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Featured researches published by David W. Oliver.


Archive | 1986

XIM: X-Ray Inspection Module for Automatic High Speed Inspection of Turbine Blades and Automated Flaw Detection and Classification

David W. Oliver; James Marcus Brown; K. Cueman; Joseph Czechowski; J. Eberhard; J. Eng; R. Joynson; John P. Keaveney; Rudolph Alfred Albert Koegl; Rick Miller; K. Silverstein; L. Thumhart; R. Trzaskos; T. Kincaid; H. Scudder; Charles Robert Wojciechowski; Larry Clinton Howington; D. Ingram; Ralph Gerald Isaacs; L. Meyer; Joseph Manuel Portaz; James William Schuler; Joseph John Sostarich; Douglas Scott Steele

Under military manufacturing technology funding, a production prototype X-ray Inspection Module (XIM) has been established at General Electric Corporate Research and Development (GE-CRD) and delivered to Quality Technology (QT), General Electric Aircraft Engine Business Group (GE-AEBG). A company funded production unit has been built by GE-AEBG and delivered to the GE-AEBG manufacturing facility in Madisonville, Kentucky where it is in use in production. Computerized tomography (CT) and digital fluoroscopy (DF) images are produced with the system. The CT images provide an image cross-section, and the DF images are much like chest X-rays.The system was designed to automatically inspect and analyze flaws present in turbine blades. It was applied to two flaw types; each type in a different turbine blade. The image processing is performed on complex gray scale images with varying background. The XIM system may be used either automatically or in a manual mode with a trained operator to interpret the images and make quality decisions.


Archive | 2001

X-ray inspection system

Douglas Scott Steele; Larry Clinton Howington; James William Schuler; Joseph John Sostarich; Charles Robert Wojciechowski; Theodore Walter Sippel; Joseph Manuel Portaz; Ralph Gerald Isaacs; Henry J. Scudder; Thomas G. Kincaid; Kristina Helena Valborg Hedengren; Rudolph Alfred Albert Koegl; John P. Keaveney; Joseph Czechowski; John Robert Brehm; James Marcus Brown; David W. Oliver; George Edward Williams; Rick Miller


Archive | 1989

Swept frequency eddy current system for measuring coating thickness

David W. Oliver


Archive | 1986

Electronic control of rotating anode microfocus x-ray tubes for anode life extension

David W. Oliver


Archive | 1986

Method of aligning a linear array X-ray detector

Douglas Scott Steele; John P. Keaveney; David W. Oliver


Archive | 1986

High resolution X-ray collimator/detector system having reduced sensitivity to leakage radiation

Jeffrey Wayne Eberhard; David W. Oliver


Archive | 1986

Dark field coaxial ultrasonic transducer

David W. Oliver


INCOSE International Symposium | 1992

IMPROVING THE PRACTICE IN COMPUTER‐BASED SYSTEMS ENGINEERING

Stephanie White; Mack W. Alford; Brian McCay; David W. Oliver; Colin Tully; Julian C. Holtzman; C. Stephen Kuehl; David Owens; Allan Willey


Archive | 1987

Method of fabricating dark field coaxial ultrasonic transducer

David W. Oliver


Archive | 1987

A method for aligning a roentgenstrahlendetektors with a linear field

Douglas Scott Steele; John P. Keaveney; David W. Oliver

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