Denis De Ceuster
SunPower
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Publication
Featured researches published by Denis De Ceuster.
ieee world conference on photovoltaic energy conference | 2006
Gabriela Bunea; Karen E. Wilson; Yevgeny Meydbray; Matthew Campbell; Denis De Ceuster
This paper reports on low light performance results of solar cells manufactured by SunPower Corporation. We have investigated the effect of shunt resistance on low light performance of solar cells. We present I-V curves and measured cell efficiencies over irradiance levels from 1 to 0.001 Suns at AM1.5g spectrum, standard test conditions. A comparison with a theoretical model including the effect of shunt resistance and diode ideality factor is presented. We have also investigated the power density generated by our standard A-300 cells at various low light conditions. We infer from the results the possibility to use SunPower solar cells for PV powered products for low light applications
ieee world conference on photovoltaic energy conference | 2006
Karen E. Wilson; Denis De Ceuster; Ronald A. Sinton
Photovoltaic modules are commonly built using solar cells with similar IV characteristics to ensure that mismatch is minimized. Mismatch occurs because the IV characteristics of cells within a module are not identical. When connected in series, cells do not perform at their individual maximum power point. Instead, the cells perform at a combined maximum, which is less than the sum of the individual maximums. Various cell-sorting methods are used by PV module manufacturers. These different sorting strategies, including bin tolerances, have an effect on mismatch in the module. This work explains how cell mismatch in a module can be measured on a finished product using a module IV flash tester, by comparing a Suns-Voc pseudo IV curve to a measured IV curve. Further, this work presents a methodology for accurately measuring mismatch in a module, demonstrates the validity of the method using simulations, and compares the simulations with experimental data. This approach can be used by module manufacturers to characterize the module losses caused by cell mismatch, select a cell-sorting strategy, and optimize the cell-binning tolerance
Archive | 2006
Richard M. Swanson; Denis De Ceuster; Vikas Desai; Douglas H. Rose; David D. Smith; Neil Kaminar
Archive | 2006
Denis De Ceuster; Peter John Cousins; Richard M. Swanson; Jane Manning
Archive | 2009
Denis De Ceuster; Peter John Cousins; David D. Smith
Archive | 2007
Denis De Ceuster; Peter John Cousins
Archive | 2008
Hsin-Chiao Luan; Denis De Ceuster
Archive | 2008
Denis De Ceuster
Archive | 2008
Christopher Michael Bonner; Peter John Cousins; Denis De Ceuster
Archive | 2008
Denis De Ceuster; Peter John Cousins; Richard M. Swanson; Jane Manning