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Dive into the research topics where David W. Quint is active.

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Featured researches published by David W. Quint.


electronic components and technology conference | 2003

Simple and accurate determination of complex permittivity and skin effect of FR4 material in gigahertz regime

Karl J. Bois; Brian Kirk; Michael J. Tsuk; David W. Quint

In this paper, a simple and accurate measurement method of dielectric properties for printed circuit board (PCB) materials will be presented. Here a method is proposed that only requires measurement of scattering parameters for two transmission lines of different lengths etched in FR4 with identical cross-sections. Additionally, the connectors associated with these lines are readily de-embedded fiom the measurement (e.g. SMA connectors or plated-through holes (PTH)). Moreover, the conductor losses can he easily separated from the dielectric losses. Results of dielectric properties for three different types of FR4 material from varying vendors will be provided up to 8.5 GHz.


Archive | 2003

System and method for determining S-parameters using a load

Yong Wang; Karl J. Bois; David W. Quint


Archive | 2005

Printed circuit board including pads with vacancies

Karl J. Bois; David W. Quint; Michael J. Tsuk


Archive | 2004

Differential trace pair coupling verification tool

Karl J. Bois; David W. Quint; Mark D. Frank; Jerimy Nelson


Archive | 2006

Routing vias in a substrate from bypass capacitor pads

Jerimy Nelson; Mark D. Frank; Peter Shaw Moldauer; Gary L. Taylor; David W. Quint


Archive | 1998

Package routing of integrated circuit signals

David B Hollenbeck; William S. Worley; David W. Quint; Timothy L. Michalka


Archive | 2003

Dynamic control of switching reference voltage

David John Marshall; Karl J. Bois; David W. Quint


Archive | 2001

Software tool for generation of scattering parameter models of N-port lumped element circuits for use in spice simulators

Karl J. Bois; David W. Quint; Peter Shaw Moldauer


Archive | 1985

Method for applying a uniform coating to integrated circuit wafers by means of chemical deposition

Kenneth A. Monnig; David W. Quint


Archive | 2004

Method and apparatus for determining worst case coupling within a differential pair group

Karl J. Bois; David W. Quint; Mark D. Frank; Jerimy Nelson

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