Dennis A. Swyt

Sizing of individual optically levitated evaporating droplets by measurement of resonances in the polarization ratio.

Resonances observed in the polarization ratio of light scattered at 90 degrees from single optically levitated evaporating droplets are shown to provide a means for continuous high-resolution monitoring of droplet size. Due to the distinctive character of the individual features in the polarization ratio, each experimentally measured feature could be clearly identified with a specific calculated one. For evaporating droplets of glycerol from 6.6 to 11.5 microm in diameter, the sharp features which appeared in the calculations at ~0.03-microm intervals allowed measurement of droplet diameter to a resolution of 0.003 microm.

Length and Dimensional Measurements at NIST

This paper discusses the past, present, and future of length and dimensional measurements at NIST. It covers the evolution of the SI unit of length through its three definitions and the evolution of NBS-NIST dimensional measurement from early linescales and gage blocks to a future of atom-based dimensional standards. Current capabilities include dimensional measurements over a range of fourteen orders of magnitude. Uncertainties of measurements on different types of material artifacts range down to 7×10−8 m at 1 m and 8 picometers (pm) at 300 pm. Current work deals with a broad range of areas of dimensional metrology. These include: large-scale coordinate systems; complex form; microform; surface finish; two-dimensional grids; optical, scanning-electron, atomic-force, and scanning-tunneling microscopies; atomic-scale displacement; and atom-based artifacts.

The workforce of U.S. manufacturing in the post-industrial era

Abstract United States manufacturing is moving on a well-established trajectory of increased knowledge intensity represented by the rise in the proportion of its workforce in technical-professional occupations. Based on BLS data and a new analytical tool, this paper: 1) shows an 80-year linear trend in the evolution of the total workforce: 2) establishes characteristic ages for 20 manufacturing sectors, including 1910 for autors and 2015 for computer equipment; and 3) projects a rise of technical-professional workers in the next century to 50% of the workforce.

TRANSFERRING NBS TECHNOLOGY TO SMALL MANUFACTURERS THROUGH STATE AND LOCAL CENTERS

Transferring research results from federal laboratories to small, local industries poses major conceptual as well as practical difficulties. To address the problem, this paper provides a model of a technology-transfer system in which a federal laboratory—the National Bureau of Standardss Automated Manufacturing Research Facility—is linked to small manufacturers through state-and community-based technology centers, where the various instituions in the system are matched along dimensions of (a) level of government, (b) stage in cycle of innovation, (C) education of prototypical worker, and (d) nature of capital-revenue base.

Quantitative Sub-Micrometer Linewidth Determination Using Electron Microscopy

Quantitative determination of sub-micrometer linewidths in semiconductor devices and masks is demonstrated utilizing an approach employing complementary experimental measurements and theoretical modeling. Experimental measurements are performed utilizing the Microlength Calibrating Electron Probe (MCEP), a new facility at the National Bureau of Standards consisting of a scanning electron microscope modified to incorporate a scanning stage and laser-interferometer position measurement system. Automated data acquisition and analysis for the MCEP are achieved through interfacing to a laboratory minicomputer. Theoretical modeling based on Monte Carlo calculations provides a basis for selection of the position in the experimentally measured backscatter electron intensity profile that corresponds to the actual material line edge. A measurement on a photomask is shown which illustrates the utility of the MCEP facility and the Monte Carlo modeling calculations for accurate measurement of sub-micrometer linewidths.

Developments at NIST on traceability in dimensional measurements

This paper reports to the international community on recent developments in technical policies, programs, and capabilities at the U.S. (United States) National Institute of Standards and Technology (NIST) related to traceability in dimensional measurements. These developments include: formal NIST policies on traceability and assuring quality in the results of the measurements it delivers to customers in calibration and measurement certificates, and a program to support the achievement of traceability to the SI (International System of Units) unit of length in dimensional measurements by manufacturers without direct recourse to a National Metrology Institute (NMI) for dimensional calibrations.

Robotics in the factory of the future: AI in manufacturing: The NBS AMRF as an intelligent machine

Abstract Within its Automated Manufacturing Research Facility (AMRF), the U.S. National Bureau of Standards (NBS) is addressing research issues in interface standards for the fully automated factory of the future for the production of small batches of discrete parts. Consisting of robots, machine tools and computers, the AMRF is being integrated using a real-time, sensory-feedback, data-driven hierarchical control architecture. As such, the AMRF is a research tool for investigating the manufacturing enterprise as a system of intelligent machines. This paper: (1) describes the AMRF in terms of its real-time control system architecture; (2) notes the role of symbolic languages, knowledge-representation, sensory-processing and other aspects of artificial intelligence in its development; and (3) speculates on further application of AI in future intelligent manufacturing systems similar in form to the AMRF.

CIM, data and standardization within the NBS AMRF

Abstract Computer-Integrated Manufacturing ( CIM ) is key to the factory of the future, shared data is key to integration, and interface standards are key to data-sharing. Within its Automated Manufacturing Research Facility ( AMRF ), the U.S. National Bureau of Standards is addressing issues of standardized interfaces in the four principal data activities of the automated factory: data preparation, data administration, data communication, and data-driven control. By means of such interface standards, the flexibly automated, robotics-based, computer-integrated factory of the future can be realized in a modular, easily integratable, multi-vendor form.

Experiences in initiating Baldrige‐based quality in a NIST technical division

Within the National Institute of Standards and Technology (NIST), which administers the Malcolm Baldrige National Quality Award (MBNQA), a NIST technical division has initiated a Baldrige‐based effort to increase the effectiveness of its research and services. The Precision Engineering Division is responsible for providing US industry with practical access to the international and national standards of length and for conducting a diverse program of RD training on leading and facilitating teams and site visits to other agencies and industry organizations carrying out TQM‐type programs. This paper reports on employee‐identified successes and failures, managerial lessons learned, and some potential next steps in the start‐up effort’s further development.

Generic technology, measurement, and standards issues in micromachining and microfabrication

Microelectromechanical systems (MEMS) are integrally-fabricated hybrids of micromechanical and microelectronic elements which serve together as sensors, actuators or both. While there are proprietary issues in MEMS products currently in or near commercial production, there are also a number of generic technology, measurement and standards issues which may be addressed.