Dennis H. Goldstein

Error analysis of a mueller matrix polarimeter

An error analysis of a Mueller matrix polarimeter with dual rotating retarders is presented. Errors in orientational alignment of three of the four polarization elements are considered. Errors that are due to nonideal retardation elements are also included in the analysis. Compensation for imperfect retardation elements is possible with the equations derived, and the equations permit a calibration of the polarimeter for azimuthal alignment of polarization elements. An analytical treatment is given and is followed by numerical examples. The latter should prove useful in the laboratory in comparing precalibrated experimental results with theoretical predictions.

Evaluation of a selection of commercial polarizers and retarders at visible and near-infrared wavelengths

Complete specification s for commercially available polarizers and retarders are often not available, incomplete, or inaccurate. We analyze several commercial polarization elements using Mueller matrix polarimetry. Elements are characterized in terms of their diattenuation, retardance, and depolarization. Measurements were made with laser polarimeters and a spectropolarimeter.

Guest Editorial: Special Section on Polarization Analysis and Measurement

This PDF file contains the editorial “Guest Editorial: Polarization Analysis and Measurement” for OE Vol. 34 Issue 06

Infrared material property measurements with polarimetry and spectropolarimetry

Polarimetiy and spectropolarimetry are optical measurement techniques which use polarized light to obtain electrooptical material property information. These techniques are being used to make measurements on infrared electrooptical materials. Infrared materials of interest are those which find use in two dimensional modulators, i.e. optical picessing applications and infrared scene projectors. Polarimetry measurements are made at one infrared wavelength at a time using laser sources. Spectropolarimetry measurements are made over an entire infrared spectral region, e.g. 2 to 14 tm. A Fourier transform infrared spectrometer is the source of radiation in this case. The Mueller matrix formulation can be used to describe the polarized light and its interaction with the sample and measurement system optics. A Mueller matrix of the sample can then be obtained from a series of measurements with different input polarization states. The sample Mueller matrix contains information on the polarization properties. Electric fields are imposed on the sample as optical measurements are made. Fundamental constants associated with the sample material can be derived from the measured Mueller matrix elements.

Spectropolarimetry Of Electro-Optical Materials

This paper treats the fundamentals of infrared spectropolarimetry as a step in understanding and designing better spatial light modulators. It describes the issues in converting a Fourier transform Epectrometer to perform spectropolarimetric measurements, and includes mathematics to interpret the resulting spectropolarimetric data. Two distinct differences exist between this proposed instrumentation and previous infrared crystal optics studies; 1.) this instrument acquires data at all wavelengths within its spectral range, and 2.) it measures Mueller polarization matrices. Conventional measurements with laser polarimeters take birefringence data with applied fields at a few laser wavelengths. With the spectropolarimeter, data is obtained on and near absorption bands where the most interesting phenomenae occur. By measuring Mueller matrices as a function of wavelength, data is acquired on polarization and scattering, effects which will ultimately limit the performance of a modulating crystal. Thus, more data is available on which to compare materials and optimize modulator designs. Better modulators must result from such investigations.

Front Matter: Volume 9853

This PDF file contains the front matter associated with SPIE Proceedings Volume 9853, including the Title Page, Copyright information, Table of Contents, Introduction, and the Conference Committee listing.

Front Matter: Volume 9099

This PDF file contains the front matter associated with SPIE Proceedings Volume 9099, including the Title Page, Copyright information, Table of Contents, Invited Panel Discussion, and Conference Committee listing.