these Si‐based surfaces. The correlation of the above two characteristics describes the behavior of water condensation at Si‐based surfaces. Surface root mean square roughness increasing from several A to several nm is found to provide nucleation sites that expedite water condensation visibly for silica and silicone. Hydrophilic surfaces have a condensation pattern that forms puddles of water while hydrophobic surfaces form water beads. Polymer adsorption on these surfaces alters the water affinity as ...
21st International Conference on Application of Accelerators in Research and Industry, CAARI 2010 | 2011
Qian Xing; Murdock Hart; Robert J. Culbertson; J. D. Bradley; Nicole Herbots; B. J. Wilkens; David Sell; Clarizza Watson
Particle‐Induced X‐ray Emission (PIXE) analysis was employed to characterize hydroxypropyl methylcellulose (HPMC) C32H60O19 polymer film via areal density measurement on silicon‐based substrates utilizing the differential PIXE concept, and compared with Rutherford backscattering spectrometry (RBS) results. It is demonstrated in this paper that PIXE and RBS measurements both yield comparable results for areal densities ranging from 1018 atom/cm2 to several 1019 atom/cm2. A collection of techniques including PIXE, RBS, tapping mode atomic force microscopy (TMAFM), and contact angle analysis were used to compute surface free energy, analyze surface topography and roughness parameters, determine surface composition and areal density, and to predict the water affinity and condensation behaviors of silicates and other compounds used for high impact resistance vision ware coatings. The visor surface under study is slightly hydrophilic, with root mean square of surface roughness on the order of one nm, and surfac...
Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms | 2012
Nicole Herbots; Qian Xing; Murdock Hart; J. D. Bradley; David Sell; Robert J. Culbertson; B. J. Wilkens
Archive | 2010
Nicole Herbots; J. D. Bradley; Murdock Hart; David Sell; Shawn Whaley; Qian Xing Bradley
Archive | 2014
Nicole Herbots; Shawn Whaley; Robert L. Rhoades; Scott N. Drews; Clarizza Watson; David Sell; Peter Rez; Ross Bennett-Kennett; Robert J. Culbertson; Austin Causey; Ender W. Davis; J. D. Bradley
Bulletin of the American Physical Society | 2014
Ender W. Davis; Nicole Herbots; Shawn Whaley; Ross Bennett-Kennett; Robert J. Culbertson; Austin Causey; Rob Rhoades; Scott N. Drews; Clarizza Watson; J. ``Doc'' Bradley; David Sell; Peter Rez; B. J. Wilkens
Archive | 2012
Nicole Herbots; Ashlee Murphy; David Sell; Robert J. Culbertson; Angelica S. Benitez; Tyler Kutz; Ross Bennett-Kennett; Matthew T. Bade; Shawn Whaley
Archive | 2012
Nicole Herbots; Ashlee Murphy; David Sell; Robert J. Culbertson; Angelica S. Benitez; Tyler Kutz; Ross Bennett-Kennett; Matthew T. Bade; Shawn Whaley
Bulletin of the American Physical Society | 2012
Ross Bennett-Kennett; Shawn Whaley; Nicole Herbots; Clarizza Watson; Robert J. Culbertson; Peter Rez; Ashlee Murphy; Sam Farmer; David Sell; Brett Hughes; Ajju Acharya
Archive | 2010
Nicole Herbots; J. D. Bradley; Murdock Hart; David Sell; Shawn Whaley; Qian Xing Bradley