David Todd Emerson
Cree Inc.
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Publication
Featured researches published by David Todd Emerson.
Japanese Journal of Applied Physics | 2005
Craig G. Moe; Hisashi Masui; Mathew C. Schmidt; L. Shen; B. Moran; Scott Newman; Kenneth J. Vampola; Tom Mates; S. Keller; James S. Speck; Steven P. DenBaars; Chris Hussel; David Todd Emerson
Deep ultraviolet light emitting diode structures with a peak wavelength of 275 nm were grown by metalorganic chemical vapor deposition on (0001) silicon carbide. Despite its strong ultraviolet light absorption, silicon carbide was chosen as a substrate rather than sapphire for its improved thermal conductivity and the potential for vertically conducting devices. An output power of 0.11 mW was observed at 300 mA DC during single device on-wafer testing, and output powers of 2.09 mW at 1.3 A were obtained from a packaged, silicone encapsulated array of five devices. Forward voltages as low as 4.9 V at 20 mA were obtained. The injection profile of Cp2Mg during the p-AlGaN blocking layer was instrumental in the suppression of emission at undesired wavelengths and the realization of peak-to-defect level ratios greater than 100.
Archive | 2007
Ashay Chitnis; James Ibbetson; Bernd Keller; David Todd Emerson; John Adam Edmond; Michael John Bergmann; Jasper Cabalu; Jeffrey C. Britt; Arpan Chakraborty; Eric Tarsa; James Seruto; Yankun Fu
Archive | 2002
David Todd Emerson; James Ibbetson; Michael John Bergmann; Kathleen Marie Doverspike; Michael J. O'Loughlin; Howard Dean Nordby; Amber Christine Abare
Archive | 2003
Hua-Shuang Kong; John Adam Edmond; Kevin Haberern; David Todd Emerson
Archive | 2003
David Todd Emerson; Amber Christine Abare; Michael John Bergmann
Archive | 2002
John Adam Edmond; Kathleen Marie Doverspike; Hua-Shuang Kong; Michael John Bergmann; David Todd Emerson
Archive | 2005
John Adam Edmond; Michael John Bergmann; David Todd Emerson; Kevin Haberern
Archive | 2008
David Todd Emerson; Kevin Haberern; Michael John Bergmann; David B. Slater; Matthew Donofrio; John Adam Edmond
Archive | 2007
Michael John Bergmann; David Todd Emerson; Kevin Haberern
Archive | 2010
David Todd Emerson; Bernd P. Keller; Mark McOlear; Peter S. Andrews