David Yu

Contact structure and production method thereof and probe contact assembly using same

Contact structure production method

Contact structure with flexible cable and probe contact assembly using same

Probe contact system using flexible printed circuit board

Thermal controller for electronic devices

Connecting structure used in a testing arrangement for forming an electrical connection in semiconductor devices comprises a connecting substrate with through-holes, and connecting elements mounted on the horizontal surface of the substrate

Contact structure, method of manufacturing the structure, and contact assembly using the structure

Contact structure, its manufacturing method and probe contact assembly using this

Structure de contact, son procede de production et ensemble de contact la comportant

Structure de contact, procede de fabrication de cette structure et ensemble de contact utilisant cette structure