David W. Quint
Hewlett-Packard
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Publication
Featured researches published by David W. Quint.
electronic components and technology conference | 2003
Karl J. Bois; Brian Kirk; Michael J. Tsuk; David W. Quint
In this paper, a simple and accurate measurement method of dielectric properties for printed circuit board (PCB) materials will be presented. Here a method is proposed that only requires measurement of scattering parameters for two transmission lines of different lengths etched in FR4 with identical cross-sections. Additionally, the connectors associated with these lines are readily de-embedded fiom the measurement (e.g. SMA connectors or plated-through holes (PTH)). Moreover, the conductor losses can he easily separated from the dielectric losses. Results of dielectric properties for three different types of FR4 material from varying vendors will be provided up to 8.5 GHz.
Archive | 2003
Yong Wang; Karl J. Bois; David W. Quint
Archive | 2005
Karl J. Bois; David W. Quint; Michael J. Tsuk
Archive | 2004
Karl J. Bois; David W. Quint; Mark D. Frank; Jerimy Nelson
Archive | 2006
Jerimy Nelson; Mark D. Frank; Peter Shaw Moldauer; Gary L. Taylor; David W. Quint
Archive | 1998
David B Hollenbeck; William S. Worley; David W. Quint; Timothy L. Michalka
Archive | 2003
David John Marshall; Karl J. Bois; David W. Quint
Archive | 2001
Karl J. Bois; David W. Quint; Peter Shaw Moldauer
Archive | 1985
Kenneth A. Monnig; David W. Quint
Archive | 2004
Karl J. Bois; David W. Quint; Mark D. Frank; Jerimy Nelson